JPS6425044A - Flaw detecting method for hot surface - Google Patents
Flaw detecting method for hot surfaceInfo
- Publication number
- JPS6425044A JPS6425044A JP18015687A JP18015687A JPS6425044A JP S6425044 A JPS6425044 A JP S6425044A JP 18015687 A JP18015687 A JP 18015687A JP 18015687 A JP18015687 A JP 18015687A JP S6425044 A JPS6425044 A JP S6425044A
- Authority
- JP
- Japan
- Prior art keywords
- steel piece
- hot steel
- flaws
- lights
- laser
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
PURPOSE:To make it possible to ensure the detection of both longitudinal flaws and lateral flaws yielded in a hot steel piece, by a constitution, wherein laser slit lights are projected on the hot steel piece at projecting angles of more than 30 deg. and less than 90 deg. by utilizing a plurality of laser transmitters, and the end parts in the width direction are made higher than the center with respect to the distributions of illuminances of the lights. CONSTITUTION:Laser slit lights 7 are projected on a running hot steel piece 8 at projecting angles of more than 30 deg. and less than 90 deg. from a laser transmitters 6a and 6b. The reflected lights are received with a streak camera 1, which runs at a sending speed synchronized with the speed of the hot steel piece 8, on a light sensitive film. Thus flaws on the surface are detected. At this time, the distributions of the illuminances of the laser slit lights 7 on the surface of the hot steel piece 8 are formed so that the end parts are higher than the central part of the hot steel piece 8. In this way, the clear photograph an be taken for the entire width of the hot steel piece, and even minute flaws can be definitely detected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18015687A JPS6425044A (en) | 1987-07-21 | 1987-07-21 | Flaw detecting method for hot surface |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18015687A JPS6425044A (en) | 1987-07-21 | 1987-07-21 | Flaw detecting method for hot surface |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6425044A true JPS6425044A (en) | 1989-01-27 |
Family
ID=16078376
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18015687A Pending JPS6425044A (en) | 1987-07-21 | 1987-07-21 | Flaw detecting method for hot surface |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6425044A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7307727B2 (en) * | 2002-11-25 | 2007-12-11 | Advanced Lcd Technologies Development Center Co., Ltd. | Method and apparatus for forming substrate for semiconductor or the like |
| JP2008304306A (en) * | 2007-06-07 | 2008-12-18 | Nippon Steel Corp | Device and method for inspecting defects |
-
1987
- 1987-07-21 JP JP18015687A patent/JPS6425044A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7307727B2 (en) * | 2002-11-25 | 2007-12-11 | Advanced Lcd Technologies Development Center Co., Ltd. | Method and apparatus for forming substrate for semiconductor or the like |
| JP2008304306A (en) * | 2007-06-07 | 2008-12-18 | Nippon Steel Corp | Device and method for inspecting defects |
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