JPS642214B2 - - Google Patents

Info

Publication number
JPS642214B2
JPS642214B2 JP15447781A JP15447781A JPS642214B2 JP S642214 B2 JPS642214 B2 JP S642214B2 JP 15447781 A JP15447781 A JP 15447781A JP 15447781 A JP15447781 A JP 15447781A JP S642214 B2 JPS642214 B2 JP S642214B2
Authority
JP
Japan
Prior art keywords
sample surface
sample
data
discharge
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP15447781A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5855736A (ja
Inventor
Naoki Imamura
Isao Fukui
Takahide Hirano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP15447781A priority Critical patent/JPS5855736A/ja
Publication of JPS5855736A publication Critical patent/JPS5855736A/ja
Publication of JPS642214B2 publication Critical patent/JPS642214B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP15447781A 1981-09-28 1981-09-28 発光分光分析による濃度分布解析装置 Granted JPS5855736A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15447781A JPS5855736A (ja) 1981-09-28 1981-09-28 発光分光分析による濃度分布解析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15447781A JPS5855736A (ja) 1981-09-28 1981-09-28 発光分光分析による濃度分布解析装置

Publications (2)

Publication Number Publication Date
JPS5855736A JPS5855736A (ja) 1983-04-02
JPS642214B2 true JPS642214B2 (ko) 1989-01-17

Family

ID=15585102

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15447781A Granted JPS5855736A (ja) 1981-09-28 1981-09-28 発光分光分析による濃度分布解析装置

Country Status (1)

Country Link
JP (1) JPS5855736A (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0629857B2 (ja) * 1986-01-13 1994-04-20 新日本製鐵株式会社 鋼材の表面疵要因判定法
JP2722852B2 (ja) * 1991-04-08 1998-03-09 住友金属工業株式会社 発光分光分析方法及び発光分光分析装置
EP1351049A3 (en) * 2002-04-01 2004-02-25 Central Iron & Steel Research Institute Analyzer for metal
FR2838827B3 (fr) * 2002-04-19 2004-04-02 Central Iron & Steel Res Inst Methode d'analyse de distribution statistique de position originale pour un metal

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57122351A (en) * 1981-01-21 1982-07-30 Nippon Steel Corp Method of spectrochemical analysis wherein continuous light emission is utilized

Also Published As

Publication number Publication date
JPS5855736A (ja) 1983-04-02

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