JPS6448430A - Forming method of modified layer - Google Patents

Forming method of modified layer

Info

Publication number
JPS6448430A
JPS6448430A JP20583787A JP20583787A JPS6448430A JP S6448430 A JPS6448430 A JP S6448430A JP 20583787 A JP20583787 A JP 20583787A JP 20583787 A JP20583787 A JP 20583787A JP S6448430 A JPS6448430 A JP S6448430A
Authority
JP
Japan
Prior art keywords
modified layer
silicon
section
silicon oxide
oxide film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP20583787A
Other languages
Japanese (ja)
Other versions
JP2558289B2 (en
Inventor
Yutaka Hayashi
Shunsuke Fujita
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Ricoh Co Ltd
Original Assignee
Agency of Industrial Science and Technology
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology, Ricoh Co Ltd filed Critical Agency of Industrial Science and Technology
Priority to JP62205837A priority Critical patent/JP2558289B2/en
Priority to US07/233,585 priority patent/US4900396A/en
Publication of JPS6448430A publication Critical patent/JPS6448430A/en
Application granted granted Critical
Publication of JP2558289B2 publication Critical patent/JP2558289B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

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  • Formation Of Insulating Films (AREA)

Abstract

PURPOSE:To enable the novel forming method of a modified layer in structure for an silicon semiconductor device by utilizing a fact that the thickness of the modified layer shaped by nitriding is thickened in silicon oxide and thinned in silicon. CONSTITUTION:A surface on the side, on which at least an silicon oxide film 12 is shaped, in a blank, in which a desired two-dimensional pattern is formed to a relief shaped by the presence of the silicon oxide film 12 on a base body 10, is nitrided, and a modified layer 15 is shaped to the section of the silicon oxide film 12 and the section of an silicon surface in the base body 10. The thin modified layer 15 in the silicon surface section is gotten rid of by utilizing a fact that the thickness of the modified layer 15 is thickened in the section of the silicon oxide film 12 and thinned in the silicon surface section, but a removal process for the modified layer 15 is executed under conditions in which the thick modified layer 15 in the section of the silicon oxide film 12 is left. Thereby, the forming method of the novel modified layer capable of improving yield on the formation of a semiconductor device is acquired.
JP62205837A 1987-08-19 1987-08-19 Method of forming altered layer Expired - Lifetime JP2558289B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP62205837A JP2558289B2 (en) 1987-08-19 1987-08-19 Method of forming altered layer
US07/233,585 US4900396A (en) 1987-08-19 1988-08-18 Method of forming modified layer and pattern

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62205837A JP2558289B2 (en) 1987-08-19 1987-08-19 Method of forming altered layer

Publications (2)

Publication Number Publication Date
JPS6448430A true JPS6448430A (en) 1989-02-22
JP2558289B2 JP2558289B2 (en) 1996-11-27

Family

ID=16513533

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62205837A Expired - Lifetime JP2558289B2 (en) 1987-08-19 1987-08-19 Method of forming altered layer

Country Status (1)

Country Link
JP (1) JP2558289B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100701016B1 (en) * 2000-09-27 2007-03-29 삼성전자주식회사 Liquid crystal display device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100701016B1 (en) * 2000-09-27 2007-03-29 삼성전자주식회사 Liquid crystal display device

Also Published As

Publication number Publication date
JP2558289B2 (en) 1996-11-27

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