JPS643067Y2 - - Google Patents
Info
- Publication number
- JPS643067Y2 JPS643067Y2 JP1982057774U JP5777482U JPS643067Y2 JP S643067 Y2 JPS643067 Y2 JP S643067Y2 JP 1982057774 U JP1982057774 U JP 1982057774U JP 5777482 U JP5777482 U JP 5777482U JP S643067 Y2 JPS643067 Y2 JP S643067Y2
- Authority
- JP
- Japan
- Prior art keywords
- infrared
- component
- measured
- infrared radiation
- cell
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000005855 radiation Effects 0.000 claims description 30
- 230000003287 optical effect Effects 0.000 claims description 5
- 238000010438 heat treatment Methods 0.000 claims description 4
- 239000007789 gas Substances 0.000 description 24
- 239000007787 solid Substances 0.000 description 6
- 238000005259 measurement Methods 0.000 description 5
- 238000002834 transmittance Methods 0.000 description 5
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000006641 stabilisation Effects 0.000 description 2
- 238000011105 stabilization Methods 0.000 description 2
- 238000011109 contamination Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1982057774U JPS58160339U (ja) | 1982-04-21 | 1982-04-21 | 赤外線輻射式ガス分析計 |
| DE19833307132 DE3307132C2 (de) | 1982-03-09 | 1983-03-01 | Infrarot-Gasanalysator zur Bestimmung mindestens einer Komponente eines Gasgemischs |
| GB8306205A GB2116317B (en) | 1982-03-09 | 1983-03-07 | Infrared radiation gas analyzer |
| KR1019830001605A KR870000596B1 (ko) | 1982-04-21 | 1983-04-16 | 적외선복사식 가스분석계 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1982057774U JPS58160339U (ja) | 1982-04-21 | 1982-04-21 | 赤外線輻射式ガス分析計 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58160339U JPS58160339U (ja) | 1983-10-25 |
| JPS643067Y2 true JPS643067Y2 (en, 2012) | 1989-01-26 |
Family
ID=13065210
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1982057774U Granted JPS58160339U (ja) | 1982-03-09 | 1982-04-21 | 赤外線輻射式ガス分析計 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPS58160339U (en, 2012) |
| KR (1) | KR870000596B1 (en, 2012) |
-
1982
- 1982-04-21 JP JP1982057774U patent/JPS58160339U/ja active Granted
-
1983
- 1983-04-16 KR KR1019830001605A patent/KR870000596B1/ko not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| KR870000596B1 (ko) | 1987-03-23 |
| JPS58160339U (ja) | 1983-10-25 |
| KR840004574A (ko) | 1984-10-22 |
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