JPS6342324Y2 - - Google Patents
Info
- Publication number
- JPS6342324Y2 JPS6342324Y2 JP19009882U JP19009882U JPS6342324Y2 JP S6342324 Y2 JPS6342324 Y2 JP S6342324Y2 JP 19009882 U JP19009882 U JP 19009882U JP 19009882 U JP19009882 U JP 19009882U JP S6342324 Y2 JPS6342324 Y2 JP S6342324Y2
- Authority
- JP
- Japan
- Prior art keywords
- lens
- curvature
- optical axis
- prototype
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 claims description 26
- 238000003384 imaging method Methods 0.000 claims description 15
- 238000001514 detection method Methods 0.000 claims description 10
- 238000007689 inspection Methods 0.000 claims 1
- 230000002452 interceptive effect Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000000034 method Methods 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
Landscapes
- Instruments For Measurement Of Length By Optical Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19009882U JPS5995205U (ja) | 1982-12-16 | 1982-12-16 | レ−ザ−干渉計 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19009882U JPS5995205U (ja) | 1982-12-16 | 1982-12-16 | レ−ザ−干渉計 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5995205U JPS5995205U (ja) | 1984-06-28 |
| JPS6342324Y2 true JPS6342324Y2 (enrdf_load_stackoverflow) | 1988-11-07 |
Family
ID=30409680
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19009882U Granted JPS5995205U (ja) | 1982-12-16 | 1982-12-16 | レ−ザ−干渉計 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5995205U (enrdf_load_stackoverflow) |
-
1982
- 1982-12-16 JP JP19009882U patent/JPS5995205U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5995205U (ja) | 1984-06-28 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN108895972A (zh) | 一种基于计算全息的光学元件顶点半径测量的方法和装置 | |
| JP3377820B2 (ja) | 表面の曲率の測定装置 | |
| JPS6342324Y2 (enrdf_load_stackoverflow) | ||
| JPS5979104A (ja) | 光学装置 | |
| JPH0996589A (ja) | レンズ性能測定方法及びそれを用いたレンズ性能測定装置 | |
| JP5759270B2 (ja) | 干渉計 | |
| JPH06174430A (ja) | 中心厚測定方法およびそれに使用する装置 | |
| JPH09113237A (ja) | 折返しヌル干渉装置 | |
| CN115200471B (zh) | 一种用于引线键合机的散斑装置及其控制方法 | |
| JP2004279075A (ja) | レンズの偏芯測定方法及び測定装置 | |
| JPH0471453B2 (enrdf_load_stackoverflow) | ||
| JP2949179B2 (ja) | 非接触式形状測定装置及び形状測定法 | |
| JP2753545B2 (ja) | 形状測定システム | |
| CN114486198B (zh) | 大口径反射镜检测系统 | |
| JP3061653B2 (ja) | 非球面の測定方法および測定装置 | |
| JP2657405B2 (ja) | アナモフィックレンズの測定方法 | |
| JPH11108624A (ja) | 面形状測定装置および方法、並びに波面収差測定装置および方法 | |
| KR200148536Y1 (ko) | 비구면경의 형상오차 측정장치 | |
| JP2842861B2 (ja) | アナモフィックレンズの測定方法 | |
| JPH01143904A (ja) | 薄膜検査装置 | |
| JP2000088545A (ja) | 非球面形状の計測方法 | |
| JPH0339709Y2 (enrdf_load_stackoverflow) | ||
| JP3164444B2 (ja) | 干渉測定方法 | |
| JPH01233310A (ja) | 光学式面形状測定方法および面形状測定用光学式プローブ | |
| JP2001356069A (ja) | 曲率測定方法及び曲率測定装置 |