JPS6346719A - Manufacture of thin-film - Google Patents
Manufacture of thin-filmInfo
- Publication number
- JPS6346719A JPS6346719A JP61190894A JP19089486A JPS6346719A JP S6346719 A JPS6346719 A JP S6346719A JP 61190894 A JP61190894 A JP 61190894A JP 19089486 A JP19089486 A JP 19089486A JP S6346719 A JPS6346719 A JP S6346719A
- Authority
- JP
- Japan
- Prior art keywords
- raw material
- mercury
- material gas
- film
- thin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000010409 thin film Substances 0.000 title claims abstract description 28
- 238000004519 manufacturing process Methods 0.000 title claims description 8
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 claims abstract description 21
- 229910052753 mercury Inorganic materials 0.000 claims abstract description 18
- 239000002994 raw material Substances 0.000 claims abstract description 17
- 239000000758 substrate Substances 0.000 claims abstract description 13
- 230000001678 irradiating effect Effects 0.000 claims abstract description 3
- 238000005229 chemical vapour deposition Methods 0.000 claims description 9
- 238000006243 chemical reaction Methods 0.000 abstract description 17
- 238000006552 photochemical reaction Methods 0.000 abstract description 7
- 239000010408 film Substances 0.000 abstract description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 3
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 abstract description 2
- 150000001805 chlorine compounds Chemical class 0.000 abstract description 2
- 230000007547 defect Effects 0.000 abstract description 2
- 150000002222 fluorine compounds Chemical class 0.000 abstract description 2
- QUZPNFFHZPRKJD-UHFFFAOYSA-N germane Chemical compound [GeH4] QUZPNFFHZPRKJD-UHFFFAOYSA-N 0.000 abstract description 2
- 229910052986 germanium hydride Inorganic materials 0.000 abstract description 2
- 150000004756 silanes Chemical class 0.000 abstract description 2
- 229910052710 silicon Inorganic materials 0.000 abstract description 2
- 239000000126 substance Substances 0.000 abstract description 2
- VGRFVJMYCCLWPQ-UHFFFAOYSA-N germanium Chemical compound [Ge].[Ge] VGRFVJMYCCLWPQ-UHFFFAOYSA-N 0.000 abstract 1
- 238000010438 heat treatment Methods 0.000 abstract 1
- 238000007493 shaping process Methods 0.000 abstract 1
- 239000007789 gas Substances 0.000 description 16
- 238000000034 method Methods 0.000 description 14
- 229910003828 SiH3 Inorganic materials 0.000 description 5
- 238000010517 secondary reaction Methods 0.000 description 5
- OLRJXMHANKMLTD-UHFFFAOYSA-N silyl Chemical compound [SiH3] OLRJXMHANKMLTD-UHFFFAOYSA-N 0.000 description 5
- 230000005284 excitation Effects 0.000 description 3
- 206010070834 Sensitisation Diseases 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 150000002431 hydrogen Chemical class 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 230000008313 sensitization Effects 0.000 description 2
- YZCKVEUIGOORGS-OUBTZVSYSA-N Deuterium Chemical compound [2H] YZCKVEUIGOORGS-OUBTZVSYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- XMIJDTGORVPYLW-UHFFFAOYSA-N [SiH2] Chemical compound [SiH2] XMIJDTGORVPYLW-UHFFFAOYSA-N 0.000 description 1
- 229910017817 a-Ge Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 229910052805 deuterium Inorganic materials 0.000 description 1
- 238000010790 dilution Methods 0.000 description 1
- 239000012895 dilution Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000001443 photoexcitation Effects 0.000 description 1
- 108091008695 photoreceptors Proteins 0.000 description 1
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
Classifications
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Photoreceptors In Electrophotography (AREA)
- Chemical Vapour Deposition (AREA)
- Photovoltaic Devices (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、水銀増感した光CVD法により薄膜デバイス
に用いるシリコン等の薄膜を基板上に製造する薄膜の製
造方法に関する。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a thin film manufacturing method for manufacturing a thin film of silicon or the like used in a thin film device on a substrate by a mercury-sensitized photo-CVD method.
非晶質シリコン(以下a−8iと略記する)、非晶質ダ
ルマニウム(以下a−Geと略記する)等の半導体は薄
膜として太陽電池、電子写真感光体、光センサ−、薄膜
トランジスタ等の薄膜デバイ頁に広く利用されている。Semiconductors such as amorphous silicon (hereinafter abbreviated as a-8i) and amorphous dalmanium (hereinafter abbreviated as a-Ge) are used as thin films for solar cells, electrophotographic photoreceptors, optical sensors, thin film transistors, etc. Widely used for Debye pages.
これらの薄膜の製造方法としてはイオンシレーティング
法、ス、oツタリング法、真空蒸着法、CV D (C
bemical Vaper Deposition
)法等がよく知られている。CVD法には、原料ガス
のグロー放電により生成させたプラズマから薄膜を基板
上に堆積させるプラズマCVD法原料ガスに紫外線等の
光を照射して光励起反応により、原料ガスから薄膜を基
板上に形成する光CVD法などがある。Methods for producing these thin films include ion silating method, sintering method, vacuum evaporation method, and CVD (C
chemical vapor deposition
) law etc. are well known. The plasma CVD method involves depositing a thin film on a substrate from plasma generated by glow discharge of a raw material gas.The CVD method involves irradiating the raw material gas with light such as ultraviolet rays to form a thin film on the substrate from the raw material gas through a photoexcitation reaction. There is a photo-CVD method that does this.
光CVD法には直接励起法と水銀増感励起法とがあるが
、共にプラズマの存在しないシステムであるから、高エ
ネルギーイオンによる薄膜の損傷やコンタミネーション
等がなく、高品質の薄膜の形成が期待できる。特に、水
銀増感励起法は原料ガスに微量の水銀蒸気をドープし、
水銀を光照射によシ励起して原料ガスと反応させるので
、励起した水銀の触媒作用により原料ガスの効率のよい
分解が可能である。Photo-CVD methods include direct excitation method and mercury sensitized excitation method, but since both are plasma-free systems, there is no damage or contamination of thin films due to high-energy ions, and it is possible to form high-quality thin films. You can expect it. In particular, in the mercury-sensitized excitation method, the raw material gas is doped with a trace amount of mercury vapor.
Since mercury is excited by light irradiation and reacts with the raw material gas, efficient decomposition of the raw material gas is possible due to the catalytic action of the excited mercury.
しかし、従来の水銀増感による光CVD法において用い
ていた照射光は、商用周波数電圧による紫外線ランプの
光であり、いわゆる交流放電光であった。従って、その
光は第3図に示すように商用周波数に同期して100H
z又は120Hzで周期的にONとOFFを繰り返し、
光強度が周期的に変化した。そのため、原料ガスの光化
学反応が不均一となシ、得られる薄膜の膜質が悪く、こ
れを利用した薄膜デ・Zイスの特性も満足できるもので
はなかった。However, the irradiation light used in the conventional photo-CVD method using mercury sensitization was light from an ultraviolet lamp using a commercial frequency voltage, and was so-called AC discharge light. Therefore, as shown in Figure 3, the light is 100H synchronized with the commercial frequency.
Repeat ON and OFF periodically at z or 120Hz,
The light intensity changed periodically. As a result, the photochemical reaction of the raw material gas is non-uniform, the quality of the obtained thin film is poor, and the characteristics of the thin film Z-chair using this are also unsatisfactory.
本発明は、水銀増感した光CVD法における原料ガスの
光化学反応を均一化し、膜質の良い薄膜を形成すること
のできる薄膜の製造方法を提供することを目的とする。An object of the present invention is to provide a method for producing a thin film that can uniformize the photochemical reaction of a raw material gas in a mercury-sensitized photoCVD method and form a thin film with good film quality.
本発明の水銀増感した光CVD法による薄膜の製造方法
は、光強度が実質的に一定な連続光を水銀を含む原料ガ
スに照射することを特徴とするものである。The method of producing a mercury-sensitized thin film by photoCVD according to the present invention is characterized in that a raw material gas containing mercury is irradiated with continuous light having a substantially constant light intensity.
本発明で用いる連続光としては光強度が実質的に一定で
あればよく、直流放電を用いた重水素ランプや低圧水銀
ランプ等の紫外線ランプの光のほか、高周波放電を用い
た紫外線ランプの光もONとOFFの繰返し周波数が高
いため光強度が実質的に一定な連続光となるので有効で
あ如、その他レーザー光も使用できる。The continuous light used in the present invention only needs to have a substantially constant light intensity, and includes light from ultraviolet lamps such as deuterium lamps and low-pressure mercury lamps using direct current discharge, as well as light from ultraviolet lamps using high-frequency discharge. Since the repetition frequency of ON and OFF is high, the light intensity becomes continuous light that is substantially constant, so other laser lights can also be used if they are effective.
本発明の薄膜の製造方法を製造装置の一具体例を示しだ
第1図によシ説明する。The thin film manufacturing method of the present invention will be explained with reference to FIG. 1, which shows a specific example of a manufacturing apparatus.
反応室1の土壁に石英ガラス窓2を設け、その上方に直
流放電又は高周波放電を用いた低圧水銀ランプ等の連続
光を発生する光源6を配置しである。反応室1内の加熱
ヒータ4上に基板3を水平に配置し、加熱ヒータ4で基
板3を加熱しながら、供給ノズル6及び排気ロア全通し
て製造しようとする薄膜に応じてS i 84等のシラ
ン類またはQei(4。A quartz glass window 2 is provided on the earthen wall of the reaction chamber 1, and a light source 6 that generates continuous light, such as a low-pressure mercury lamp using direct current discharge or high-frequency discharge, is arranged above the window. The substrate 3 is placed horizontally on the heater 4 in the reaction chamber 1, and while the substrate 3 is heated by the heater 4, the supply nozzle 6 and the exhaust lower are passed through the entire supply nozzle 6 and the exhaust lower to produce a thin film such as S i 84. silanes or Qei (4.
Qe2H6等、若しくはこれらのフッ化物や塩化物のよ
うな薄膜物質源の原料ガス(所望によりB2H6+PH
3等のドーピングガスを含む)に水銀蒸気を混合したガ
スを反応室1内に供給する。光源6からの連続光により
、水銀が連続的に励起されて原料ガスと光化学反応を生
じ、基板1上にSlやGe等の薄膜が形成される。Raw material gas for thin film material such as Qe2H6, etc., or their fluorides and chlorides (B2H6+PH if desired)
A mixture of mercury vapor and a doping gas (containing a doping gas such as No. 3) is supplied into the reaction chamber 1. Continuous light from the light source 6 continuously excites mercury and causes a photochemical reaction with the source gas, forming a thin film of Sl, Ge, or the like on the substrate 1.
水銀増感での光CV D法による光化学反応は一次反応
と二次反応があると考えられ、例えば原料ガスとしてS
iH4を例に取れば、−次反応は次の反応式によるもの
と考えられている:
1−1g+hν →Hg*
Hg* + 5i)(4→ SiH3*+ H
* + Hg”Hg* + H2→ 2H*
+Hg*SiH4+ H* →SiH3*+ H3(
式中、Hg*、 I−1” 、 S iH3*は夫々水
銀、水素、シランのラジカルを表す)
この−次反応で生ずるSiH3”は反応性が低く、長寿
命であり、良質な薄膜を形成するものと考えられている
。The photochemical reaction by the photoCVD method in mercury sensitization is thought to include a primary reaction and a secondary reaction. For example, S
Taking iH4 as an example, the -order reaction is thought to be based on the following reaction formula: 1-1g+hν →Hg* Hg* + 5i) (4→ SiH3*+ H
* + Hg"Hg* + H2→ 2H*
+Hg*SiH4+ H* →SiH3*+ H3(
In the formula, Hg*, I-1", and SiH3* represent mercury, hydrogen, and silane radicals, respectively.) SiH3" produced in this -order reaction has low reactivity, long life, and forms a high-quality thin film. It is considered to be.
一方、二次反応の過程はまだ明らかにされていないが、
SiH*やSiH2*等の反応性が高く寿命の短いラジ
カルを生成し、これらのラジカルが膜質を悪化させてい
るものと考えられる。On the other hand, although the process of the secondary reaction has not yet been clarified,
It is thought that highly reactive and short-lived radicals such as SiH* and SiH2* are generated, and these radicals deteriorate the film quality.
第3図に示す商用周波数の交流放電を用いた低圧水銀ラ
ンプ等の非連続光のもとでは、光の照射されているとき
(a)は−次反応と二次反応が連続して起こるが、光の
照射されないとき(b)には二次反応のみが起こシ、所
望のSiH3*が生成しないため膜質が悪化するものと
推測される。Under discontinuous light such as a low-pressure mercury lamp using AC discharge at a commercial frequency as shown in Figure 3, when the light is irradiated, the -order reaction and the second-order reaction occur continuously in (a). It is presumed that when no light is irradiated (b), only secondary reactions occur and the desired SiH3* is not produced, resulting in poor film quality.
本発明では、第2図に示すように、光強度がほぼ一定な
連続光を使用するので、常に一次反応が起こっている状
態を保つことができ、二次反応のみが起こることがない
ため、良好な膜質を得ることができる。In the present invention, as shown in FIG. 2, since continuous light with almost constant light intensity is used, it is possible to maintain a state where the primary reaction is always occurring, and because only the secondary reaction does not occur, Good film quality can be obtained.
また、通常の水銀増感光CVD法よりも反応室の圧力を
低くし及び/又はガス流量を高めることにより、上記し
た二次反応での不所望な生成物質を素早く排出できるの
で一層好ましい。Further, by lowering the pressure in the reaction chamber and/or increasing the gas flow rate than in the usual mercury-sensitized photoCVD method, undesired substances produced in the above-mentioned secondary reaction can be quickly discharged, which is more preferable.
光源として高周波低圧水銀ランプを備えた第1図の装置
を用いて、ガラス基板上の透明電極上にpin構造の光
導電層を水銀増感光CVD法により形成し、その上にア
ルミニウム電極を形成して、太陽電池を構成した。尚、
使用した高周波電圧は10V、電力は35Wで周波数は
2kHzでちった。Using the apparatus shown in FIG. 1 equipped with a high-frequency, low-pressure mercury lamp as a light source, a photoconductive layer with a pin structure was formed on a transparent electrode on a glass substrate by mercury-sensitized photochemical CVD, and an aluminum electrode was formed on top of the photoconductive layer. A solar cell was constructed. still,
The high frequency voltage used was 10V, the power was 35W, and the frequency was 2kHz.
光導電層のp層、i層及びn層の形成に使用した原料ガ
ス、流量及び成膜時間は下記第1表の通シであり、その
他の条件は圧力5 Torr、基板温度180t:及び
水銀温度60Cであった。The raw material gases, flow rates, and film-forming times used to form the p-layer, i-layer, and n-layer of the photoconductive layer are as shown in Table 1 below, and the other conditions are a pressure of 5 Torr, a substrate temperature of 180 tons, and mercury. The temperature was 60C.
第1表
(注) GeH4、B2H6、PH3は水素希釈ガスを
使用した。Table 1 (Note) Hydrogen dilution gas was used for GeH4, B2H6, and PH3.
上記のごとく製造した太陽電池の特性を従来の非連続光
による水銀増感光CVD法を用いて製造した同一構造の
太陽電池のそれと比較すると、AMl、5及び100
mW/cm2の太陽光下において下記第2表の通シであ
った。Comparing the characteristics of the solar cells manufactured as described above with those of solar cells of the same structure manufactured using the conventional mercury-sensitized photoCVD method using discontinuous light, AMl, 5 and 100
Under sunlight of mW/cm2, the results were as shown in Table 2 below.
第2表
特 性 本発明 従 来
短絡電流(m!VCrn”) 19 1
5開放電圧(V) 0.62 0.6
1曲性因子(%) 60 54変換
効率(チ) 7.1 4.9〔発明の
効果〕
本発明によれば、水銀増感した光CVD法において連続
光を使用することにより、原料ガスの光化学反応が均一
化され、得られた薄膜の内部欠陥が減少するなど膜質を
向上させることができる。Table 2 Characteristics Present invention Conventional Short circuit current (m!VCrn”) 19 1
5 Open circuit voltage (V) 0.62 0.6
1 Flexibility factor (%) 60 54 Conversion efficiency (ch) 7.1 4.9 [Effects of the invention] According to the present invention, by using continuous light in the mercury-sensitized photoCVD method, the The photochemical reaction is made more uniform, and the film quality can be improved by reducing internal defects in the obtained thin film.
第1図は本発明の方法を実施するための装置の一具体例
を示す概略断面図であり、第2図は直流放電を用いた紫
外線ランプの連続光の光強度を示すグラフであシ、第3
図は商用周波数電流による交流放電を用いた紫外線ラン
プの非連続光の光強度を示すグラフである。
■・・・反応室、2・・・石英ガラス窓、3・・・基板
、4・・・加熱ヒータ、5・・・光源、6・・・供給ノ
、l’ /l/、7・・・排気口。
第1図
第2図
哨間FIG. 1 is a schematic sectional view showing a specific example of an apparatus for carrying out the method of the present invention, and FIG. 2 is a graph showing the light intensity of continuous light from an ultraviolet lamp using direct current discharge. Third
The figure is a graph showing the light intensity of discontinuous light from an ultraviolet lamp using AC discharge using a commercial frequency current. ■... Reaction chamber, 2... Quartz glass window, 3... Substrate, 4... Heater, 5... Light source, 6... Supply, l'/l/, 7... ·exhaust port. Figure 1 Figure 2 Illustration room
Claims (2)
造する方法において、光強度が実質的に一定な連続光を
水銀を含む原料ガスに照射することを特徴とする薄膜の
製造方法。(1) A method for producing a thin film on a substrate by a mercury-sensitized photo-CVD method, which comprises irradiating a raw material gas containing mercury with continuous light having a substantially constant light intensity.
外線ランプの光であることを特徴とする特許請求の範囲
(1)項記載の薄膜の製造方法。(2) The method for producing a thin film according to claim (1), wherein the continuous light is light from an ultraviolet lamp using direct current discharge or high frequency discharge.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61190894A JPS6346719A (en) | 1986-08-13 | 1986-08-13 | Manufacture of thin-film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61190894A JPS6346719A (en) | 1986-08-13 | 1986-08-13 | Manufacture of thin-film |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6346719A true JPS6346719A (en) | 1988-02-27 |
Family
ID=16265500
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61190894A Pending JPS6346719A (en) | 1986-08-13 | 1986-08-13 | Manufacture of thin-film |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6346719A (en) |
-
1986
- 1986-08-13 JP JP61190894A patent/JPS6346719A/en active Pending
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