JPS6357729B2 - - Google Patents
Info
- Publication number
- JPS6357729B2 JPS6357729B2 JP12863080A JP12863080A JPS6357729B2 JP S6357729 B2 JPS6357729 B2 JP S6357729B2 JP 12863080 A JP12863080 A JP 12863080A JP 12863080 A JP12863080 A JP 12863080A JP S6357729 B2 JPS6357729 B2 JP S6357729B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- optical
- component
- amplifier
- polarized light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 claims description 36
- 230000000694 effects Effects 0.000 claims description 16
- 230000001360 synchronised effect Effects 0.000 claims description 13
- 230000004907 flux Effects 0.000 claims description 2
- 230000005374 Kerr effect Effects 0.000 description 11
- 238000005259 measurement Methods 0.000 description 9
- 239000000696 magnetic material Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 4
- 238000002983 circular dichroism Methods 0.000 description 4
- 229940125730 polarisation modulator Drugs 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 230000010287 polarization Effects 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 229910004261 CaF 2 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 239000005350 fused silica glass Substances 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000010408 sweeping Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12863080A JPS5753642A (en) | 1980-09-18 | 1980-09-18 | Magnetooptical effect measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12863080A JPS5753642A (en) | 1980-09-18 | 1980-09-18 | Magnetooptical effect measuring device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5753642A JPS5753642A (en) | 1982-03-30 |
JPS6357729B2 true JPS6357729B2 (en, 2012) | 1988-11-14 |
Family
ID=14989552
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12863080A Granted JPS5753642A (en) | 1980-09-18 | 1980-09-18 | Magnetooptical effect measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5753642A (en, 2012) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997018470A1 (en) * | 1995-11-16 | 1997-05-22 | Matsushita Electric Industrial Co., Ltd. | Method and apparatus for urinalysis, method of measuring optical rotation and polarimeter |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62267625A (ja) * | 1986-05-15 | 1987-11-20 | Japan Spectroscopic Co | エリプソメ−タ |
JPS63153450A (ja) * | 1986-12-18 | 1988-06-25 | Japan Spectroscopic Co | エリプソメ−タ |
JP2529562B2 (ja) * | 1986-12-29 | 1996-08-28 | 日本分光工業株式会社 | エリプソメ−タ |
JP3778669B2 (ja) * | 1997-09-29 | 2006-05-24 | トヨタ自動車株式会社 | 光−磁気光学効果測定装置 |
JP4559650B2 (ja) | 2001-03-22 | 2010-10-13 | シチズンホールディングス株式会社 | 旋光度測定装置及び旋光度測定方法 |
JP2007046943A (ja) * | 2005-08-08 | 2007-02-22 | Tokyo Univ Of Agriculture & Technology | 観測装置、観測方法、ファラデー回転角測定方法、ファラデー楕円率測定方法、カー回転角測定方法及びカー楕円率測定方法 |
JP5297299B2 (ja) * | 2009-08-18 | 2013-09-25 | 日本放送協会 | 磁気光学特性測定装置及び磁気光学特性の測定方法 |
JP5469590B2 (ja) * | 2010-12-08 | 2014-04-16 | 日本放送協会 | 磁気光学スペクトル分光装置、磁気光学スペクトル測定方法およびプログラム |
-
1980
- 1980-09-18 JP JP12863080A patent/JPS5753642A/ja active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1997018470A1 (en) * | 1995-11-16 | 1997-05-22 | Matsushita Electric Industrial Co., Ltd. | Method and apparatus for urinalysis, method of measuring optical rotation and polarimeter |
Also Published As
Publication number | Publication date |
---|---|
JPS5753642A (en) | 1982-03-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Sato | Measurement of magneto-optical Kerr effect using piezo-birefringent modulator | |
US5548404A (en) | Multiple wavelength polarization-modulated ellipsometer with phase-generated carrier | |
US4933629A (en) | Method and apparatus for optically measuring electric and magnetic quantities having an optical sensing head exhibiting the Pockel's and Faraday effects | |
JPH10325840A (ja) | 偏光を利用した走査型近視野顕微鏡 | |
US3594085A (en) | Ellipsometric method and device | |
EP1219938B1 (en) | Light wavelength measuring apparatus and method using a two-beam interferometer | |
US5319194A (en) | Apparatus for measuring birefringence without employing rotating mechanism | |
US4289403A (en) | Optical phase modulation instruments | |
JPS6357729B2 (en, 2012) | ||
WO2002103310A1 (en) | Birefringence measurement at deep-ultraviolet wavelengths | |
SK93395A3 (en) | Method and dichrograph for measurment of spectropolarimetric characteristics of optically active matters | |
CN201149541Y (zh) | 一种光学相位延迟精密测量系统 | |
JP2780988B2 (ja) | スペクトロポーラリメータ | |
JP2713190B2 (ja) | 光学特性測定装置 | |
JP2004279380A (ja) | 旋光度測定装置 | |
JPH0545278A (ja) | 複屈折測定装置 | |
Mackey et al. | Optical material stress measurement usingtwo orthogonally polarized sinusoidally intensity-modulatedsemiconductor lasers | |
JPH03246448A (ja) | 磁場掃引エリプソメータ | |
JP2004184225A (ja) | 複屈折測定装置および複屈折試料の軸方位検出方法、複屈折測定装置のキャリブレーション方法。 | |
Li | Stepped polarization states: representation and its applications to optical sensing and measurement | |
Allen et al. | A 10.6 micron modulated light ellipsometer | |
Azzam | Ellipsometric configurations and techniques | |
JPS5899761A (ja) | 光による電界,磁界測定器 | |
JPS6027824A (ja) | 結晶の旋光能及び若しくは複屈折を求める方法並びにその方法の実施に使用する光学装置 | |
JPS6342212B2 (en, 2012) |