JPS6347286U - - Google Patents
Info
- Publication number
- JPS6347286U JPS6347286U JP14047886U JP14047886U JPS6347286U JP S6347286 U JPS6347286 U JP S6347286U JP 14047886 U JP14047886 U JP 14047886U JP 14047886 U JP14047886 U JP 14047886U JP S6347286 U JPS6347286 U JP S6347286U
- Authority
- JP
- Japan
- Prior art keywords
- current
- disc
- center
- measuring plate
- deriving
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010884 ion-beam technique Methods 0.000 claims description 3
- 238000005259 measurement Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000005468 ion implantation Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14047886U JPS6347286U (enExample) | 1986-09-12 | 1986-09-12 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14047886U JPS6347286U (enExample) | 1986-09-12 | 1986-09-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6347286U true JPS6347286U (enExample) | 1988-03-30 |
Family
ID=31047362
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14047886U Pending JPS6347286U (enExample) | 1986-09-12 | 1986-09-12 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6347286U (enExample) |
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1986
- 1986-09-12 JP JP14047886U patent/JPS6347286U/ja active Pending