JPS6342814B2 - - Google Patents
Info
- Publication number
- JPS6342814B2 JPS6342814B2 JP55072909A JP7290980A JPS6342814B2 JP S6342814 B2 JPS6342814 B2 JP S6342814B2 JP 55072909 A JP55072909 A JP 55072909A JP 7290980 A JP7290980 A JP 7290980A JP S6342814 B2 JPS6342814 B2 JP S6342814B2
- Authority
- JP
- Japan
- Prior art keywords
- ion
- curvature
- optical system
- radius
- optical axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 claims description 38
- 230000005684 electric field Effects 0.000 claims description 18
- 238000004458 analytical method Methods 0.000 claims description 11
- 150000002500 ions Chemical class 0.000 description 47
- 230000004075 alteration Effects 0.000 description 15
- 230000004907 flux Effects 0.000 description 9
- 239000006185 dispersion Substances 0.000 description 6
- 230000008859 change Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000010884 ion-beam technique Methods 0.000 description 4
- 238000004949 mass spectrometry Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 230000004913 activation Effects 0.000 description 2
- 230000009977 dual effect Effects 0.000 description 1
- 230000010220 ion permeability Effects 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/32—Static spectrometers using double focusing
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7290980A JPS5719950A (en) | 1980-05-31 | 1980-05-31 | Double focus type mass spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7290980A JPS5719950A (en) | 1980-05-31 | 1980-05-31 | Double focus type mass spectrometer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5719950A JPS5719950A (en) | 1982-02-02 |
JPS6342814B2 true JPS6342814B2 (enrdf_load_stackoverflow) | 1988-08-25 |
Family
ID=13502939
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7290980A Granted JPS5719950A (en) | 1980-05-31 | 1980-05-31 | Double focus type mass spectrometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5719950A (enrdf_load_stackoverflow) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58209855A (ja) * | 1982-05-31 | 1983-12-06 | Shimadzu Corp | 高質量域二重収束質量分析計 |
-
1980
- 1980-05-31 JP JP7290980A patent/JPS5719950A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5719950A (en) | 1982-02-02 |
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