JPS6351260B2 - - Google Patents
Info
- Publication number
- JPS6351260B2 JPS6351260B2 JP12028879A JP12028879A JPS6351260B2 JP S6351260 B2 JPS6351260 B2 JP S6351260B2 JP 12028879 A JP12028879 A JP 12028879A JP 12028879 A JP12028879 A JP 12028879A JP S6351260 B2 JPS6351260 B2 JP S6351260B2
- Authority
- JP
- Japan
- Prior art keywords
- optical waveguide
- substrate
- angle
- prism coupler
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12028879A JPS5643529A (en) | 1979-09-18 | 1979-09-18 | Measuring method of minute refractive index difference between optical waveguide line and its substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12028879A JPS5643529A (en) | 1979-09-18 | 1979-09-18 | Measuring method of minute refractive index difference between optical waveguide line and its substrate |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5643529A JPS5643529A (en) | 1981-04-22 |
| JPS6351260B2 true JPS6351260B2 (OSRAM) | 1988-10-13 |
Family
ID=14782523
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12028879A Granted JPS5643529A (en) | 1979-09-18 | 1979-09-18 | Measuring method of minute refractive index difference between optical waveguide line and its substrate |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5643529A (OSRAM) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0220149U (OSRAM) * | 1988-07-26 | 1990-02-09 | ||
| JPH0666724A (ja) * | 1992-07-16 | 1994-03-11 | Gaztech Internatl Corp | 拡散型気体サンプル室の改善 |
| WO2012036075A1 (ja) * | 2010-09-16 | 2012-03-22 | シャープ株式会社 | 屈折率測定装置、及び屈折率測定方法 |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0820336B2 (ja) * | 1987-06-29 | 1996-03-04 | 株式会社日立製作所 | 屈折率分布測定方法及びその測定装置 |
| US4828358A (en) * | 1988-03-03 | 1989-05-09 | American Telephone And Telegraph Company, At&T Bell Laboratories | Testing in the manufacture, operation, and maintenance of optical device assemblies |
| CN110082313B (zh) * | 2019-04-22 | 2021-08-20 | 天津大学 | 一种基于棱镜耦合仪的微纳材料折射率测量方法 |
-
1979
- 1979-09-18 JP JP12028879A patent/JPS5643529A/ja active Granted
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0220149U (OSRAM) * | 1988-07-26 | 1990-02-09 | ||
| JPH0666724A (ja) * | 1992-07-16 | 1994-03-11 | Gaztech Internatl Corp | 拡散型気体サンプル室の改善 |
| WO2012036075A1 (ja) * | 2010-09-16 | 2012-03-22 | シャープ株式会社 | 屈折率測定装置、及び屈折率測定方法 |
| CN103119420A (zh) * | 2010-09-16 | 2013-05-22 | 夏普株式会社 | 折射率测定装置和折射率测定方法 |
| US8947650B2 (en) | 2010-09-16 | 2015-02-03 | Sharp Kabushiki Kaisha | Refractive index measuring device and refractive index measuring method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5643529A (en) | 1981-04-22 |
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