JPS6433838A - Surface analyzer - Google Patents

Surface analyzer

Info

Publication number
JPS6433838A
JPS6433838A JP18829387A JP18829387A JPS6433838A JP S6433838 A JPS6433838 A JP S6433838A JP 18829387 A JP18829387 A JP 18829387A JP 18829387 A JP18829387 A JP 18829387A JP S6433838 A JPS6433838 A JP S6433838A
Authority
JP
Japan
Prior art keywords
proton beam
sample
detector
determined
incident
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18829387A
Other languages
Japanese (ja)
Other versions
JP2653056B2 (en
Inventor
Masahiko Aoki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissin Electric Co Ltd
Original Assignee
Nissin Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nissin Electric Co Ltd filed Critical Nissin Electric Co Ltd
Priority to JP62188293A priority Critical patent/JP2653056B2/en
Publication of JPS6433838A publication Critical patent/JPS6433838A/en
Application granted granted Critical
Publication of JP2653056B2 publication Critical patent/JP2653056B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To detect what position of a sample is hit by a proton beam by providing a two-dimensional position detector movable on a position shielding the incident proton beam and a position for retreat in a ultrahigh-vacuum chamber and determining the correct position of the proton beam immediately before being irradiated to the sample. CONSTITUTION:A position detector 11 is provided in front of a sample, and the position detector 11 can be moved to a position A directly before the sample and a position B avoiding a proton beam. When the position detector 11 is located at the position A, it investigates the incident position LAMBDA of the proton beam. When the proton beam comes in, this incident position LAMBDA (x, y) is determined by the output of the position detector 11, thus the shift quantity of a manipulator 7 in relation to the two-dimensional detector 11 at the position A is determined to correctly position the sample, thus the center of the proton beam can be determined.
JP62188293A 1987-07-28 1987-07-28 Surface analysis device Expired - Lifetime JP2653056B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62188293A JP2653056B2 (en) 1987-07-28 1987-07-28 Surface analysis device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62188293A JP2653056B2 (en) 1987-07-28 1987-07-28 Surface analysis device

Publications (2)

Publication Number Publication Date
JPS6433838A true JPS6433838A (en) 1989-02-03
JP2653056B2 JP2653056B2 (en) 1997-09-10

Family

ID=16221088

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62188293A Expired - Lifetime JP2653056B2 (en) 1987-07-28 1987-07-28 Surface analysis device

Country Status (1)

Country Link
JP (1) JP2653056B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0735564A2 (en) * 1995-03-30 1996-10-02 Ebara Corporation Micro-processing apparatus and method therefor

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58146345U (en) * 1982-03-26 1983-10-01 日本電子株式会社 Charged particle beam device
JPS6185057U (en) * 1984-11-09 1986-06-04
JPS6292550U (en) * 1985-11-29 1987-06-13

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58146345U (en) * 1982-03-26 1983-10-01 日本電子株式会社 Charged particle beam device
JPS6185057U (en) * 1984-11-09 1986-06-04
JPS6292550U (en) * 1985-11-29 1987-06-13

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0735564A2 (en) * 1995-03-30 1996-10-02 Ebara Corporation Micro-processing apparatus and method therefor
EP0735564A3 (en) * 1995-03-30 1998-01-14 Ebara Corporation Micro-processing apparatus and method therefor
US5852298A (en) * 1995-03-30 1998-12-22 Ebara Corporation Micro-processing apparatus and method therefor

Also Published As

Publication number Publication date
JP2653056B2 (en) 1997-09-10

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