JPS6361823B2 - - Google Patents

Info

Publication number
JPS6361823B2
JPS6361823B2 JP55051278A JP5127880A JPS6361823B2 JP S6361823 B2 JPS6361823 B2 JP S6361823B2 JP 55051278 A JP55051278 A JP 55051278A JP 5127880 A JP5127880 A JP 5127880A JP S6361823 B2 JPS6361823 B2 JP S6361823B2
Authority
JP
Japan
Prior art keywords
digital
subscriber
signal
circuit
subscriber line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55051278A
Other languages
English (en)
Japanese (ja)
Other versions
JPS56147548A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP5127880A priority Critical patent/JPS56147548A/ja
Publication of JPS56147548A publication Critical patent/JPS56147548A/ja
Publication of JPS6361823B2 publication Critical patent/JPS6361823B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/30—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop
    • H04M3/302—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop using modulation techniques for copper pairs
    • H04M3/303—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for subscriber's lines, for the local loop using modulation techniques for copper pairs and using PCM multiplexers, e.g. pair gain systems

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Time-Division Multiplex Systems (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
JP5127880A 1980-04-17 1980-04-17 Test method for digital subscriber line carrier system Granted JPS56147548A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5127880A JPS56147548A (en) 1980-04-17 1980-04-17 Test method for digital subscriber line carrier system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5127880A JPS56147548A (en) 1980-04-17 1980-04-17 Test method for digital subscriber line carrier system

Publications (2)

Publication Number Publication Date
JPS56147548A JPS56147548A (en) 1981-11-16
JPS6361823B2 true JPS6361823B2 (US20100056889A1-20100304-C00004.png) 1988-11-30

Family

ID=12882468

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5127880A Granted JPS56147548A (en) 1980-04-17 1980-04-17 Test method for digital subscriber line carrier system

Country Status (1)

Country Link
JP (1) JPS56147548A (US20100056889A1-20100304-C00004.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0351903A (ja) * 1989-07-19 1991-03-06 Nec Ibaraki Ltd パワーオンリセット監視回路

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0813065B2 (ja) * 1986-05-02 1996-02-07 日本電気株式会社 Ｉｓｄｎ交換機試験方式

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5474616A (en) * 1977-11-28 1979-06-14 Nippon Telegr & Teleph Corp <Ntt> Tester for digital incoming line
JPS5474615A (en) * 1977-11-28 1979-06-14 Nippon Telegr & Teleph Corp <Ntt> Test system for digital line

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5474616A (en) * 1977-11-28 1979-06-14 Nippon Telegr & Teleph Corp <Ntt> Tester for digital incoming line
JPS5474615A (en) * 1977-11-28 1979-06-14 Nippon Telegr & Teleph Corp <Ntt> Test system for digital line

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0351903A (ja) * 1989-07-19 1991-03-06 Nec Ibaraki Ltd パワーオンリセット監視回路

Also Published As

Publication number Publication date
JPS56147548A (en) 1981-11-16

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