JPS6447969A - Semiconductor tester - Google Patents

Semiconductor tester

Info

Publication number
JPS6447969A
JPS6447969A JP62205756A JP20575687A JPS6447969A JP S6447969 A JPS6447969 A JP S6447969A JP 62205756 A JP62205756 A JP 62205756A JP 20575687 A JP20575687 A JP 20575687A JP S6447969 A JPS6447969 A JP S6447969A
Authority
JP
Japan
Prior art keywords
pin array
input
tester
section
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62205756A
Other languages
Japanese (ja)
Inventor
Yasushi Okamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP62205756A priority Critical patent/JPS6447969A/en
Publication of JPS6447969A publication Critical patent/JPS6447969A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To achieve a reduction in the cost of the apparatus and realize a shorter time in the development of a test, by arranging a peripheral section inherent to an IC to be removable from a measuring section. CONSTITUTION:A peripheral section 3a having an externally mounting circuit inherent to an IC is arranged to be removable from a test jig 8 and that corresponding to an IC to be measured is mounted on the jig 8. In the peripheral section 3a, a pin array varying with the IC is converted into a fixed one such as an input fixed pin array 6 and an output fixed pin array 7 determined by input and output measurement sections 2a and 2b. Then, an input signal is applied to a tester through a cable 4 from an input section 2a. An output of the IC is exchanged for the pin array determined such as the arrays 6 and 7 to enter the measuring section 2b and supplied to the tester through a cable 5. The propriety of the IC is checked by judging a signal thereof with the tester thereby enabling the accomplishing of a test development in a short time with a reduction in the cost of the apparatus.
JP62205756A 1987-08-19 1987-08-19 Semiconductor tester Pending JPS6447969A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62205756A JPS6447969A (en) 1987-08-19 1987-08-19 Semiconductor tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62205756A JPS6447969A (en) 1987-08-19 1987-08-19 Semiconductor tester

Publications (1)

Publication Number Publication Date
JPS6447969A true JPS6447969A (en) 1989-02-22

Family

ID=16512141

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62205756A Pending JPS6447969A (en) 1987-08-19 1987-08-19 Semiconductor tester

Country Status (1)

Country Link
JP (1) JPS6447969A (en)

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