JPS6384506U - - Google Patents
Info
- Publication number
- JPS6384506U JPS6384506U JP17918986U JP17918986U JPS6384506U JP S6384506 U JPS6384506 U JP S6384506U JP 17918986 U JP17918986 U JP 17918986U JP 17918986 U JP17918986 U JP 17918986U JP S6384506 U JPS6384506 U JP S6384506U
- Authority
- JP
- Japan
- Prior art keywords
- measured
- reference axis
- detector
- axis
- light emitting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000001514 detection method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Description
第1図A,B及びCはこの考案の実施例の要部
を示すそれぞれ正面図、平面図及び斜視図、第2
図は従来提案されている生体断面表示測定装置の
側面図、第3図は第2図の測定装置における検出
器の受光面上の受光点と被測定体の被測定点との
対応関係の説明に供するための原理図、第4図は
第2図の測定装置の電子回路部のブロツク図、第
5図は第4図のブロツク図の各部の信号波型図で
ある。
Figures 1A, B, and C are a front view, a plan view, and a perspective view showing the main parts of the embodiment of this invention, respectively;
The figure is a side view of a conventional biological cross-section display measurement device, and FIG. 3 is an explanation of the correspondence between the light-receiving point on the light-receiving surface of the detector and the measurement point of the object in the measurement device of FIG. 2. FIG. 4 is a block diagram of the electronic circuit section of the measuring device of FIG. 2, and FIG. 5 is a signal waveform diagram of each part of the block diagram of FIG. 4.
Claims (1)
、前記基準軸上の複数位置に向けて光波を照射す
る発光源が前記基準軸を軸心とする回転面上に配
設され、 前記被測定体と前記発光源とは前記基準軸の廻
りに相対的に回動可能に取り付けられ、 前記発光源は前記複数位置への光波の照射に対
応して前記回転面上において前記基準軸に対して
ほぼ平行な線上に位置し、 前記被測定体の照射位置からの反射光が検出器
で受光検出され、 この検出器の検出出力に基づいて前記基準軸か
ら前記被測定体表面の照射位置までの距離が測定
され、 前記検出器は前記平行な線上より前記相対的回
動方向においてずらして配設されて成る表面三次
元形状測定装置。[Claims for Utility Model Registration] A light emitting source that irradiates light waves toward a plurality of positions on the reference axis of an object to be measured, which is positioned with the reference axis as the axis, is a rotating surface with the reference axis as the axis. the object to be measured and the light emitting source are mounted so as to be relatively rotatable around the reference axis, and the light emitting source rotates in response to the irradiation of light waves to the plurality of positions. located on a line substantially parallel to the reference axis on the surface, the reflected light from the irradiation position of the object to be measured is received and detected by a detector, and based on the detection output of this detector, the A three-dimensional surface shape measuring device, wherein a distance to an irradiation position on a surface of a measured object is measured, and the detector is disposed offset from the parallel line in the relative rotation direction.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17918986U JPS6384506U (en) | 1986-11-21 | 1986-11-21 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17918986U JPS6384506U (en) | 1986-11-21 | 1986-11-21 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6384506U true JPS6384506U (en) | 1988-06-02 |
Family
ID=31122028
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17918986U Pending JPS6384506U (en) | 1986-11-21 | 1986-11-21 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6384506U (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6058650A (en) * | 1983-09-12 | 1985-04-04 | Nec Kansai Ltd | Electronic component |
JPS60142235A (en) * | 1983-12-28 | 1985-07-27 | Fujitsu Ltd | Article inspecting device |
-
1986
- 1986-11-21 JP JP17918986U patent/JPS6384506U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6058650A (en) * | 1983-09-12 | 1985-04-04 | Nec Kansai Ltd | Electronic component |
JPS60142235A (en) * | 1983-12-28 | 1985-07-27 | Fujitsu Ltd | Article inspecting device |
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