JPS6418066A - Sampling apparatus by photoelectron - Google Patents

Sampling apparatus by photoelectron

Info

Publication number
JPS6418066A
JPS6418066A JP17550987A JP17550987A JPS6418066A JP S6418066 A JPS6418066 A JP S6418066A JP 17550987 A JP17550987 A JP 17550987A JP 17550987 A JP17550987 A JP 17550987A JP S6418066 A JPS6418066 A JP S6418066A
Authority
JP
Japan
Prior art keywords
signal
pulse
measured
photoelectron
modulated
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17550987A
Other languages
Japanese (ja)
Other versions
JPH0573177B2 (en
Inventor
Yoshihiro Takiguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority to JP17550987A priority Critical patent/JPS6418066A/en
Priority to DE88111265T priority patent/DE3884490T2/en
Priority to EP88111265A priority patent/EP0299465B1/en
Priority to US07/218,795 priority patent/US4891581A/en
Publication of JPS6418066A publication Critical patent/JPS6418066A/en
Publication of JPH0573177B2 publication Critical patent/JPH0573177B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/20—Cathode-ray oscilloscopes
    • G01R13/22—Circuits therefor
    • G01R13/34—Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/347—Circuits for representing a single waveform by sampling, e.g. for very high frequencies using electro-optic elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To obtain a sampling apparatus having a resolution from a picosecond to a femtosecond and having an excellent SN ratio and high reliability, by modulating a photoelectron pulse by an electric signal to be measured which is impressed on a signal electrode, and by taking out a modulated signal thus obtained. CONSTITUTION:A pulse light source 2 and a source 1 of a signal to be measured are synchronized with each other by a signal from a timing signal 9. The generation timings of a pulse light and the signal to be measured on the occasion are delayed optically or electrically by a delay circuit 10, and the delay amounts of them can be varied freely. The pulse light from the light source 2 enters a photoelectron sampling tube 4 through a light transmission system 3, and a photoelectron pulse is generated therefrom. The photoelectron pulse generated is modulated in intensity by the signal to be measured. This modulated pulse is multiplied in the tube 4, and an output thereof is integrated by an integrator 6 and amplified by an amplifier 7. On the occasion, a time difference between the photoelectron pulse and the signal to be measured, i.e. a phase of the photoelectron pulse being modulated in intensity by the signal to be measured, is varied, and, with this time difference used as a function, a waveform of the signal to be measured can be reproduced in a display processing unit 8.
JP17550987A 1987-07-14 1987-07-14 Sampling apparatus by photoelectron Granted JPS6418066A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP17550987A JPS6418066A (en) 1987-07-14 1987-07-14 Sampling apparatus by photoelectron
DE88111265T DE3884490T2 (en) 1987-07-14 1988-07-13 Device for sampling, analyzing and displaying an electrical signal.
EP88111265A EP0299465B1 (en) 1987-07-14 1988-07-13 An apparatus for sampling, analyzing and displaying an electrical signal
US07/218,795 US4891581A (en) 1987-07-14 1988-07-14 Apparatus for sampling, analyzing and displaying an electrical signal

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17550987A JPS6418066A (en) 1987-07-14 1987-07-14 Sampling apparatus by photoelectron

Publications (2)

Publication Number Publication Date
JPS6418066A true JPS6418066A (en) 1989-01-20
JPH0573177B2 JPH0573177B2 (en) 1993-10-13

Family

ID=15997293

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17550987A Granted JPS6418066A (en) 1987-07-14 1987-07-14 Sampling apparatus by photoelectron

Country Status (1)

Country Link
JP (1) JPS6418066A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02198338A (en) * 1989-01-27 1990-08-06 Komatsu Ltd Method for measuring human body

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02198338A (en) * 1989-01-27 1990-08-06 Komatsu Ltd Method for measuring human body

Also Published As

Publication number Publication date
JPH0573177B2 (en) 1993-10-13

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