JPH0245145B2 - - Google Patents

Info

Publication number
JPH0245145B2
JPH0245145B2 JP57203310A JP20331082A JPH0245145B2 JP H0245145 B2 JPH0245145 B2 JP H0245145B2 JP 57203310 A JP57203310 A JP 57203310A JP 20331082 A JP20331082 A JP 20331082A JP H0245145 B2 JPH0245145 B2 JP H0245145B2
Authority
JP
Japan
Prior art keywords
ccd image
image element
measuring section
rays
section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP57203310A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5992335A (ja
Inventor
Sunao Narabayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP57203310A priority Critical patent/JPS5992335A/ja
Publication of JPS5992335A publication Critical patent/JPS5992335A/ja
Publication of JPH0245145B2 publication Critical patent/JPH0245145B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP57203310A 1982-11-19 1982-11-19 ポイド率計 Granted JPS5992335A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57203310A JPS5992335A (ja) 1982-11-19 1982-11-19 ポイド率計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57203310A JPS5992335A (ja) 1982-11-19 1982-11-19 ポイド率計

Publications (2)

Publication Number Publication Date
JPS5992335A JPS5992335A (ja) 1984-05-28
JPH0245145B2 true JPH0245145B2 (enrdf_load_stackoverflow) 1990-10-08

Family

ID=16471908

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57203310A Granted JPS5992335A (ja) 1982-11-19 1982-11-19 ポイド率計

Country Status (1)

Country Link
JP (1) JPS5992335A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0453453U (enrdf_load_stackoverflow) * 1990-09-14 1992-05-07

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54118068U (enrdf_load_stackoverflow) * 1978-02-07 1979-08-18
CA1116314A (en) * 1978-08-22 1982-01-12 Westinghouse Canada Limited Mono-energetic neutron void meter
JPS56123700A (en) * 1980-03-05 1981-09-28 Toshiba Corp X-ray image pick-up apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0453453U (enrdf_load_stackoverflow) * 1990-09-14 1992-05-07

Also Published As

Publication number Publication date
JPS5992335A (ja) 1984-05-28

Similar Documents

Publication Publication Date Title
CN102768219B (zh) 组合式射线无损检测方法及系统
US4384209A (en) Method of and device for determining the contour of a body by means of radiation scattered by the body
US4868856A (en) Multi-component flow measurement and imaging
JPS6352697B2 (enrdf_load_stackoverflow)
US7492871B2 (en) Focus/detector system of an x-ray apparatus for generating phase contrast recordings
RU2145485C1 (ru) Ультрамалоугловая рентгеновская томография
US4031395A (en) Radiography
Chan et al. Design aspects of gamma densitometers for void fraction measurements in small scale two-phase flows
WO2014015490A1 (zh) 组合式射线无损检测方法及系统
JPS61204582A (ja) 放射能分布測定方法及び装置
US5003980A (en) Method and apparatus for measuring lung density by Compton backscattering
US4066902A (en) Radiography with detector compensating means
Lim et al. Triangular SPECT system for 3-D total organ volume imaging: design concept and preliminary imaging results
US4437006A (en) Method and apparatus for measuring radiation in computer-assisted tomography and radiographic applications
JPS6015546A (ja) 局所ボイド率分布の測定方法
JPS6021440A (ja) 局所ボイド率分布の測定方法
JPH0245145B2 (enrdf_load_stackoverflow)
JPH09230051A (ja) 放射性廃棄物固化体の放射能量測定方法
JPH1062365A (ja) 中性子散乱材料検査装置
US4562584A (en) Apparatus for measuring void ratios by using radiation
US4573181A (en) X-Ray fluorescence analyzers
JPH06288939A (ja) 原子炉冷却水のボロン濃度測定方法および装置
US3154684A (en) X-ray analysis system with means to detect only the coherently scattered X-rays
JPH0759762A (ja) Ｘ線ｃｔ装置
US4411011A (en) Radiography