JPH03260067A - Sputtering device - Google Patents

Sputtering device

Info

Publication number
JPH03260067A
JPH03260067A JP6042490A JP6042490A JPH03260067A JP H03260067 A JPH03260067 A JP H03260067A JP 6042490 A JP6042490 A JP 6042490A JP 6042490 A JP6042490 A JP 6042490A JP H03260067 A JPH03260067 A JP H03260067A
Authority
JP
Japan
Prior art keywords
magnetic pole
pole body
target
sputtering
magnetic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6042490A
Other languages
Japanese (ja)
Inventor
Kenji Kondo
健治 近藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP6042490A priority Critical patent/JPH03260067A/en
Publication of JPH03260067A publication Critical patent/JPH03260067A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To deform the surface of a target by erosion and to form a uniform thin film having invariable characteristics on plural substrates by arranging a third magnetic pole body in a specified polarity relation in addition to two magnetic pole bodies arranged on the rear of a target of a planar magnetron sputtering device. CONSTITUTION:The first pole body 2 and the second annular pole body 3 surrounding the pole body 2 and with the end face on the same side of the pole body 2 having the polarity opposite to that of the pole body 2 are arranged in the rear of the target 12 of a planar magnetron sputtering device, and the third pole body 5 is arranged in between and vertically driven by a driving motor 10 through a supporting rod 8a implanted in the supporting body 8 screwed up by a screw rod 9 rotated through worm gear reduction mechanisms 9a and 10a. The third pole body 5 is moved vertically to the surface of the target 12 and sputtering is carried out, hence the plasma on the front side of the target 12 is kept in the same state during the sputtering, and the sputtered thin film is formed on the surfaces of plural substrates from one target without any variance between the substrates and with good utilization efficiency of the target.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、基板上に各種薄膜を形成するのに用いられ
るスパッタリング装置であって、一方の端面が板状ター
ゲットの裏面中心部に近接して対向する第1の磁極体と
、該第1の磁極体を包囲する環状に形成され前記第1の
磁極体の一方の端面と同側の端面が前記板状ターゲット
の裏面周縁側に近接して対向するとともに該第1の磁極
体の一方の端面と逆の極性を有する第2の磁極体と、該
第1.第2の磁極体のそれぞれ他方の端面を互いに磁気
結合するヨークとを備え、板状ターゲットの表面側に円
弧状の磁束を環状に形成して環状のプラズマを形成する
スパンタリングカソードを持つプレーナマグネトロン方
式のスパッタリング装置に係り、特に基板に形成された
薄膜の基板ごとの特性のばらつきが少なく、また、強磁
性材薄膜を効率よく形成することのできるスパッタリン
グ装置に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a sputtering device used to form various thin films on a substrate, in which one end surface is close to the center of the back surface of a plate-shaped target. a first magnetic pole body facing each other; and an end face formed in an annular shape surrounding the first magnetic pole body, the end face of which is on the same side as one end face of the first magnetic pole body, is close to the peripheral edge of the back surface of the plate-shaped target. a second magnetic pole body facing opposite to each other and having a polarity opposite to one end surface of the first magnetic pole body; A planar magnetron that includes a yoke that magnetically couples the other end faces of the second magnetic pole bodies to each other, and has a sputtering cathode that forms an arc-shaped magnetic flux in an annular shape on the surface side of a plate-shaped target to form an annular plasma. The present invention relates to a sputtering apparatus of this type, and particularly to a sputtering apparatus that can efficiently form a thin film of a ferromagnetic material with little variation in characteristics of a thin film formed on a substrate from one substrate to another.

〔従来の技術〕[Conventional technology]

周知のように、この種のスパッタリングWitの陰極側
を構成するスパッタリングカソードは、通常、第2図に
示すように、一方の端面が板状ターゲット12の裏面中
心部に近接して対向する永久磁石である第1の磁極体2
と、この第1の磁極体2を包囲して環状に形成され第1
の磁極体2の一方の端面と同側の端面が板状ターゲット
の裏面周縁側に近接して対向する永久磁石である第2の
磁極体3と、前記第1.第2の磁極体2.3のそれぞれ
他方の端面を磁気的に結合する板状のヨーク1とからな
る。そして、第1.第2の磁極体2.3それぞれのター
ゲット裏面と対向する面は互いに逆の極性を有し、ター
ゲラ1−12の表面側に円弧状の磁束4を環状に形成す
る。この状態でターゲット12に電圧を印加すると、図
示されない被成膜基板背面側のアノードとの間に電界が
生じ、ターゲラ)12表面側の円弧状磁束がターゲツト
面と平行になる部分で電界と磁界とが直交する。そして
、この電界によって生じた電子が、この直交部分を中心
に環状の平行磁束に沿ってサイクロイド連動ヲ行い、ス
パッタガス (スパッタリングカソードが買かれている
雰囲気ガス)を電離し、環状のマグネトロンプラズマを
発生させ、このプラズマ中のイオンが電界によりターゲ
ット方向へ加速され、ターゲット表面をスパッタし、タ
ーゲットに対向する1図示されない基板の表面にスバフ
タ粒子が分布して堆積し、薄膜が形成される。
As is well known, the sputtering cathode constituting the cathode side of this type of sputtering Wit is usually a permanent magnet with one end face facing close to the center of the back surface of the plate-shaped target 12, as shown in FIG. The first magnetic pole body 2 is
The first magnetic pole body 2 is formed in an annular shape surrounding the first magnetic pole body 2.
a second magnetic pole body 3, which is a permanent magnet, whose end face on the same side as one end face of the magnetic pole body 2 faces closely to the peripheral edge of the back surface of the plate-shaped target; It consists of a plate-shaped yoke 1 that magnetically couples the other end surfaces of the second magnetic pole bodies 2.3. And the first. The surfaces of each of the second magnetic pole bodies 2.3 facing the back surface of the target have opposite polarities, and an arc-shaped magnetic flux 4 is formed in an annular shape on the front surface side of the targeter 1-12. When a voltage is applied to the target 12 in this state, an electric field is generated between the target 12 and the anode on the back side of the substrate to be film-formed (not shown), and an electric field and a magnetic field are generated at the part where the arc-shaped magnetic flux on the surface side of the target layer 12 becomes parallel to the target surface. are orthogonal. Then, the electrons generated by this electric field perform a cycloidal interlocking movement along the annular parallel magnetic flux around this orthogonal part, ionize the sputtering gas (the atmospheric gas in which the sputtering cathode is used), and generate an annular magnetron plasma. The ions in the plasma are accelerated toward the target by an electric field, sputtering the target surface, and the subafuta particles are distributed and deposited on the surface of a substrate (not shown) facing the target to form a thin film.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

このような構成のスパッタリングカソードでは、スパッ
タによってターゲット表面の種線領域が広がり、かつ深
さ方向にも種線が進行してターゲット表面の形状が変化
して行くため、種線領域表面と磁極との距離が刻々と変
化し、種線領域表面の磁界の強さが変化する。この変化
により、アノードとカソード間に投入される電力は同じ
でも種線領域に接するプラズマ中の反応状態が変化して
プラズマ密度が時間とともに変化し、1枚のターゲット
から複数の基板に薄膜を形成する際に、スパッタ初期段
階の基板に形成された薄膜と後期段階の基板に形成され
た薄、喚とで薄膜特性にばらつきを生じていた。また、
ターゲットの材質がIJ!J9!i性材の場合には、磁
束がターゲット内を面方向に多く通過するため、ターゲ
ット表面側に十分な磁束が得られず、スパッタリング効
率が極端に下がっていた。
In a sputtering cathode with such a configuration, the seed line area on the target surface expands due to sputtering, and the seed line also advances in the depth direction, changing the shape of the target surface, so that the surface of the seed line area and the magnetic pole are The distance changes from moment to moment, and the strength of the magnetic field on the surface of the seed line area changes. Due to this change, even if the power applied between the anode and cathode is the same, the reaction state in the plasma in contact with the seed line region changes and the plasma density changes over time, forming thin films on multiple substrates from one target. At the time of sputtering, variations in thin film properties occurred between the thin film formed on the substrate in the early stage of sputtering and the thin film formed on the substrate in the latter stage. Also,
The material of the target is IJ! J9! In the case of an i-type material, since a large amount of magnetic flux passes through the target in the planar direction, sufficient magnetic flux cannot be obtained on the target surface side, resulting in an extremely low sputtering efficiency.

この発明の目的は、種線によるターゲットの形状変化に
基づく薄膜特性のばらつきを小さくすることができ、ま
たターゲットの材質が透磁率の高いs磁性材の場合にも
スパッタリング効率高く成膜可能なスパッタリング装置
を提供することである。
The purpose of the present invention is to provide a sputtering method that can reduce variations in thin film properties due to changes in the shape of the target due to the seed wire, and can also form a film with high sputtering efficiency even when the target material is an S magnetic material with high magnetic permeability. The purpose is to provide equipment.

〔課題を解決するための手段〕[Means to solve the problem]

上記課題を解決するために、この発明においては、従来
のスパッタリングvtWにおける第1、第2の磁極体の
間に第3の磁極体を、Fk第3の磁極体の第1.第2の
Ili極体それぞれの側の極性が該第1.第2の磁極体
それぞれのターゲット側端面と同一となるようにかつタ
ーゲットの面と垂直方向に移動可能に配するものとする
In order to solve the above problems, in the present invention, a third magnetic pole body is provided between the first and second magnetic pole bodies in the conventional sputtering vtW, and the first... The polarity of each side of the second Ili polar body is the same as that of the first. The second magnetic pole bodies are disposed so as to be movable in the direction perpendicular to the target surface and to be flush with the target side end surface of each of the second magnetic pole bodies.

〔作用〕[Effect]

このように、第3の磁極体を、従来のスパッタリングカ
ソードにおける第1.第2の磁極体の間に垂直方向に移
動可能に配することにより、第3の磁極体から出る磁束
が第1.第2の磁極体の間でターゲット表面側に形成さ
れている磁束に重畳され、第3の磁極体のターゲットへ
の近づけ方により、ターゲット表面側の磁束分布が変化
する。
In this way, the third pole body can be replaced with the first pole body in a conventional sputtering cathode. By arranging the second magnetic pole body so as to be movable in the vertical direction, the magnetic flux emitted from the third magnetic pole body is transferred to the first magnetic pole body. It is superimposed on the magnetic flux formed on the target surface side between the second magnetic pole bodies, and the magnetic flux distribution on the target surface side changes depending on how the third magnetic pole body approaches the target.

従ってスパッタリングの進行とともに第3の磁極体とタ
ーゲットとの間隔を変えることにより、被成膜基板に形
成される薄膜の特性のばらつきを小さく抑えることがで
きる。また、ターゲットが強磁性材から威る場合には、
第3の磁極体をターゲットに近づけ、第3の磁極体から
出る磁束を、第1、第2の磁極体から出た磁束によりす
でに飽和しているターゲットを貫通してターゲット表面
側へ向かわせることにより、ターゲット表面傷の磁束を
増してスパッタリング効率を上げることができる。
Therefore, by changing the distance between the third magnetic pole body and the target as sputtering progresses, it is possible to suppress variations in the characteristics of the thin film formed on the substrate to be formed. Also, if the target is made of ferromagnetic material,
Bringing the third magnetic pole body closer to the target and causing the magnetic flux emitted from the third magnetic pole body to pass through the target, which has already been saturated by the magnetic flux emitted from the first and second magnetic pole bodies, and direct it toward the target surface side. This increases the magnetic flux of the scratches on the target surface and increases the sputtering efficiency.

〔実施例〕〔Example〕

第1図に本発明の一実施例によるスパッタリングカソー
ドの構造を示す、第1の磁極体2と、この第1の磁極体
2を囲んで環状に形成され該第1の磁極体2と同側の端
面が第1の磁極体と逆の極性を有する第2の磁極体3と
の間には、環状の扁平な磁極体として形成され第1の磁
極体2に面する内側の面の極性がこの第1の磁極体2の
上面と同じ極性を、また第2の磁極体3に面する外側の
面の極性がこの第2の磁極体3の上面と同じ極性を有す
る第3の磁極体5が配され、この第3の磁極体5を、駆
動モータlOにより10a、9aからなるウオームギア
減速機構を介して回転駆動されるねし棒9と螺合する支
持体8に植設された支持棒8aを介して上下方向に駆動
する構造としている。なお、図中の符号6は環状に形成
され第3の磁極体5の取付は座を形成するとともにヨー
ク11の一部を構成する可動ヨークである。
FIG. 1 shows the structure of a sputtering cathode according to an embodiment of the present invention, which includes a first magnetic pole body 2 and a second magnetic pole body formed in an annular shape surrounding the first magnetic pole body 2 and on the same side as the first magnetic pole body 2. A second magnetic pole body 3 whose end face has a polarity opposite to that of the first magnetic pole body is formed as an annular flat magnetic pole body, and a polarity of the inner surface facing the first magnetic pole body 2 is formed as an annular flat magnetic pole body. A third magnetic pole body 5 which has the same polarity as the top surface of the first magnetic pole body 2 and whose outer surface facing the second magnetic pole body 3 has the same polarity as the top surface of the second magnetic pole body 3. is arranged, and this third magnetic pole body 5 is screwed into a support rod 9 which is rotatably driven by a drive motor IO via a worm gear reduction mechanism consisting of 10a and 9a. It has a structure in which it is driven in the vertical direction via 8a. In addition, the reference numeral 6 in the figure is a movable yoke which is formed in an annular shape, forms a seat for mounting the third magnetic pole body 5, and also constitutes a part of the yoke 11.

このように、第3の磁極体5を第1.第2の磁極体2.
3の間に配すると、第3の磁極体5のN極から出る。1
点鎖線で示す磁束は、ターゲット12の上面側へ向かい
、主磁束4に重畳されてターゲット上面側の磁束を強化
する。この強化の程度は、第3の磁極体5の上下方向の
位置により異なるから、スパッタリングによるターゲッ
ト上面側の種線の進行に伴って上下方向の位置を変える
ことにより、種線面に生じている磁界がスパッタリング
初期とほぼ同一のプラズマ状態を生じるように調整され
、薄膜特性のばらつきが小さく抑えられる。ここで、第
3の磁極体5のN極から出る磁束は下方へも曲がり、ヨ
ーク1.6内を遭遇しようとするが、第1.第2の磁極
体2.3には強力な、かつ体積の大きい、従って保有す
る磁気エネルギーの大きい永久磁石が用いられており、
通常の鋼板(JIS記号: 5541)で作られたヨー
ク11は磁束が常時飽和した状態で使用され、ヨーク6
も当然磁気的に飽和した状態にあり、ヨーク6は常に高
い磁気抵抗を示すため、ヨーク1,6内の通過が阻止さ
れ、第3の磁極体5はヨーク!1.6に影響されること
なく、第1.第2の磁極体2.3による主磁束4に重畳
されてターゲット表面例の磁束分布を変化させる磁束7
をターゲット表面側に形成することができる。
In this way, the third magnetic pole body 5 is connected to the first magnetic pole body 5. Second magnetic pole body2.
3, it comes out from the N pole of the third magnetic pole body 5. 1
The magnetic flux shown by the dotted chain line goes toward the upper surface of the target 12, is superimposed on the main magnetic flux 4, and strengthens the magnetic flux on the upper surface of the target. The degree of this reinforcement differs depending on the vertical position of the third magnetic pole body 5, so by changing the vertical position as the seed line advances on the upper surface side of the target by sputtering, it can be strengthened on the seed line surface. The magnetic field is adjusted to produce a plasma state that is almost the same as that at the beginning of sputtering, and variations in thin film properties are suppressed to a small level. Here, the magnetic flux emitted from the N pole of the third magnetic pole body 5 also bends downward and attempts to encounter the inside of the yoke 1. The second magnetic pole body 2.3 uses a strong permanent magnet that has a large volume and therefore holds a large amount of magnetic energy.
The yoke 11 made of ordinary steel plate (JIS symbol: 5541) is used with the magnetic flux constantly saturated, and the yoke 6
is naturally in a magnetically saturated state, and the yoke 6 always exhibits high magnetic resistance, so passage through the yokes 1 and 6 is blocked, and the third magnetic pole body 5 is in a yoke! 1.6, without being affected by 1. Magnetic flux 7 that is superimposed on the main magnetic flux 4 by the second magnetic pole body 2.3 and changes the magnetic flux distribution on the target surface example
can be formed on the target surface side.

また、ターゲット12が強磁性材からなるときには、第
3の磁極体5をターゲットに近づけることにより、第3
の磁極体から出る磁束が、第1.第2の磁極体から出た
磁束により飽和しているターゲットを貫通してターゲッ
ト表面側へ出るため、環状プラズマを生じさせるための
磁束量が増し、強磁性材薄膜を効率よく基板上に形成さ
せることができる。
Further, when the target 12 is made of a ferromagnetic material, the third magnetic pole body 5 can be moved closer to the target.
The magnetic flux emitted from the magnetic pole body of the first. The magnetic flux emitted from the second magnetic pole body penetrates the saturated target and exits to the target surface side, increasing the amount of magnetic flux needed to generate annular plasma and efficiently forming a ferromagnetic material thin film on the substrate. be able to.

〔発明の効果〕〔Effect of the invention〕

以上に述べたように、本発明においては、一方の端面が
板状ターゲットの裏面中心部に近接して対向する第1の
磁極体と、該第1の磁極体を包囲する環状に形成され前
記第1の磁極体の一方の端面と同側の端面が前記板状タ
ーゲットの裏面周縁便に近接トて対向するとともに該第
1の磁極体の一方の端面と逆の極性を有する第2の磁極
体と、該第1.第2の磁極体のそれぞれ他方の端面を互
いに磁気結合するヨークとを備え、板状ターゲットの表
面側に円弧状の磁束を環状に形成して環状のプラズマを
形成するスパッタリングカソードを持つプレーナマグネ
トロン方式のスパッタリング装置において、前記第1.
第2の磁極体の間に第3の磁極体を、該第3の磁極体の
前記第1.第2の磁極体それぞれの側の極性が該第1.
第2の磁極体それぞれの前記一方の端面と同一となるよ
うにかつ板状ターゲットの面と垂直方向に移動可能に配
したので、第3の磁極体をターゲットの面と垂直方向に
移動させつつスパッタリングを行うことにより、ターゲ
ット表面側のプラズマがスパッタリング中はぼ同一の状
態に保たれて被酸膜基板への底膜が進行するから、1枚
のターゲットから複数の基板に薄膜を形成する際の薄膜
特性の基板ごとのばらつきを従来と比べて小さくするこ
とができる。また、ターゲットの材質が強磁性材の場合
には、第3の磁極体をターゲットに近づけてターゲット
表面側の磁束を増大させることができ、基板への強磁性
材膜の形成を効率よく行うことができる。
As described above, the present invention includes a first magnetic pole body whose one end face faces close to the center of the back surface of the plate-shaped target, and a ring-shaped magnetic pole body surrounding the first magnetic pole body. a second magnetic pole whose end face on the same side as one end face of the first magnetic pole body is close to and opposed to the back surface periphery of the plate-shaped target and whose polarity is opposite to that of the one end face of the first magnetic pole body; body, and the first. A planar magnetron system that includes a yoke that magnetically couples the other end faces of the second magnetic pole bodies to each other and has a sputtering cathode that forms an arc-shaped magnetic flux in an annular shape on the surface side of a plate-shaped target to form an annular plasma. In the sputtering apparatus of the above-mentioned first.
a third magnetic pole body between the second magnetic pole bodies; The polarity of each side of the second magnetic pole body is the same as that of the first magnetic pole body.
Since the second magnetic pole bodies are disposed so as to be movable in the direction perpendicular to the surface of the plate-shaped target so as to be the same as the one end face of each of the second magnetic pole bodies, the third magnetic pole body can be moved in the direction perpendicular to the surface of the target. By performing sputtering, the plasma on the target surface side is kept in almost the same state during sputtering, and the bottom film progresses to the oxidized substrate, so when forming thin films on multiple substrates from one target. It is possible to reduce the variation in thin film properties from substrate to substrate compared to the conventional method. In addition, when the material of the target is a ferromagnetic material, the third magnetic pole body can be brought closer to the target to increase the magnetic flux on the target surface side, and the ferromagnetic material film can be efficiently formed on the substrate. I can do it.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例によるスパッタリングカソー
ドの構造を示す断+!ii図、第2図は従来例によるス
ペックリングカソードの構造を示す断面図である。 1.11:ヨーク、2:第1の磁極体、3:第2の磁極
体、5:第3の磁極体。
FIG. 1 is a cross-sectional view showing the structure of a sputtering cathode according to an embodiment of the present invention. FIG. ii and FIG. 2 are cross-sectional views showing the structure of a conventional speckling cathode. 1.11: Yoke, 2: First magnetic pole body, 3: Second magnetic pole body, 5: Third magnetic pole body.

Claims (1)

【特許請求の範囲】[Claims] 1)一方の端面が板状ターゲットの裏面中心部に近接し
て対向する第1の磁極体と、該第1の磁極体を包囲する
環状に形成され前記第1の磁極体の一方の端面と同側の
端面が前記板状ターゲットの裏面周縁側に近接して対向
するとともに該第1の磁極体の一方の端面と逆の極性を
有する第2の磁極体と、該第1,第2の磁極体のそれぞ
れ他方の端面を互いに磁気結合するヨークとを備え、板
状ターゲットの表面側に円弧状の磁束を環状に形成して
環状のプラズマを形成するスパッタリングカソードを持
つプレーナマグネトロン方式のスパッタリング装置にお
いて、前記第1,第2の磁極体の間に第3の磁極体を、
該第3の磁極体の前記第1,第2の磁極体それぞれの側
の極性が該第1,第2の磁極体それぞれの前記一方の端
面と同一となるようにかつ板状ターゲットの面と垂直方
向に移動可能に配したことを特徴とするスパッタリング
装置。
1) A first magnetic pole body whose one end face is close to and faces the center of the back surface of the plate-shaped target, and one end face of the first magnetic pole body which is formed in an annular shape surrounding the first magnetic pole body. a second magnetic pole body whose end face on the same side is close to and opposite to the peripheral edge side of the back surface of the plate-shaped target and whose polarity is opposite to that of one end face of the first magnetic pole body; A planar magnetron type sputtering device that is equipped with a yoke that magnetically couples the other end faces of the magnetic pole bodies to each other, and has a sputtering cathode that forms an arc-shaped magnetic flux in an annular shape on the surface side of a plate-shaped target to form an annular plasma. A third magnetic pole body is placed between the first and second magnetic pole bodies,
The polarity of each side of the first and second magnetic pole bodies of the third magnetic pole body is the same as the one end surface of each of the first and second magnetic pole bodies, and is in contact with the surface of the plate-shaped target. A sputtering device characterized by being arranged movably in the vertical direction.
JP6042490A 1990-03-12 1990-03-12 Sputtering device Pending JPH03260067A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6042490A JPH03260067A (en) 1990-03-12 1990-03-12 Sputtering device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6042490A JPH03260067A (en) 1990-03-12 1990-03-12 Sputtering device

Publications (1)

Publication Number Publication Date
JPH03260067A true JPH03260067A (en) 1991-11-20

Family

ID=13141819

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6042490A Pending JPH03260067A (en) 1990-03-12 1990-03-12 Sputtering device

Country Status (1)

Country Link
JP (1) JPH03260067A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05214527A (en) * 1992-02-04 1993-08-24 Hitachi Ltd Magnetron electrode
KR100456287B1 (en) * 2001-12-13 2004-11-09 (주)한백 Sputter gun of sputtering system for film deposition
KR100531555B1 (en) * 2002-02-14 2005-11-28 주성엔지니어링(주) Thin film deposition apparatus having more than one rotatable gas injector and thin film deposition method using the same
JP2008514810A (en) * 2004-09-28 2008-05-08 オー・ツェー・エリコン・バルザース・アクチェンゲゼルシャフト Method for manufacturing substrate formed by magnetron, and magnetron sputtering source
WO2009095496A1 (en) * 2008-02-01 2009-08-06 Oerlikon Trading Ag, Trübbach Magnetron sputtering source and arrangement with adjustable secondary magnet arrangement

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05214527A (en) * 1992-02-04 1993-08-24 Hitachi Ltd Magnetron electrode
KR100456287B1 (en) * 2001-12-13 2004-11-09 (주)한백 Sputter gun of sputtering system for film deposition
KR100531555B1 (en) * 2002-02-14 2005-11-28 주성엔지니어링(주) Thin film deposition apparatus having more than one rotatable gas injector and thin film deposition method using the same
JP2008514810A (en) * 2004-09-28 2008-05-08 オー・ツェー・エリコン・バルザース・アクチェンゲゼルシャフト Method for manufacturing substrate formed by magnetron, and magnetron sputtering source
WO2009095496A1 (en) * 2008-02-01 2009-08-06 Oerlikon Trading Ag, Trübbach Magnetron sputtering source and arrangement with adjustable secondary magnet arrangement
US10043642B2 (en) 2008-02-01 2018-08-07 Oerlikon Surface Solutions Ag, Pfäffikon Magnetron sputtering source and arrangement with adjustable secondary magnet arrangement

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