JPS6435597A - Inspector for liquid crystal display device - Google Patents
Inspector for liquid crystal display deviceInfo
- Publication number
- JPS6435597A JPS6435597A JP19315387A JP19315387A JPS6435597A JP S6435597 A JPS6435597 A JP S6435597A JP 19315387 A JP19315387 A JP 19315387A JP 19315387 A JP19315387 A JP 19315387A JP S6435597 A JPS6435597 A JP S6435597A
- Authority
- JP
- Japan
- Prior art keywords
- matrix
- liquid crystal
- display device
- crystal display
- elements
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Liquid Crystal (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Liquid Crystal Display Device Control (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
PURPOSE: To quickly check many picture elements in detail by using a detection electrode matrix, which is constituted in the same matrix structure as the picture element matrix of a liquid crystal display device, to detect the characteristics of individual corresponding picture elements. CONSTITUTION: Detection electrodes 4 are arranged on a check panel 1 in a matrix structure which has a pitch similar to that or picture elements 3 which are arranged on a substrate 2 of a matrix type liquid crystal display device in a matrix structure, and a switching element 5 is added to each detection electrode 4, and scanning electrodes 6 and signal electrodes 7 are provided with these elements 5 as intersections. and a voltage is applied to the scanning electrode 6 to operate the switching element 5. Switching elements of the substrate 2 of the liquid crystal display device which are arranged so as to face the matrix of detection electrodes 4 and are brought into contact with this matrix are operated, and the signal current from each picture element 3 is inputted to the corresponding detection electrode 4 and is transmitted to a signal electrode 6 of the check panel 1 through switching elements 5, thereby checking the operation state of each picture element 3. Thus, many picture elements are quickly checked.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62193153A JPH07120694B2 (en) | 1987-07-31 | 1987-07-31 | Liquid crystal display device inspection device and inspection method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62193153A JPH07120694B2 (en) | 1987-07-31 | 1987-07-31 | Liquid crystal display device inspection device and inspection method thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6435597A true JPS6435597A (en) | 1989-02-06 |
JPH07120694B2 JPH07120694B2 (en) | 1995-12-20 |
Family
ID=16303164
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62193153A Expired - Lifetime JPH07120694B2 (en) | 1987-07-31 | 1987-07-31 | Liquid crystal display device inspection device and inspection method thereof |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH07120694B2 (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0434491A (en) * | 1990-05-31 | 1992-02-05 | Minato Electron Kk | Active matrix substrate testing method and its test counter electrode substrate |
US6667632B2 (en) | 1999-11-01 | 2003-12-23 | Mitsubishi Heavy Industries, Ltd. | Potential sensor for detecting voltage of inspection target at non-contact condition to attain higher speed of inspection |
US7081908B2 (en) | 2001-02-22 | 2006-07-25 | Mitsubishi Heavy Industries, Ltd. | Apparatus and method for testing electrode structure for thin display device using FET function |
WO2006077948A1 (en) * | 2005-01-14 | 2006-07-27 | Oht Inc. | Sensor, inspection device, and inspection method |
WO2006077950A1 (en) * | 2005-01-14 | 2006-07-27 | Oht Inc. | Sensor, inspection apparatus and inspection method |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5440573A (en) * | 1977-09-07 | 1979-03-30 | Toshiba Corp | Measuring instrument for characteristics of semiconductor pellet |
JPS5599734A (en) * | 1979-01-26 | 1980-07-30 | Hitachi Ltd | Pattern-sheet for characteristic test of semiconductor element |
JPS58118697A (en) * | 1982-01-08 | 1983-07-14 | 株式会社東芝 | Display panel inspector |
-
1987
- 1987-07-31 JP JP62193153A patent/JPH07120694B2/en not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5440573A (en) * | 1977-09-07 | 1979-03-30 | Toshiba Corp | Measuring instrument for characteristics of semiconductor pellet |
JPS5599734A (en) * | 1979-01-26 | 1980-07-30 | Hitachi Ltd | Pattern-sheet for characteristic test of semiconductor element |
JPS58118697A (en) * | 1982-01-08 | 1983-07-14 | 株式会社東芝 | Display panel inspector |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0434491A (en) * | 1990-05-31 | 1992-02-05 | Minato Electron Kk | Active matrix substrate testing method and its test counter electrode substrate |
US6667632B2 (en) | 1999-11-01 | 2003-12-23 | Mitsubishi Heavy Industries, Ltd. | Potential sensor for detecting voltage of inspection target at non-contact condition to attain higher speed of inspection |
US7081908B2 (en) | 2001-02-22 | 2006-07-25 | Mitsubishi Heavy Industries, Ltd. | Apparatus and method for testing electrode structure for thin display device using FET function |
WO2006077948A1 (en) * | 2005-01-14 | 2006-07-27 | Oht Inc. | Sensor, inspection device, and inspection method |
WO2006077950A1 (en) * | 2005-01-14 | 2006-07-27 | Oht Inc. | Sensor, inspection apparatus and inspection method |
Also Published As
Publication number | Publication date |
---|---|
JPH07120694B2 (en) | 1995-12-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EXPY | Cancellation because of completion of term | ||
FPAY | Renewal fee payment (prs date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20071220 Year of fee payment: 12 |