JPS6447969A - Semiconductor tester - Google Patents
Semiconductor testerInfo
- Publication number
- JPS6447969A JPS6447969A JP62205756A JP20575687A JPS6447969A JP S6447969 A JPS6447969 A JP S6447969A JP 62205756 A JP62205756 A JP 62205756A JP 20575687 A JP20575687 A JP 20575687A JP S6447969 A JPS6447969 A JP S6447969A
- Authority
- JP
- Japan
- Prior art keywords
- pin array
- input
- tester
- section
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
PURPOSE:To achieve a reduction in the cost of the apparatus and realize a shorter time in the development of a test, by arranging a peripheral section inherent to an IC to be removable from a measuring section. CONSTITUTION:A peripheral section 3a having an externally mounting circuit inherent to an IC is arranged to be removable from a test jig 8 and that corresponding to an IC to be measured is mounted on the jig 8. In the peripheral section 3a, a pin array varying with the IC is converted into a fixed one such as an input fixed pin array 6 and an output fixed pin array 7 determined by input and output measurement sections 2a and 2b. Then, an input signal is applied to a tester through a cable 4 from an input section 2a. An output of the IC is exchanged for the pin array determined such as the arrays 6 and 7 to enter the measuring section 2b and supplied to the tester through a cable 5. The propriety of the IC is checked by judging a signal thereof with the tester thereby enabling the accomplishing of a test development in a short time with a reduction in the cost of the apparatus.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62205756A JPS6447969A (en) | 1987-08-19 | 1987-08-19 | Semiconductor tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62205756A JPS6447969A (en) | 1987-08-19 | 1987-08-19 | Semiconductor tester |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6447969A true JPS6447969A (en) | 1989-02-22 |
Family
ID=16512141
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62205756A Pending JPS6447969A (en) | 1987-08-19 | 1987-08-19 | Semiconductor tester |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6447969A (en) |
-
1987
- 1987-08-19 JP JP62205756A patent/JPS6447969A/en active Pending
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