JPS6444845A - Eddy current flaw detection apparatus - Google Patents
Eddy current flaw detection apparatusInfo
- Publication number
- JPS6444845A JPS6444845A JP62201705A JP20170587A JPS6444845A JP S6444845 A JPS6444845 A JP S6444845A JP 62201705 A JP62201705 A JP 62201705A JP 20170587 A JP20170587 A JP 20170587A JP S6444845 A JPS6444845 A JP S6444845A
- Authority
- JP
- Japan
- Prior art keywords
- magnetizing coil
- superconductive
- coil
- cooling material
- inspected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
PURPOSE:To saturate a body to be inspected magnetically, to achieve the miniaturization and wt. reduction of a detection part, to prevent the lowering of a noise level and to enhance reliability, by using a superconductive magnetizing coil in a DC magnetizing coil part. CONSTITUTION:A flaw detection apparatus is constituted of a superconductive magnetizing coil 1 composed, for example. of yttrium showing superconductivity at high temp., a cooling material 2 such as liquid nitrogen cooling the coil 1, a cooling material holding container 3 constituted of a heat insulating material, a cooling material supply apparatus 4, a power source 5, detection coils 6, 7, an oscillator 9, a bridge circuit 10, an amplifier 11, a phase shifter 12, a detector 13, a display device 14 and a recorder 15. The superconductive magnetizing coil 1 can form current density higher than that of a usual magnetizing coil and high flux density which can not achieved by the usual magnetizing coil can be obtained. By this constitution, since a body 8 to be inspected can be magnetically saturated by supplying a high magnetic field, noise due to difference in a magnetic characteristic is reduced and a S/N ratio can be improved.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62201705A JPS6444845A (en) | 1987-08-14 | 1987-08-14 | Eddy current flaw detection apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62201705A JPS6444845A (en) | 1987-08-14 | 1987-08-14 | Eddy current flaw detection apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6444845A true JPS6444845A (en) | 1989-02-17 |
Family
ID=16445555
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62201705A Pending JPS6444845A (en) | 1987-08-14 | 1987-08-14 | Eddy current flaw detection apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6444845A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011039019A (en) * | 2009-08-14 | 2011-02-24 | International Institute Of Universality | Superconductive sensor for electromagnetic diagnostic apparatus |
-
1987
- 1987-08-14 JP JP62201705A patent/JPS6444845A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2011039019A (en) * | 2009-08-14 | 2011-02-24 | International Institute Of Universality | Superconductive sensor for electromagnetic diagnostic apparatus |
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