JPS6446665A - Probe card fixing jig - Google Patents

Probe card fixing jig

Info

Publication number
JPS6446665A
JPS6446665A JP62203340A JP20334087A JPS6446665A JP S6446665 A JPS6446665 A JP S6446665A JP 62203340 A JP62203340 A JP 62203340A JP 20334087 A JP20334087 A JP 20334087A JP S6446665 A JPS6446665 A JP S6446665A
Authority
JP
Japan
Prior art keywords
brace
probe card
probe
test
fixing jig
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62203340A
Other languages
Japanese (ja)
Inventor
Sadao Matai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62203340A priority Critical patent/JPS6446665A/en
Publication of JPS6446665A publication Critical patent/JPS6446665A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

PURPOSE:To shorten the time required to test an IC tester by performing the theta-directional position adjusting operation of a probe card at a different place from a testing device in parallel to a test of an IC by the testing device. CONSTITUTION:A metallic brace 1 is installed at a prescribed position outside the prober 20 first, and an IC substrate 5 where the IC of kind to be changed is mounted is installed in prescribed position relation with the brace 1. Then the probe card 6 is fitted in the step 9 of the brace 1 and a probe 7 is nearly positioned at the electrode group of the IC 4. Then while the positions of the probe 7 and electrode group of the IC 4 are adjusted in a theta direction, the brace 1 and a pressure plate 2 are clamped with a screw 3 to assemble a fixing jig 13. The jig 13 is fitted and fixed in the recessed part 25 of the fitting part of the prober 20 after the IC 4 is installed on the table 22. Consequently, the characteristics of the IC 4 are tested through the card by the IC tester 23 and the time required for the test is shortened.
JP62203340A 1987-08-15 1987-08-15 Probe card fixing jig Pending JPS6446665A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62203340A JPS6446665A (en) 1987-08-15 1987-08-15 Probe card fixing jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62203340A JPS6446665A (en) 1987-08-15 1987-08-15 Probe card fixing jig

Publications (1)

Publication Number Publication Date
JPS6446665A true JPS6446665A (en) 1989-02-21

Family

ID=16472401

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62203340A Pending JPS6446665A (en) 1987-08-15 1987-08-15 Probe card fixing jig

Country Status (1)

Country Link
JP (1) JPS6446665A (en)

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