JPS6411347A - Monolithic integrated circuit - Google Patents

Monolithic integrated circuit

Info

Publication number
JPS6411347A
JPS6411347A JP16731787A JP16731787A JPS6411347A JP S6411347 A JPS6411347 A JP S6411347A JP 16731787 A JP16731787 A JP 16731787A JP 16731787 A JP16731787 A JP 16731787A JP S6411347 A JPS6411347 A JP S6411347A
Authority
JP
Japan
Prior art keywords
layer
capacitor
film
silicon nitride
insulating film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16731787A
Other languages
Japanese (ja)
Inventor
Hitoshi Yamaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rohm Co Ltd
Original Assignee
Rohm Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rohm Co Ltd filed Critical Rohm Co Ltd
Priority to JP16731787A priority Critical patent/JPS6411347A/en
Publication of JPS6411347A publication Critical patent/JPS6411347A/en
Pending legal-status Critical Current

Links

Landscapes

  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

PURPOSE:To form a capacitor with a relatively large capacity by intervening a silicon nitride film having a high dielectirc constant between lower and upper electrode layers composing the capacitor. CONSTITUTION:A bipolar transistor which is composed of a diffused layer 10, an epitaxial layer 11, a base diffused layer 12, an emitter diffused layer 13, and a collector layer 14 is formed at the surface part of a silicon substrate 1. The first interconnecion conductive layers 4a, 4b, and 4c corresponding to the collector, emitter, and base of the transistor are formed through openings which are formed at specific places of a silicon interface protective film 3. The lower electrode layer 3 which composes one side of electrodes of a capacitor is formed at the upper part of the interface protective film 2 and a part of the lower electrode layer 3 and the first interconnecion conductive layers 4a, 4b, and 4c are coated with an insulating film containing silicon oxide. A contact hole H is formed at the part of the insulating film 5 anc a silicon nitride film 6 is formed on the whole surface of the insulating film and on its film 6 an upper electrode layer 7 and the second interconnection conductive layer 8 are formed respectively. As the lower and upper electrode layers 3 and 7 have relatively thin films and are facing each other, thereby intervening only the silicon nitride film 6 having a high dielectric constant between two electrodes, a capacitor with a relatively large capacity is formed.
JP16731787A 1987-07-03 1987-07-03 Monolithic integrated circuit Pending JPS6411347A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16731787A JPS6411347A (en) 1987-07-03 1987-07-03 Monolithic integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16731787A JPS6411347A (en) 1987-07-03 1987-07-03 Monolithic integrated circuit

Publications (1)

Publication Number Publication Date
JPS6411347A true JPS6411347A (en) 1989-01-13

Family

ID=15847507

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16731787A Pending JPS6411347A (en) 1987-07-03 1987-07-03 Monolithic integrated circuit

Country Status (1)

Country Link
JP (1) JPS6411347A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4987857A (en) * 1988-06-21 1991-01-29 Anelva Corporation Vacuum deposition apparatus with dust collector electrode
US5227323A (en) * 1991-06-19 1993-07-13 Matsushita Electric Industrial Co., Ltd. Method of manufacturing capacitor elements in an integrated circuit having a compound semiconductor substrate
JPH06296897A (en) * 1994-03-30 1994-10-25 Ebara Res Co Ltd Method and device for cleaning closed space

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58215067A (en) * 1982-06-08 1983-12-14 Nec Corp Semiconductor integrated circuit device
JPS5927565A (en) * 1982-07-09 1984-02-14 エヌ・ベイ・フイリツプス・フル−イランペンフアブリケン Method of producing condenser integrated with microelectronic structure and apparatus produced therefrom

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58215067A (en) * 1982-06-08 1983-12-14 Nec Corp Semiconductor integrated circuit device
JPS5927565A (en) * 1982-07-09 1984-02-14 エヌ・ベイ・フイリツプス・フル−イランペンフアブリケン Method of producing condenser integrated with microelectronic structure and apparatus produced therefrom

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4987857A (en) * 1988-06-21 1991-01-29 Anelva Corporation Vacuum deposition apparatus with dust collector electrode
US5227323A (en) * 1991-06-19 1993-07-13 Matsushita Electric Industrial Co., Ltd. Method of manufacturing capacitor elements in an integrated circuit having a compound semiconductor substrate
JPH06296897A (en) * 1994-03-30 1994-10-25 Ebara Res Co Ltd Method and device for cleaning closed space

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