JPS6428369A - Magnetron sputtering device - Google Patents

Magnetron sputtering device

Info

Publication number
JPS6428369A
JPS6428369A JP18397287A JP18397287A JPS6428369A JP S6428369 A JPS6428369 A JP S6428369A JP 18397287 A JP18397287 A JP 18397287A JP 18397287 A JP18397287 A JP 18397287A JP S6428369 A JPS6428369 A JP S6428369A
Authority
JP
Japan
Prior art keywords
target
substrate
gas
torr
low pressure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18397287A
Other languages
Japanese (ja)
Inventor
Shinji Fujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP18397287A priority Critical patent/JPS6428369A/en
Publication of JPS6428369A publication Critical patent/JPS6428369A/en
Pending legal-status Critical Current

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  • Physical Vapour Deposition (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)

Abstract

PURPOSE:To provide a titled device with which a good step coverage characteristic is obtd. without decreasing the speed of film formation by localizing an atmosphere gas necessary for a magnetron state only near to the target and maintaining a low pressure except near the target. CONSTITUTION:The atmosphere gas of Ar, etc., is localized (1X10<-2>Torr) near the target 13 by using a gas introducing port A16 and a gas discharge port A17. The magnetron state is created by the magnetic field by an electromagnet or solenoid 15 on the rear side of the target 13 and the DC alternating magnetic field by the electric field between a cathode 14 and an anode 12. On the other hand, the low pressure (1X10<-4>Torr) can be maintained between a substrate 11 and the target 13 by a gas discharge port B19. Since the distance between the substrate 11 and the target 13 is substantially long as compared to the thickness of the plasma region near the target 13, the sputtering particles arriving at the substrate arrive perpendicularly at the substrate 11. The method of this invention is thus highly effective in improving the step coverage characteristic.
JP18397287A 1987-07-23 1987-07-23 Magnetron sputtering device Pending JPS6428369A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18397287A JPS6428369A (en) 1987-07-23 1987-07-23 Magnetron sputtering device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18397287A JPS6428369A (en) 1987-07-23 1987-07-23 Magnetron sputtering device

Publications (1)

Publication Number Publication Date
JPS6428369A true JPS6428369A (en) 1989-01-30

Family

ID=16145050

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18397287A Pending JPS6428369A (en) 1987-07-23 1987-07-23 Magnetron sputtering device

Country Status (1)

Country Link
JP (1) JPS6428369A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02143521A (en) * 1988-11-25 1990-06-01 Tokyo Electron Ltd Sputtering method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02143521A (en) * 1988-11-25 1990-06-01 Tokyo Electron Ltd Sputtering method

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