JPS6448471A - Semiconductor photodetector and the manufacture thereof - Google Patents

Semiconductor photodetector and the manufacture thereof

Info

Publication number
JPS6448471A
JPS6448471A JP62205755A JP20575587A JPS6448471A JP S6448471 A JPS6448471 A JP S6448471A JP 62205755 A JP62205755 A JP 62205755A JP 20575587 A JP20575587 A JP 20575587A JP S6448471 A JPS6448471 A JP S6448471A
Authority
JP
Japan
Prior art keywords
ingaas
layer
junction
inp
band gap
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62205755A
Other languages
Japanese (ja)
Inventor
Toshio Tanaka
Hitoshi Mizuochi
Aiichiro Nara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP62205755A priority Critical patent/JPS6448471A/en
Publication of JPS6448471A publication Critical patent/JPS6448471A/en
Pending legal-status Critical Current

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  • Light Receiving Elements (AREA)

Abstract

PURPOSE:To produce a photodetector which can be formed easily and has a high photoelectric conversion efficiency, by forming an InP layer, so-called a window layer on a P type InGaAs surface layer, the band gap of said former being wider than that of said latter. CONSTITUTION:An InGaAs P-N junction with a large effective area is formed, and at the same time an InP window layer 5 is formed of which the band gap is wide compared with that of InGaAs layer 3, 4, by employing both processes of the InGaAs layers being so grown as to fill up the groove of a substrate using a liquid phase epitaxial growth technique, and the InGaAs layers 3, 4 being melted back by an InP fused liquid. A light receiving surface 10 is so illuminated by light beams that a large number of pairs of electron and hole are generated in the InGaAs P-N junction. Now, because the P type InP layer 5 has a wide band gap compared with that of the InGaAs layers, the P type InP layer 5 so acts as to effectively introduce the incident light into the P-N junction part without absorbing therein the incident light. Moreover, both the window and the P-N junction are formed in a V-shape, which produces a large junction area. As a result, a photodetector can be produced at a low cost which is of good photoelectric conversion efficiency.
JP62205755A 1987-08-19 1987-08-19 Semiconductor photodetector and the manufacture thereof Pending JPS6448471A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62205755A JPS6448471A (en) 1987-08-19 1987-08-19 Semiconductor photodetector and the manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62205755A JPS6448471A (en) 1987-08-19 1987-08-19 Semiconductor photodetector and the manufacture thereof

Publications (1)

Publication Number Publication Date
JPS6448471A true JPS6448471A (en) 1989-02-22

Family

ID=16512123

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62205755A Pending JPS6448471A (en) 1987-08-19 1987-08-19 Semiconductor photodetector and the manufacture thereof

Country Status (1)

Country Link
JP (1) JPS6448471A (en)

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