JPS6433838A - Surface analyzer - Google Patents
Surface analyzerInfo
- Publication number
- JPS6433838A JPS6433838A JP18829387A JP18829387A JPS6433838A JP S6433838 A JPS6433838 A JP S6433838A JP 18829387 A JP18829387 A JP 18829387A JP 18829387 A JP18829387 A JP 18829387A JP S6433838 A JPS6433838 A JP S6433838A
- Authority
- JP
- Japan
- Prior art keywords
- proton beam
- sample
- detector
- determined
- incident
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
PURPOSE:To detect what position of a sample is hit by a proton beam by providing a two-dimensional position detector movable on a position shielding the incident proton beam and a position for retreat in a ultrahigh-vacuum chamber and determining the correct position of the proton beam immediately before being irradiated to the sample. CONSTITUTION:A position detector 11 is provided in front of a sample, and the position detector 11 can be moved to a position A directly before the sample and a position B avoiding a proton beam. When the position detector 11 is located at the position A, it investigates the incident position LAMBDA of the proton beam. When the proton beam comes in, this incident position LAMBDA (x, y) is determined by the output of the position detector 11, thus the shift quantity of a manipulator 7 in relation to the two-dimensional detector 11 at the position A is determined to correctly position the sample, thus the center of the proton beam can be determined.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62188293A JP2653056B2 (en) | 1987-07-28 | 1987-07-28 | Surface analysis device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62188293A JP2653056B2 (en) | 1987-07-28 | 1987-07-28 | Surface analysis device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6433838A true JPS6433838A (en) | 1989-02-03 |
JP2653056B2 JP2653056B2 (en) | 1997-09-10 |
Family
ID=16221088
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62188293A Expired - Lifetime JP2653056B2 (en) | 1987-07-28 | 1987-07-28 | Surface analysis device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2653056B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0735564A2 (en) * | 1995-03-30 | 1996-10-02 | Ebara Corporation | Micro-processing apparatus and method therefor |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58146345U (en) * | 1982-03-26 | 1983-10-01 | 日本電子株式会社 | Charged particle beam device |
JPS6185057U (en) * | 1984-11-09 | 1986-06-04 | ||
JPS6292550U (en) * | 1985-11-29 | 1987-06-13 |
-
1987
- 1987-07-28 JP JP62188293A patent/JP2653056B2/en not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58146345U (en) * | 1982-03-26 | 1983-10-01 | 日本電子株式会社 | Charged particle beam device |
JPS6185057U (en) * | 1984-11-09 | 1986-06-04 | ||
JPS6292550U (en) * | 1985-11-29 | 1987-06-13 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0735564A2 (en) * | 1995-03-30 | 1996-10-02 | Ebara Corporation | Micro-processing apparatus and method therefor |
EP0735564A3 (en) * | 1995-03-30 | 1998-01-14 | Ebara Corporation | Micro-processing apparatus and method therefor |
US5852298A (en) * | 1995-03-30 | 1998-12-22 | Ebara Corporation | Micro-processing apparatus and method therefor |
Also Published As
Publication number | Publication date |
---|---|
JP2653056B2 (en) | 1997-09-10 |
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