JPS6410663A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS6410663A
JPS6410663A JP62165526A JP16552687A JPS6410663A JP S6410663 A JPS6410663 A JP S6410663A JP 62165526 A JP62165526 A JP 62165526A JP 16552687 A JP16552687 A JP 16552687A JP S6410663 A JPS6410663 A JP S6410663A
Authority
JP
Japan
Prior art keywords
electrode
capacitor
region
equal
insulating film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62165526A
Other languages
Japanese (ja)
Inventor
Shiro Arikawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP62165526A priority Critical patent/JPS6410663A/en
Publication of JPS6410663A publication Critical patent/JPS6410663A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To obtain a capacitor having a sufficient capacitance without decreasing the area-efficiency and the yield, by stacking, capacitor electrodes via insulating layer, the number of stacked layers being more than or equal to a specified value. CONSTITUTION:In a p<-> region 3, a p<+> region 12 to make an ohmic contact is arranged. A voltage for inversely biasing the p-n junction between an n-type substrate 1 and an n<+> region 5 is applied to an electrode 10 for electric isolation. On the n<+> region 5, an electrode 6 of polysilicon turning to one electrode of a capacitor is formed via an insulating film 4. Further, polysilicon electrodes of more than or equal to three layers are stacked, sandwiching an interlayer insulating film 7. As an electrode 8 is brought into electrical contact with the n<+> region 5, a capacitor is constituted in which the electrode 6 serves as the other electrode. For example, in the case where the areas of the electrodes 6 and 8 are equal, and the materials and the thicknesses of an insulating film 4 and the interlayer insulating layer 7 are identical, a capacitor having the same occupied area with the usual structure can realize a two-fold capacitance.
JP62165526A 1987-07-03 1987-07-03 Semiconductor device Pending JPS6410663A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62165526A JPS6410663A (en) 1987-07-03 1987-07-03 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62165526A JPS6410663A (en) 1987-07-03 1987-07-03 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS6410663A true JPS6410663A (en) 1989-01-13

Family

ID=15814068

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62165526A Pending JPS6410663A (en) 1987-07-03 1987-07-03 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS6410663A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5032892A (en) * 1988-05-31 1991-07-16 Micron Technology, Inc. Depletion mode chip decoupling capacitor
CN100428485C (en) * 2004-07-16 2008-10-22 富士通株式会社 Solid-state image sensor and method for fabricating the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5032892A (en) * 1988-05-31 1991-07-16 Micron Technology, Inc. Depletion mode chip decoupling capacitor
CN100428485C (en) * 2004-07-16 2008-10-22 富士通株式会社 Solid-state image sensor and method for fabricating the same

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