JPS6425018A - Measuring device of temperature - Google Patents
Measuring device of temperatureInfo
- Publication number
- JPS6425018A JPS6425018A JP18095587A JP18095587A JPS6425018A JP S6425018 A JPS6425018 A JP S6425018A JP 18095587 A JP18095587 A JP 18095587A JP 18095587 A JP18095587 A JP 18095587A JP S6425018 A JPS6425018 A JP S6425018A
- Authority
- JP
- Japan
- Prior art keywords
- shield
- magnetic field
- sensor
- temperature
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measuring Magnetic Variables (AREA)
Abstract
PURPOSE:To enable the accurate measurement of temperature even in a magnetic field and to enable the specification of limits of measurement, by enclosing a sensor with a magnetic shield formed of an oxide superconductor and by providing a one-turn coil therefor. CONSTITUTION:A magnetic shield 21 formed of a cylindrical oxide superconductor is so provided as to enclose a sensor 10 for which a germanium resistor is used, and a one-turn coil 22 is provided inside the shield. When an external magnetic field 23 is applied to the loop of the shield 21 whose temperature is lower than a critical temperature, a shielding current for the shield 21 flows, a magnetic field inside the loop turns to be zero, and the sensor 10 can execute precise measurement of temperature in the environment wherein the magnetic field is never imparted. When the magnetic field 23 turns strong and reaches a certain value, on the other hand, the superconducting state of the superconductor is broken down and it transfers to normal conduction. Thereby the shielding current in the shield 21 is eliminated, a magnetic flux invades into the loop of the shield 21, and the sensor 10 is exposed to the magnetic field. Accordingly, a voltage is generated in the one-turn coil 22 according to a prescribed formula, and the precise limits of measurement of the sensor can be determined by observing said voltage.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18095587A JPH0682075B2 (en) | 1987-07-22 | 1987-07-22 | Temperature measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18095587A JPH0682075B2 (en) | 1987-07-22 | 1987-07-22 | Temperature measuring device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6425018A true JPS6425018A (en) | 1989-01-27 |
JPH0682075B2 JPH0682075B2 (en) | 1994-10-19 |
Family
ID=16092197
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18095587A Expired - Fee Related JPH0682075B2 (en) | 1987-07-22 | 1987-07-22 | Temperature measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0682075B2 (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03146496A (en) * | 1989-10-31 | 1991-06-21 | Shinetsu Sekiei Kk | Silica glass crucible for pulling silicon single crystal and method for inspecting the same |
EP0467391A2 (en) * | 1990-07-20 | 1992-01-22 | Tokyo Electron Limited | Plasma apparatus, and method and system for extracting electrical signal of member to which high-frequency-wave is applied |
US5202820A (en) * | 1991-12-16 | 1993-04-13 | Ford Motor Company | Saturable inductor protection circuit for inductive load driver |
JPH08283092A (en) * | 1995-12-18 | 1996-10-29 | Shinetsu Quartz Prod Co Ltd | Method for inspecting silica glass crucible for pulling up silicon single crystal |
CN104215355A (en) * | 2014-09-04 | 2014-12-17 | 中国科学院电工研究所 | System of online temperature monitoring for high-temperature superconducting tape |
-
1987
- 1987-07-22 JP JP18095587A patent/JPH0682075B2/en not_active Expired - Fee Related
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03146496A (en) * | 1989-10-31 | 1991-06-21 | Shinetsu Sekiei Kk | Silica glass crucible for pulling silicon single crystal and method for inspecting the same |
EP0467391A2 (en) * | 1990-07-20 | 1992-01-22 | Tokyo Electron Limited | Plasma apparatus, and method and system for extracting electrical signal of member to which high-frequency-wave is applied |
EP0467391A3 (en) * | 1990-07-20 | 1992-03-18 | Tokyo Electron Limited | Plasma apparatus, and method and system for extracting electrical signal of member to which high-frequency-wave is applied |
US5147497A (en) * | 1990-07-20 | 1992-09-15 | Tokyo Electron Limited | Plasma apparatus, and method and system for extracting electrical signal of member to which high-frequency wave is applied |
US5202820A (en) * | 1991-12-16 | 1993-04-13 | Ford Motor Company | Saturable inductor protection circuit for inductive load driver |
JPH08283092A (en) * | 1995-12-18 | 1996-10-29 | Shinetsu Quartz Prod Co Ltd | Method for inspecting silica glass crucible for pulling up silicon single crystal |
CN104215355A (en) * | 2014-09-04 | 2014-12-17 | 中国科学院电工研究所 | System of online temperature monitoring for high-temperature superconducting tape |
Also Published As
Publication number | Publication date |
---|---|
JPH0682075B2 (en) | 1994-10-19 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |