JPS6384867U - - Google Patents

Info

Publication number
JPS6384867U
JPS6384867U JP18060886U JP18060886U JPS6384867U JP S6384867 U JPS6384867 U JP S6384867U JP 18060886 U JP18060886 U JP 18060886U JP 18060886 U JP18060886 U JP 18060886U JP S6384867 U JPS6384867 U JP S6384867U
Authority
JP
Japan
Prior art keywords
ion implantation
ion beam
implantation device
ion
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18060886U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP18060886U priority Critical patent/JPS6384867U/ja
Publication of JPS6384867U publication Critical patent/JPS6384867U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの考案の一実施例によるイオン注入
装置の構成図、第2図は実施例におけるイオン注
入の状態を示す断面図、第3図は従来のイオン注
入装置を示す構成図、第4図は従来のイオン注入
装置を用いた場合のイオン注入の状態を示す断面
図である。 1はイオン源、2は分析マグネツト、3はウエ
ハ、4はデイスク、6はイオンビーム、7はイオ
ンビーム偏向用電極、8は分析スリツト、14は
非注入領域である。図中、同一符号は同一または
相当部分を示す。
FIG. 1 is a block diagram of an ion implanter according to an embodiment of this invention, FIG. 2 is a cross-sectional view showing the ion implantation state in the embodiment, FIG. 3 is a block diagram of a conventional ion implanter, and FIG. The figure is a cross-sectional view showing the state of ion implantation when a conventional ion implantation device is used. 1 is an ion source, 2 is an analysis magnet, 3 is a wafer, 4 is a disk, 6 is an ion beam, 7 is an electrode for deflecting the ion beam, 8 is an analysis slit, and 14 is a non-implanted region. In the drawings, the same reference numerals indicate the same or corresponding parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] プリデポ型イオン注入装置において、分析マグ
ネツト以降に、ウエハに対してイオンビームをチ
ヤネリングを防止できる角度で互に反対方向から
注入できるようにするイオンビーム偏向用電極を
設けたことを特徴とするイオン注入装置。
An ion implantation device characterized in that a pre-deposition type ion implantation device is provided with an ion beam deflection electrode after the analysis magnet so that the ion beam can be implanted into the wafer from opposite directions at an angle that prevents channeling. Device.
JP18060886U 1986-11-24 1986-11-24 Pending JPS6384867U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18060886U JPS6384867U (en) 1986-11-24 1986-11-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18060886U JPS6384867U (en) 1986-11-24 1986-11-24

Publications (1)

Publication Number Publication Date
JPS6384867U true JPS6384867U (en) 1988-06-03

Family

ID=31124718

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18060886U Pending JPS6384867U (en) 1986-11-24 1986-11-24

Country Status (1)

Country Link
JP (1) JPS6384867U (en)

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