JPS6435597A - Inspector for liquid crystal display device - Google Patents

Inspector for liquid crystal display device

Info

Publication number
JPS6435597A
JPS6435597A JP19315387A JP19315387A JPS6435597A JP S6435597 A JPS6435597 A JP S6435597A JP 19315387 A JP19315387 A JP 19315387A JP 19315387 A JP19315387 A JP 19315387A JP S6435597 A JPS6435597 A JP S6435597A
Authority
JP
Japan
Prior art keywords
matrix
liquid crystal
display device
crystal display
elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19315387A
Other languages
Japanese (ja)
Other versions
JPH07120694B2 (en
Inventor
Masahiro Adachi
Hiroshi Morimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to JP62193153A priority Critical patent/JPH07120694B2/en
Publication of JPS6435597A publication Critical patent/JPS6435597A/en
Publication of JPH07120694B2 publication Critical patent/JPH07120694B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Liquid Crystal (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Liquid Crystal Display Device Control (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

PURPOSE: To quickly check many picture elements in detail by using a detection electrode matrix, which is constituted in the same matrix structure as the picture element matrix of a liquid crystal display device, to detect the characteristics of individual corresponding picture elements. CONSTITUTION: Detection electrodes 4 are arranged on a check panel 1 in a matrix structure which has a pitch similar to that or picture elements 3 which are arranged on a substrate 2 of a matrix type liquid crystal display device in a matrix structure, and a switching element 5 is added to each detection electrode 4, and scanning electrodes 6 and signal electrodes 7 are provided with these elements 5 as intersections. and a voltage is applied to the scanning electrode 6 to operate the switching element 5. Switching elements of the substrate 2 of the liquid crystal display device which are arranged so as to face the matrix of detection electrodes 4 and are brought into contact with this matrix are operated, and the signal current from each picture element 3 is inputted to the corresponding detection electrode 4 and is transmitted to a signal electrode 6 of the check panel 1 through switching elements 5, thereby checking the operation state of each picture element 3. Thus, many picture elements are quickly checked.
JP62193153A 1987-07-31 1987-07-31 Liquid crystal display device inspection device and inspection method thereof Expired - Lifetime JPH07120694B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62193153A JPH07120694B2 (en) 1987-07-31 1987-07-31 Liquid crystal display device inspection device and inspection method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62193153A JPH07120694B2 (en) 1987-07-31 1987-07-31 Liquid crystal display device inspection device and inspection method thereof

Publications (2)

Publication Number Publication Date
JPS6435597A true JPS6435597A (en) 1989-02-06
JPH07120694B2 JPH07120694B2 (en) 1995-12-20

Family

ID=16303164

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62193153A Expired - Lifetime JPH07120694B2 (en) 1987-07-31 1987-07-31 Liquid crystal display device inspection device and inspection method thereof

Country Status (1)

Country Link
JP (1) JPH07120694B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0434491A (en) * 1990-05-31 1992-02-05 Minato Electron Kk Active matrix substrate testing method and its test counter electrode substrate
US6667632B2 (en) 1999-11-01 2003-12-23 Mitsubishi Heavy Industries, Ltd. Potential sensor for detecting voltage of inspection target at non-contact condition to attain higher speed of inspection
US7081908B2 (en) 2001-02-22 2006-07-25 Mitsubishi Heavy Industries, Ltd. Apparatus and method for testing electrode structure for thin display device using FET function
WO2006077948A1 (en) * 2005-01-14 2006-07-27 Oht Inc. Sensor, inspection device, and inspection method
WO2006077950A1 (en) * 2005-01-14 2006-07-27 Oht Inc. Sensor, inspection apparatus and inspection method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5440573A (en) * 1977-09-07 1979-03-30 Toshiba Corp Measuring instrument for characteristics of semiconductor pellet
JPS5599734A (en) * 1979-01-26 1980-07-30 Hitachi Ltd Pattern-sheet for characteristic test of semiconductor element
JPS58118697A (en) * 1982-01-08 1983-07-14 株式会社東芝 Display panel inspector

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5440573A (en) * 1977-09-07 1979-03-30 Toshiba Corp Measuring instrument for characteristics of semiconductor pellet
JPS5599734A (en) * 1979-01-26 1980-07-30 Hitachi Ltd Pattern-sheet for characteristic test of semiconductor element
JPS58118697A (en) * 1982-01-08 1983-07-14 株式会社東芝 Display panel inspector

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0434491A (en) * 1990-05-31 1992-02-05 Minato Electron Kk Active matrix substrate testing method and its test counter electrode substrate
US6667632B2 (en) 1999-11-01 2003-12-23 Mitsubishi Heavy Industries, Ltd. Potential sensor for detecting voltage of inspection target at non-contact condition to attain higher speed of inspection
US7081908B2 (en) 2001-02-22 2006-07-25 Mitsubishi Heavy Industries, Ltd. Apparatus and method for testing electrode structure for thin display device using FET function
WO2006077948A1 (en) * 2005-01-14 2006-07-27 Oht Inc. Sensor, inspection device, and inspection method
WO2006077950A1 (en) * 2005-01-14 2006-07-27 Oht Inc. Sensor, inspection apparatus and inspection method

Also Published As

Publication number Publication date
JPH07120694B2 (en) 1995-12-20

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