JPS6435418A - Method for evaluating liquid crystal orientational capacity of oriented film - Google Patents

Method for evaluating liquid crystal orientational capacity of oriented film

Info

Publication number
JPS6435418A
JPS6435418A JP19069487A JP19069487A JPS6435418A JP S6435418 A JPS6435418 A JP S6435418A JP 19069487 A JP19069487 A JP 19069487A JP 19069487 A JP19069487 A JP 19069487A JP S6435418 A JPS6435418 A JP S6435418A
Authority
JP
Japan
Prior art keywords
oriented film
capacity
film
liquid crystal
orientational
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19069487A
Other languages
Japanese (ja)
Inventor
Shoichi Ishihara
Fumiko Yokoya
Yoshihiro Matsuo
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP19069487A priority Critical patent/JPS6435418A/en
Publication of JPS6435418A publication Critical patent/JPS6435418A/en
Pending legal-status Critical Current

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  • Testing Of Optical Devices Or Fibers (AREA)
  • Liquid Crystal (AREA)

Abstract

PURPOSE:To easily and inexpensively determine the conditions for rubbing of an oriented film by evaluating the liquid crystal orientational capacity of the oriented film from the quantity of the transmitted light when straightly polarized light is projected on the surface of said film. CONSTITUTION:Helium-neon laser light 11 is projected perpendicularly on the surface of the oriented film 13 via a polarizing plate 12 (the axis of polarization direction is shown by an arrow) and while the film 13 is rotated each one degree, a change in the quantity of the transmitted light 14 is measured by a photocell 15. The measured orientation index S of the oriented film A is 0.004 when the max. quantity of the transmitted light is defined as Imax, the min. quantity of the transmitted light as Imin and the orientational capacity index S as S=(Imax-Imin)/(Imax+Imin). The S determined by the method similar to the method mentioned above with the film which is not subjected to the rubbing is <=0.001. Namely, the oriented film subjected to the rubbing treatment has the anisotropy of the transmittivity with the incident linearly polarized light. The degree of the rubbing treatment, i.e., the orientational capacity of the liquid crystal is known by determining the anisotropy of the light transmittivity.
JP19069487A 1987-07-30 1987-07-30 Method for evaluating liquid crystal orientational capacity of oriented film Pending JPS6435418A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19069487A JPS6435418A (en) 1987-07-30 1987-07-30 Method for evaluating liquid crystal orientational capacity of oriented film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19069487A JPS6435418A (en) 1987-07-30 1987-07-30 Method for evaluating liquid crystal orientational capacity of oriented film

Publications (1)

Publication Number Publication Date
JPS6435418A true JPS6435418A (en) 1989-02-06

Family

ID=16262305

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19069487A Pending JPS6435418A (en) 1987-07-30 1987-07-30 Method for evaluating liquid crystal orientational capacity of oriented film

Country Status (1)

Country Link
JP (1) JPS6435418A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0495845A (en) * 1990-08-10 1992-03-27 Matsushita Electric Ind Co Ltd Evaluation of liquid crystal orientation ability of oriented film
JPH1026759A (en) * 1996-07-12 1998-01-27 Nec Corp Liquid crystal oriented film inspecting method and inspecting equipment
JP2016081439A (en) * 2014-10-21 2016-05-16 大日本印刷株式会社 Selection method of transparent conductive laminated body, and manufacturing method of transparent conductive laminated body
JP6356372B1 (en) * 2017-05-23 2018-07-11 浜松ホトニクス株式会社 Alignment characteristic measurement method, alignment characteristic measurement program, and alignment characteristic measurement apparatus
WO2018216246A1 (en) * 2017-05-23 2018-11-29 浜松ホトニクス株式会社 Orientation characteristic measurement method, orientation characteristic measurement program, and orientation characteristic measurement device

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5764723A (en) * 1980-10-09 1982-04-20 Mitsubishi Electric Corp Formation of orientation layer for liquid crystal
JPS5998524A (en) * 1982-11-26 1984-06-06 Hitachi Ltd Inspecting apparatus of transparent material
JPS59210442A (en) * 1983-05-13 1984-11-29 Dainippon Screen Mfg Co Ltd Surface processing method
JPS60231136A (en) * 1984-05-01 1985-11-16 Kanzaki Paper Mfg Co Ltd Measurement of fiber orientation in paper
JPS60231105A (en) * 1984-05-01 1985-11-16 Nitto Electric Ind Co Ltd Measurement of shift of absorbing axis
JPS6125042A (en) * 1984-07-13 1986-02-03 Sumitomo Metal Ind Ltd Surface-defect examining device
JPS6194029A (en) * 1984-10-15 1986-05-12 Seiko Instr & Electronics Ltd Smectic liquid crystal display panel and its manufacture
JPS61175513A (en) * 1985-01-31 1986-08-07 Hitachi Ltd Defect inspection

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5764723A (en) * 1980-10-09 1982-04-20 Mitsubishi Electric Corp Formation of orientation layer for liquid crystal
JPS5998524A (en) * 1982-11-26 1984-06-06 Hitachi Ltd Inspecting apparatus of transparent material
JPS59210442A (en) * 1983-05-13 1984-11-29 Dainippon Screen Mfg Co Ltd Surface processing method
JPS60231136A (en) * 1984-05-01 1985-11-16 Kanzaki Paper Mfg Co Ltd Measurement of fiber orientation in paper
JPS60231105A (en) * 1984-05-01 1985-11-16 Nitto Electric Ind Co Ltd Measurement of shift of absorbing axis
JPS6125042A (en) * 1984-07-13 1986-02-03 Sumitomo Metal Ind Ltd Surface-defect examining device
JPS6194029A (en) * 1984-10-15 1986-05-12 Seiko Instr & Electronics Ltd Smectic liquid crystal display panel and its manufacture
JPS61175513A (en) * 1985-01-31 1986-08-07 Hitachi Ltd Defect inspection

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0495845A (en) * 1990-08-10 1992-03-27 Matsushita Electric Ind Co Ltd Evaluation of liquid crystal orientation ability of oriented film
JPH1026759A (en) * 1996-07-12 1998-01-27 Nec Corp Liquid crystal oriented film inspecting method and inspecting equipment
JP2016081439A (en) * 2014-10-21 2016-05-16 大日本印刷株式会社 Selection method of transparent conductive laminated body, and manufacturing method of transparent conductive laminated body
JP6356372B1 (en) * 2017-05-23 2018-07-11 浜松ホトニクス株式会社 Alignment characteristic measurement method, alignment characteristic measurement program, and alignment characteristic measurement apparatus
WO2018216246A1 (en) * 2017-05-23 2018-11-29 浜松ホトニクス株式会社 Orientation characteristic measurement method, orientation characteristic measurement program, and orientation characteristic measurement device
JP2018197753A (en) * 2017-05-23 2018-12-13 浜松ホトニクス株式会社 Orientation characteristic measurement method, orientation characteristic measurement program, and orientation characteristic measurement device
US11243073B2 (en) 2017-05-23 2022-02-08 Hamamatsu Photonics K.K. Orientation characteristic measurement method, orientation characteristic measurement program, and orientation characteristic measurement device
US11920921B2 (en) 2017-05-23 2024-03-05 Hamamatsu Photonics K.K. Orientation characteristic measurement method, orientation characteristic measurement program, and orientation characteristic measurement device

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