JPS6352697B2 - - Google Patents

Info

Publication number
JPS6352697B2
JPS6352697B2 JP56060601A JP6060181A JPS6352697B2 JP S6352697 B2 JPS6352697 B2 JP S6352697B2 JP 56060601 A JP56060601 A JP 56060601A JP 6060181 A JP6060181 A JP 6060181A JP S6352697 B2 JPS6352697 B2 JP S6352697B2
Authority
JP
Japan
Prior art keywords
radiation
cylindrical measuring
measuring section
rotating disk
void
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56060601A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57175247A (en
Inventor
Sunao Narabayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP56060601A priority Critical patent/JPS57175247A/ja
Publication of JPS57175247A publication Critical patent/JPS57175247A/ja
Publication of JPS6352697B2 publication Critical patent/JPS6352697B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/12Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a flowing fluid or a flowing granular solid
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP56060601A 1981-04-23 1981-04-23 Radiation void factor meter Granted JPS57175247A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56060601A JPS57175247A (en) 1981-04-23 1981-04-23 Radiation void factor meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56060601A JPS57175247A (en) 1981-04-23 1981-04-23 Radiation void factor meter

Publications (2)

Publication Number Publication Date
JPS57175247A JPS57175247A (en) 1982-10-28
JPS6352697B2 true JPS6352697B2 (enrdf_load_stackoverflow) 1988-10-19

Family

ID=13146922

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56060601A Granted JPS57175247A (en) 1981-04-23 1981-04-23 Radiation void factor meter

Country Status (1)

Country Link
JP (1) JPS57175247A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01311989A (ja) * 1988-04-20 1989-12-15 Outboard Marine Corp 船外モータの傾動固定装置

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8275091B2 (en) 2002-07-23 2012-09-25 Rapiscan Systems, Inc. Compact mobile cargo scanning system
GB0309383D0 (en) 2003-04-25 2003-06-04 Cxr Ltd X-ray tube electron sources
US7949101B2 (en) 2005-12-16 2011-05-24 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
US8837669B2 (en) 2003-04-25 2014-09-16 Rapiscan Systems, Inc. X-ray scanning system
US10483077B2 (en) 2003-04-25 2019-11-19 Rapiscan Systems, Inc. X-ray sources having reduced electron scattering
US8451974B2 (en) 2003-04-25 2013-05-28 Rapiscan Systems, Inc. X-ray tomographic inspection system for the identification of specific target items
GB0525593D0 (en) 2005-12-16 2006-01-25 Cxr Ltd X-ray tomography inspection systems
US8243876B2 (en) 2003-04-25 2012-08-14 Rapiscan Systems, Inc. X-ray scanners
GB0309379D0 (en) 2003-04-25 2003-06-04 Cxr Ltd X-ray scanning
US8804899B2 (en) 2003-04-25 2014-08-12 Rapiscan Systems, Inc. Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners
GB0812864D0 (en) 2008-07-15 2008-08-20 Cxr Ltd Coolign anode
US9208988B2 (en) 2005-10-25 2015-12-08 Rapiscan Systems, Inc. Graphite backscattered electron shield for use in an X-ray tube
US8094784B2 (en) 2003-04-25 2012-01-10 Rapiscan Systems, Inc. X-ray sources
US8223919B2 (en) 2003-04-25 2012-07-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items
US9046465B2 (en) 2011-02-24 2015-06-02 Rapiscan Systems, Inc. Optimization of the source firing pattern for X-ray scanning systems
GB0803644D0 (en) 2008-02-28 2008-04-02 Rapiscan Security Products Inc Scanning systems
GB0809110D0 (en) 2008-05-20 2008-06-25 Rapiscan Security Products Inc Gantry scanner systems
GB0816823D0 (en) 2008-09-13 2008-10-22 Cxr Ltd X-ray tubes
GB0901338D0 (en) 2009-01-28 2009-03-11 Cxr Ltd X-Ray tube electron sources
CN105379425B (zh) 2013-01-31 2018-03-27 瑞皮斯坎系统股份有限公司 便携式安全检查系统
US12181422B2 (en) 2019-09-16 2024-12-31 Rapiscan Holdings, Inc. Probabilistic image analysis

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3350564A (en) * 1964-12-23 1967-10-31 Charles F Bonilla Void detection utilizing neutron attenuation
US3808444A (en) * 1973-01-05 1974-04-30 Westinghouse Electric Corp X-ray contrast detection system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01311989A (ja) * 1988-04-20 1989-12-15 Outboard Marine Corp 船外モータの傾動固定装置

Also Published As

Publication number Publication date
JPS57175247A (en) 1982-10-28

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