JPS6375642A - Infrared absorption spectrum reflecting and measuring apparatus - Google Patents

Infrared absorption spectrum reflecting and measuring apparatus

Info

Publication number
JPS6375642A
JPS6375642A JP61219598A JP21959886A JPS6375642A JP S6375642 A JPS6375642 A JP S6375642A JP 61219598 A JP61219598 A JP 61219598A JP 21959886 A JP21959886 A JP 21959886A JP S6375642 A JPS6375642 A JP S6375642A
Authority
JP
Japan
Prior art keywords
specimen
infrared
infrared rays
infrared light
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61219598A
Other languages
Japanese (ja)
Inventor
Kinya Eguchi
江口 欣也
Kikue Niitsuma
新妻 喜久枝
Shigeru Wakana
若菜 茂
Masayoshi Ezawa
江沢 正義
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP61219598A priority Critical patent/JPS6375642A/en
Publication of JPS6375642A publication Critical patent/JPS6375642A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/4738Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474Details of optical heads therefor, e.g. using optical fibres

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To measure an infrared spectrum with high sensitivity by guiding infrared rays to the minute part of a specimen while reducing the scattering thereof, by guiding infrared rays to a fine pipe made of gold or having a gold plated inner surface to irradiate the specimen and condensing the reflected light from the specimen to a detector through an eccentric type ellipsoidal reflecting mirror. CONSTITUTION:The tille apparatus measures an infrared absorption spectrum according to a reflecting method and is especially adapted to a minute point infrared reflecting spectral apparatus requiring high brightness infrared rays. That is, the infrared rays 2 from an infrared rays source pass through a pipe (light pipe) made of gold without generating scattering to irradiate the extremely minute point of a specimen 3 to be analyzed. The incident angle of said infrared rays at this time is set to 45 deg.. The measuring part of the specimen 3 to be analyzed is present at the almost one focus position of an eccentric type ellipsoidal reflecting mirror 4 constituting a reflected light condensing system and the reflected light from the specimen 3 to be analyzed is condensed to a detector 5 by the eccentric type ellipsoidal reflecting mirror 4.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は反射法により赤外吸収スペクトルを測定する装
置に係り、特に高輝度赤外光が要求される微小点赤外反
射分光装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an apparatus for measuring an infrared absorption spectrum by a reflection method, and particularly to a minute point infrared reflection spectrometer that requires high-intensity infrared light.

〔従来の技術〕[Conventional technology]

一般に、赤外分光光度計は公知のものであり、赤外光源
、赤外光の各波長ごとの測定信号を得るためのモノクロ
メータまたは複光束干渉計、および検知器等から構成さ
れている。標準的な赤外分光光度計では、試料保持部上
の試料の測定位置に赤外光の収束させ、試料中を透過せ
しめて測定するように形成されている。従って、赤外光
に透明な試料はかかる方法で測定出来るが、赤外光に不
透明な物質はその表面で、反射、拡散する反射光を測定
することが必要である。このための装置は特開昭58−
117438号公報の記載にある第2図に示した様なも
ので、2つの対向する偏向平面反射鏡9.10の一つ9
から出射する発散赤外光を平行化するコリメータ反射鏡
11およびこの平行光を試料の測定部へ収束入射させ、
さらに測定部からの反射光を受ける放物面反射鏡13及
びコリメータ反射鏡12、さらにこの光を検出器へ変向
させる平面反射鏡10からなる。
In general, infrared spectrophotometers are well known and are comprised of an infrared light source, a monochromator or double beam interferometer for obtaining measurement signals for each wavelength of infrared light, a detector, and the like. A standard infrared spectrophotometer is configured so that infrared light is focused on a measurement position of a sample on a sample holder and is transmitted through the sample for measurement. Therefore, although a sample that is transparent to infrared light can be measured using this method, it is necessary to measure the reflected light that is reflected and diffused on the surface of a substance that is opaque to infrared light. The device for this purpose was published in Japanese Patent Application Laid-open No. 58-
117438, as shown in FIG.
A collimator reflecting mirror 11 that collimates the divergent infrared light emitted from the collimator, and the collimated light is convergently incident on the measurement part of the sample.
It further includes a parabolic reflector 13 and a collimator reflector 12 that receive reflected light from the measuring section, and a flat reflector 10 that deflects this light toward a detector.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

この装置は測定部を放物面反射鏡の焦点の位置に置く必
要が有り、放物面反射鏡の大きさで試料の大きさに制限
される欠点がある。また2つのコリメータ反射鏡のそれ
ぞれの焦点は赤外分光光度計の焦点第2図のfl+f!
に一致させる必要があるが、この調整はかなり困難な作
業である。両者の焦点が一致してないと、コリメータ反
射鏡11から出た赤外光は平行化出来ず散乱してしまう
ため、赤外光の放物面反射鏡による収束が悪く、測定部
に広がって当るため、微小試料では有効に赤外光が当ら
なくなる。また放物面反射鏡13を出た赤外光も、コリ
メータ反射鏡12の焦点が赤外分光光度計の焦点f、と
台ないため、検出器に入る赤外光の強度が弱くなり、S
/Nの悪いスペクトルしか得らnないなどの問題があっ
た。
This device requires the measurement unit to be placed at the focal point of the parabolic reflector, and has the drawback that the size of the parabolic reflector is limited by the size of the sample. Also, the respective focal points of the two collimator reflecting mirrors are the focal points of the infrared spectrophotometer fl+f! in Figure 2!
However, this adjustment is quite difficult. If the two focal points do not match, the infrared light emitted from the collimator reflector 11 cannot be collimated and is scattered, so the infrared light is poorly converged by the parabolic reflector and spread to the measuring section. Therefore, the infrared light will not effectively hit the micro sample. In addition, the infrared light that exits the parabolic reflector 13 is not focused on the focal point f of the infrared spectrophotometer, so the intensity of the infrared light that enters the detector is weakened, and S
There were problems such as only a bad spectrum of /N being obtained.

本発明の目的は、上記問題点を解決するためになされた
ものである。
An object of the present invention is to solve the above problems.

〔問題点を解決するための手段〕[Means for solving problems]

赤外光が有効に微小試料に当るために、赤外光が散乱し
ない様に赤外光光源から出た赤外光を試料まで導く必要
がある。赤外光の散乱のない光路をガスクロマトグラフ
−フーリエ変換赤外分光光度計の検出部に用いられてい
る金製の細管(ライトパイプ)を用いる事にした。この
ライトパイプの外径は2〜3Mφ程度であるので、赤外
光の入射角度大きくとっても試料が邪魔にならない。赤
外光の散乱を小さくするためにライトパイプの先端は試
料に近くする必要がある。このためライトパイプの径が
大きい場合、赤外光の入射角を大きくとると試料に当る
ため試料を小さくする必要がある。また有効にライトパ
イプに赤外光を入iLるために、集光鏡または集光レン
ズを用いる墨にした。またライトパイプから出た赤外光
を集光鏡または集光レンズを用いる事にした。
In order for the infrared light to effectively hit the microsample, it is necessary to guide the infrared light emitted from the infrared light source to the sample so that the infrared light is not scattered. We decided to use a thin gold tube (light pipe) used in the detection section of a gas chromatograph-Fourier transform infrared spectrophotometer to create an optical path that does not scatter infrared light. Since the outer diameter of this light pipe is about 2 to 3 Mφ, the sample does not get in the way even if the incident angle of the infrared light is large. The tip of the light pipe needs to be close to the sample to reduce scattering of infrared light. For this reason, if the diameter of the light pipe is large, if the incident angle of the infrared light is large, the infrared light will hit the sample, so it is necessary to make the sample small. In addition, in order to effectively enter infrared light into the light pipe, a condensing mirror or condensing lens was used. We also decided to use a condenser mirror or condenser lens to capture the infrared light emitted from the light pipe.

〔作用〕[Effect]

金製の細管(ライトパイプ)は赤外光源から出た赤外光
を散乱させる事なく、光源から試料まで赤外光を導く光
の通路である。集光鏡または集光レンズは赤外光源の赤
外光を有効にライトパイプに導くためのもので、またラ
イトパイプから出た赤外光を有効に微小試料に当てるも
のである。
A thin gold tube (light pipe) is a light path that guides infrared light from the light source to the sample without scattering the infrared light emitted from the infrared light source. A condensing mirror or a condensing lens is used to effectively guide infrared light from an infrared light source to a light pipe, and also to effectively direct infrared light emitted from the light pipe onto a microscopic sample.

〔実施例〕〔Example〕

以下本発明の一実施例を第1図により説明する。 An embodiment of the present invention will be described below with reference to FIG.

第1図において、1は赤外光光源からの赤外光2を通過
させて試料3に照射する金製の内径1flφ外径2關φ
、長さ501mの金製のライトパイプ(細管)、4は試
料の反射光を集光して検出器5へ送り込む集光系をなす
軸外し型だ円面反射鏡である。
In Fig. 1, reference numeral 1 indicates a gold metal inner diameter 1flφouter diameter 2φ through which infrared light 2 from an infrared light source passes and irradiates the sample 3.
, a gold light pipe (tube) with a length of 501 m, and 4 an off-axis ellipsoidal reflector forming a condensing system that condenses the reflected light from the sample and sends it to the detector 5.

6はライトパイプを赤外光を有効に導入するためのKB
rffの集光レンズ、7はライトパイプから出た赤外光
を有効に試料の微小部に邑てるための103r製の集光
レンズである。8は試料の一部だけを測定するためのア
パチュア−である。この構成で、赤外光光源からの赤外
光2はライトパイプ1内を通過して、分析試料4の極微
小部に当る。この時の入射角度は45度とする。この分
析試料4の測定部は反射光の集光系をなす軸外し型だ円
面反射鏡4のほぼ一つの焦点位置にあって、分析試料4
からの反射光はこの軸外し型だ円面反射鏡により集光さ
れ他の焦点位置に置れた検出器5に集光される。また試
料3の微小部だけを測定するために、他の不要部の赤外
光を8のアパチュアによって除くが可能である。
6 is a KB for effectively introducing infrared light into the light pipe.
The rff condensing lens 7 is a condensing lens made of 103r for effectively directing the infrared light emitted from the light pipe into a minute part of the sample. 8 is an aperture for measuring only a part of the sample. With this configuration, the infrared light 2 from the infrared light source passes through the light pipe 1 and hits a very small portion of the analysis sample 4. The angle of incidence at this time is 45 degrees. The measurement part of the analysis sample 4 is located at almost one focal point of the off-axis ellipsoidal reflector 4 that forms the condensing system for the reflected light.
The reflected light is focused by this off-axis ellipsoidal reflector and focused on a detector 5 placed at another focal position. Further, in order to measure only a minute portion of the sample 3, it is possible to remove infrared light from other unnecessary portions using an aperture 8.

以上のような本実施例によれば、赤外光が通過才、Z、
 n−hiりn itm (1”+了、ぐキー了ん…L
s Z 虜1.r h jQ =d’ LW上の10μ
m径の有機物の赤外スペクトルが高感度で測定出来た。
According to this embodiment as described above, the infrared light passes through the
n-hirin itm (1” + completed, ugh key completed…L
s Z prisoner 1. r h jQ = d' 10μ on LW
Infrared spectra of m-diameter organic substances could be measured with high sensitivity.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、赤外光光源から出た赤外光を少ない散
乱で試料の微小部に導く事が出来るため試料上微小部の
赤外スペクトルが高感度で測定出来る。
According to the present invention, infrared light emitted from an infrared light source can be guided to a minute part of a sample with little scattering, so that the infrared spectrum of a minute part on a sample can be measured with high sensitivity.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示した構成図、第2図は従
来装置の概要を示した構成図である。 1・・・金製の細管    2・・・赤外光3・・・試
料       4・・・軸外しだ円面反射鏡5・・・
検出器      6,7・・・集光レンズ8・・・ア
パチュア    9 、10山平面反射光11 、12
・・・コリメータ反射鏡 13・・・放物面反射鏡 代理人 弁理士  小 川 勝 男 4 隼光、しり又− 7,Sたし〉ス ヌλ 図
FIG. 1 is a block diagram showing an embodiment of the present invention, and FIG. 2 is a block diagram showing an outline of a conventional device. 1... Gold thin tube 2... Infrared light 3... Sample 4... Off-axis ellipsoidal reflector 5...
Detector 6, 7...Condensing lens 8...Aperture 9, 10 peak plane reflected light 11, 12
... Collimator reflector 13 ... Parabolic reflector Agent Patent attorney Masaru Ogawa Male 4 Hayamitsu, Shirimata - 7, S Tashi> Sunu λ Figure

Claims (1)

【特許請求の範囲】[Claims] 1、試料台の上に試料をのせ、試料表面の赤外スペクト
ルを反射法で測定する装置において、赤外光源からの赤
外光を導き上記試料に照射する金または内部金めっき製
の細管と、上記試料からの反射光を集光する集光系とか
ら成る事を特徴とする赤外吸収スペクトル反射測定装置
1. In an apparatus that measures the infrared spectrum of the sample surface using the reflection method by placing a sample on a sample stage, a thin tube made of gold or internally plated with gold is used to guide infrared light from an infrared light source and irradiate the sample. , and a condensing system that condenses the reflected light from the sample.
JP61219598A 1986-09-19 1986-09-19 Infrared absorption spectrum reflecting and measuring apparatus Pending JPS6375642A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61219598A JPS6375642A (en) 1986-09-19 1986-09-19 Infrared absorption spectrum reflecting and measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61219598A JPS6375642A (en) 1986-09-19 1986-09-19 Infrared absorption spectrum reflecting and measuring apparatus

Publications (1)

Publication Number Publication Date
JPS6375642A true JPS6375642A (en) 1988-04-06

Family

ID=16738044

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61219598A Pending JPS6375642A (en) 1986-09-19 1986-09-19 Infrared absorption spectrum reflecting and measuring apparatus

Country Status (1)

Country Link
JP (1) JPS6375642A (en)

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