JPS6369137A - Mass spectrometer - Google Patents
Mass spectrometerInfo
- Publication number
- JPS6369137A JPS6369137A JP61213222A JP21322286A JPS6369137A JP S6369137 A JPS6369137 A JP S6369137A JP 61213222 A JP61213222 A JP 61213222A JP 21322286 A JP21322286 A JP 21322286A JP S6369137 A JPS6369137 A JP S6369137A
- Authority
- JP
- Japan
- Prior art keywords
- auxiliary coil
- magnetic field
- coil
- core
- mass spectrometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims abstract description 8
- 230000005284 excitation Effects 0.000 abstract description 15
- 230000005674 electromagnetic induction Effects 0.000 abstract description 3
- 230000015572 biosynthetic process Effects 0.000 abstract 2
- 238000004804 winding Methods 0.000 abstract 2
- 230000000694 effects Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 1
- 238000010828 elution Methods 0.000 description 1
- 238000004817 gas chromatography Methods 0.000 description 1
- 238000002290 gas chromatography-mass spectrometry Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000002123 temporal effect Effects 0.000 description 1
Landscapes
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
Description
【発明の詳細な説明】
（イ）産業上の利用分野
本発明は、質量分析計に係り、特には、質量分析計の磁
場走査用マグネットに関する。DETAILED DESCRIPTION OF THE INVENTION (A) Field of Industrial Application The present invention relates to a mass spectrometer, and particularly to a magnet for scanning a magnetic field in a mass spectrometer.
（ロ）従来技術とその問題点
一般に、磁場内にイオン等の荷電粒子を通過させると、
ローレンツ力により荷電粒子がその質量に応じた磁場の
影響を受けて軌道が変わる。質量分析計は、この現象を
利用して、第２図に示すように、磁場走査用マグネット
の励磁電流を時間変化させて磁場走査を行なうことによ
り荷電粒子の質量分離を行なうものである。(b) Prior art and its problems In general, when charged particles such as ions are passed through a magnetic field,
Due to the Lorentz force, charged particles change their orbits under the influence of a magnetic field depending on their mass. A mass spectrometer utilizes this phenomenon to perform mass separation of charged particles by scanning a magnetic field by changing the excitation current of a magnetic field scanning magnet over time, as shown in FIG.
ところで、この質量分析計（ＭＳ）は、ガスクロマトグ
ラフ（ＧＣ）と結合させて、ＧＣ／ＭＳとして使用する
ことがある。その場合、ガスクロマトグラフで気相分離
される成分の内には、その溶出時間が短いものがあり、
したがって、質量分析計もこれに追従して短時間の内に
磁場を変化させることが要求される。Incidentally, this mass spectrometer (MS) is sometimes coupled with a gas chromatograph (GC) and used as a GC/MS. In that case, some of the components separated in the gas phase by gas chromatography have a short elution time.
Therefore, the mass spectrometer is also required to follow this and change the magnetic field within a short period of time.
こうした磁場走査の高速性の要求に応えるために、従来
、磁場走査用マグネットのインダクタンスを減らすとと
もに、その電源回路も励磁電流を高速変化できるように
、インダクタンスや容量を設定するなどの対策を講じて
いる。ところが、このように、励磁電流を高速変化でき
るように電源回路を構成すると、ハム、リップルが混入
し易くなる。従来のものでは、これに対して十分に考慮
されておらず、そのため、励磁電流にハム、リップルが
混入して測定中に磁場強度が変動し、結果的に分解能が
低下するという不都合があった。In order to meet these demands for high-speed magnetic field scanning, conventional measures have been taken, such as reducing the inductance of the magnetic field scanning magnet and setting the inductance and capacitance of the power supply circuit so that the excitation current can be changed rapidly. There is. However, if the power supply circuit is configured in such a way that the excitation current can be changed at high speed, hum and ripple are likely to occur. Conventional methods did not take this into consideration sufficiently, and as a result, hum and ripples were mixed into the excitation current, causing the magnetic field strength to fluctuate during measurement, resulting in a reduction in resolution. .
本発明は、このような事情に鑑みてなされたものであっ
て、磁場走査の高速性を備えた質量分析計において、励
磁電流に重畳するハム、リップルの影響を除去し、高分
解能が得られるようにすることを目的とする。The present invention has been made in view of the above circumstances, and is capable of eliminating the effects of hum and ripples superimposed on the excitation current in a mass spectrometer equipped with high-speed magnetic field scanning, and achieving high resolution. The purpose is to do so.
（ハ）問題点を解決するための手段
本発明は、上記の目的を達成するために、次の構成を採
る。すなわち、本発明の質量分析計は、コアに対してハ
ム、リップル等除去用の補助コイルを磁場形成用の主コ
イルと個別に巻き付けるとともに、測定モードに応じて
前記補助コイルを短絡、解放する切り換え回路を設けて
いる。(c) Means for solving the problems In order to achieve the above object, the present invention adopts the following configuration. That is, in the mass spectrometer of the present invention, an auxiliary coil for removing hum, ripples, etc. is wound around the core separately from a main coil for forming a magnetic field, and the auxiliary coil is switched to short-circuit or open depending on the measurement mode. A circuit is installed.
（ニ）作用
通常、磁場走査を低速で行なう場合には、高分解能が要
求される。したがって、この低速走査モードの場合には
、切り換え回路により補助コイルを短絡する。すると、
主コイルに供給される励磁電流に重畳するハム、リップ
ルは周波数がより高いので、電磁誘導によりその電力が
補助コイルで消費され、磁場強度の変動が抑制される。(d) Effect Usually, when performing magnetic field scanning at low speed, high resolution is required. Therefore, in this slow scan mode, the switching circuit short-circuits the auxiliary coil. Then,
Since the hum and ripple superimposed on the excitation current supplied to the main coil have a higher frequency, the power is consumed by the auxiliary coil due to electromagnetic induction, suppressing fluctuations in the magnetic field strength.
その結果、高分解能が維持される。As a result, high resolution is maintained.
一方、磁場走査を高速で行なう場合には、分解能はある
程度低くても良い。したがって、この高速走査モードの
場合には、切り換え回路により補助コイルを解放する。On the other hand, when performing magnetic field scanning at high speed, the resolution may be low to some extent. Therefore, in this fast scan mode, the switching circuit releases the auxiliary coil.
すると、補助コイルは、実質的に動作しなくなるので、
励磁電流の高速走査が可能となる。なお、この場合、励
磁電流にハム、リップル等が重畳していても高分解能は
要求されないので、測定精度に同等問題はない。Then, the auxiliary coil will essentially stop working, so
High-speed scanning of the excitation current becomes possible. In this case, even if hum, ripple, etc. are superimposed on the excitation current, high resolution is not required, so there is no problem with measurement accuracy.
（ポ）実施例
第１図は、本発明の実施例に係る質量分析計の構成図で
ある。同図において、符号ｌは質量分析計の全体を示し
、２は磁場走査用マグネットである。この磁場走査用マ
グネット２は、コア４に磁場形成用の主コイル６が巻き
付けられるとともに、さらに、コア４に対してハム、リ
ップル等除去用の補助コイル８が上記の主コイル６と個
別に巻き付けられて構成されている。(P) Example FIG. 1 is a block diagram of a mass spectrometer according to an example of the present invention. In the figure, reference numeral 1 indicates the entire mass spectrometer, and 2 indicates a magnetic field scanning magnet. In this magnetic field scanning magnet 2, a main coil 6 for forming a magnetic field is wound around a core 4, and an auxiliary coil 8 for removing hum, ripples, etc. is also wound around the core 4 separately from the main coil 6. It is constructed according to the following.
ＩＯは測定モードに応じて補助コイル８を短絡、解放す
る切り換え回路で、この切り換え回路！０の共通接点１
０ａと一方の個別接点１０ｂが補助コイル８に接続され
、他方の個別接点１０ｃは接地されている。IO is a switching circuit that shorts and releases the auxiliary coil 8 depending on the measurement mode.This switching circuit! 0 common contact 1
0a and one individual contact 10b are connected to the auxiliary coil 8, and the other individual contact 10c is grounded.
１２は主コイル６に励磁電流を供給するための電源回路
、１４は電源回路Ｉ２に励磁電流を走査するための制御
信号を出力するスキャンニングコントローラである。12 is a power supply circuit for supplying an exciting current to the main coil 6, and 14 is a scanning controller that outputs a control signal for scanning the exciting current to the power supply circuit I2.
この質量分析計１では、スキャンニングコントローラ１
４から与えられる制御信号によって電源回路１２から出
力される励磁電流が第２図に示すように時間走査され、
これに伴ない、磁場走査用マグネット２により発生され
る磁場も時間走査される。In this mass spectrometer 1, the scanning controller 1
4, the excitation current output from the power supply circuit 12 is time-scanned as shown in FIG.
Along with this, the magnetic field generated by the magnetic field scanning magnet 2 is also time-scanned.
通常、磁場走査を低速で行なう場合には、高分解能が要
求される。したがって、この低速走査モードの場合には
、切り換え回路１０の共通接点１０ａを一方の個別接点
１０ｂに接続して補助コイル８を短絡する。すると、電
源回路Ｉ２から主コイル６に供給される励磁電流に重畳
するハム、リップルは周波数がより高いので、電磁誘導
によって電力か補助コイル８で消費され、磁場強度の変
動が抑制される。その結果、高分解能が維持される。Usually, when performing magnetic field scanning at low speed, high resolution is required. Therefore, in this low-speed scanning mode, the common contact 10a of the switching circuit 10 is connected to one individual contact 10b to short-circuit the auxiliary coil 8. Then, since the hum and ripple superimposed on the excitation current supplied from the power supply circuit I2 to the main coil 6 have a higher frequency, the electric power is consumed by the auxiliary coil 8 due to electromagnetic induction, and fluctuations in the magnetic field strength are suppressed. As a result, high resolution is maintained.
一方、磁場走査を高速で行なう場合には、分解能はある
程度低くても良い。したかって、この高速走査モードの
場合には、切り換え回路１０の共通接点１０ａを他方の
個別接点１０ｃに接続して補助コイル８を解放する。す
ると、補助コイル８は、実質的に動作しなくなるので、
補助コイル８は磁場変化の妨げとはならず、したがって
、励磁電流の高速走査が可能となる。この場合、励磁電
流にハム、リップル等が重畳していても、高分解能は要
求されないので、測定精度に同等問題はない。On the other hand, when performing magnetic field scanning at high speed, the resolution may be low to some extent. Therefore, in this high-speed scanning mode, the common contact 10a of the switching circuit 10 is connected to the other individual contact 10c, and the auxiliary coil 8 is released. Then, the auxiliary coil 8 becomes substantially inoperable.
The auxiliary coil 8 does not interfere with changes in the magnetic field, thus enabling high-speed scanning of the excitation current. In this case, even if hum, ripple, etc. are superimposed on the excitation current, there is no problem with measurement accuracy since high resolution is not required.
（へ）効果
以上のように、本発明の質量分析計は、磁場走査の高速
性を備えつつ、励磁電流に混入するハム、リップルの影
響を除去でき、高分解能が得られるようになる等の優れ
た効果が発揮される。(f) Effects As described above, the mass spectrometer of the present invention has high-speed magnetic field scanning, can eliminate the effects of hum and ripples mixed in the excitation current, and can obtain high resolution. Excellent effects are demonstrated.
第１図は本発明の質量分析計の一実施例を示す構成図、
第２図は励磁電流の時間変化を示す説明図である。
■・・・質量分析計、６・・・主コイル、８・・・補助
コイル、ｌＯ・・・切り換え回路。FIG. 1 is a configuration diagram showing an embodiment of the mass spectrometer of the present invention,
FIG. 2 is an explanatory diagram showing temporal changes in excitation current. ■...Mass spectrometer, 6...Main coil, 8...Auxiliary coil, lO...Switching circuit.
Claims (1)
ルを磁場形成用の主コイルと個別に巻き付けるとともに
、測定モードに応じて前記補助コイルを短絡、解放する
切り換え回路を設けたことを特徴とする質量分析計。(1) An auxiliary coil for removing hum, ripples, etc. is wound around the core separately from the main coil for forming a magnetic field, and a switching circuit is provided to short-circuit or release the auxiliary coil depending on the measurement mode. mass spectrometer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61213222A JPS6369137A (en) | 1986-09-09 | 1986-09-09 | Mass spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61213222A JPS6369137A (en) | 1986-09-09 | 1986-09-09 | Mass spectrometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6369137A true JPS6369137A (en) | 1988-03-29 |
Family
ID=16635556
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61213222A Pending JPS6369137A (en) | 1986-09-09 | 1986-09-09 | Mass spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6369137A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006199527A (en) * | 2005-01-19 | 2006-08-03 | Shin Etsu Chem Co Ltd | Method of manufacturing porous glass preform and burner for deposition |
-
1986
- 1986-09-09 JP JP61213222A patent/JPS6369137A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006199527A (en) * | 2005-01-19 | 2006-08-03 | Shin Etsu Chem Co Ltd | Method of manufacturing porous glass preform and burner for deposition |
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