JPS6341422B2 - - Google Patents
Info
- Publication number
- JPS6341422B2 JPS6341422B2 JP55146878A JP14687880A JPS6341422B2 JP S6341422 B2 JPS6341422 B2 JP S6341422B2 JP 55146878 A JP55146878 A JP 55146878A JP 14687880 A JP14687880 A JP 14687880A JP S6341422 B2 JPS6341422 B2 JP S6341422B2
- Authority
- JP
- Japan
- Prior art keywords
- ultrasonic
- array probe
- flaw detection
- material surface
- inclination angle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000463 material Substances 0.000 claims description 38
- 239000000523 sample Substances 0.000 claims description 17
- 238000001514 detection method Methods 0.000 claims description 16
- 238000012545 processing Methods 0.000 claims description 5
- 238000002592 echocardiography Methods 0.000 claims description 3
- 230000007547 defect Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 238000007654 immersion Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- 238000012937 correction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000001902 propagating effect Effects 0.000 description 1
- 238000004154 testing of material Methods 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
- G01S7/52—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S15/00
- G01S7/52004—Means for monitoring or calibrating
Description
【発明の詳細な説明】
本発明は構造物材料の形状、材料内の欠陥もし
くは不連続部を超音波探傷し、材料の形状、欠陥
もしくは不連続部を画像表示する超音波探傷装置
に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an ultrasonic flaw detection device that performs ultrasonic flaw detection on the shape of a structural material, defects or discontinuities within the material, and displays images of the shape, defects or discontinuities in the material. be.
超音波探傷技術のうちで、電子走査形超音波探
傷法は材料の形状、材料内部の欠陥、不連続部等
を実時間で画像表示し、材料の形状、材料内欠陥
の分布、形状等に対する視覚的判断を容易にする
ところに特徴がある。 Among ultrasonic flaw detection technologies, electronic scanning ultrasonic flaw detection displays images of the shape of the material, defects inside the material, discontinuities, etc. in real time. Its distinctive feature is that it facilitates visual judgment.
しかしながら、第１図に示すように、材料の水
浸探傷法などで、材料１の表面と電子走査形超音
波探傷に使用するアレイプローブ２が傾いている
場合、超音波送受器３および画像処理器４を通し
て表示される材料表面５および材料内欠陥６の画
像５ａ，６ａも傾斜する。このため材料の形状、
欠陥等に対する視覚的判断が困難となる場合があ
る。 However, as shown in FIG. 1, when the surface of the material 1 and the array probe 2 used for electronic scanning ultrasonic flaw detection are tilted during water immersion testing of materials, etc., the ultrasonic transceiver 3 and the image processing The images 5a, 6a of the material surface 5 and defects in the material 6 displayed through the container 4 are also tilted. For this reason, the shape of the material,
It may be difficult to visually judge defects, etc.
本発明は電子走査形超音波探傷において、アレ
イプローブと材料表面の傾き角に関係なく、画像
が常に所定の画面位置に表示されるように自動補
正できるような超音波探傷装置を提供することを
目的とする。 An object of the present invention is to provide an ultrasonic flaw detection apparatus in electronic scanning ultrasonic flaw detection that can automatically correct the image so that it is always displayed at a predetermined screen position, regardless of the inclination angle between the array probe and the material surface. purpose.
第２図に本発明の構成例を説明するブロツクダ
イヤグラムを示す。第２図において、例えば水浸
法などで材料１の表面と任意の傾きθを有したア
レイプローブ２が配置されている場合、超音波送
受器３からの超音波ビームは材料表面５、材料内
の欠陥６、および材料裏面から反射し、再びアレ
イプローブ２で受信される。ここで本発明では、
材料表面５に超音波が傾きを有していても、材料
表面５の粗さによつて超音波が入射方向へ反射し
てくることを利用し、アレイプローブの一端部の
超音波送受用振動子群７（１）と他端の送受用振
動子群７（ｎ）による材料表面５からのそれぞれ
の反射エコー８（１）８（ｎ）（第３図に示す）
の時間差△Ｔを演算回路器９で算出する。 FIG. 2 shows a block diagram illustrating a configuration example of the present invention. In FIG. 2, when the array probe 2 is arranged at an arbitrary inclination θ with respect to the surface of the material 1 using the water immersion method, for example, the ultrasonic beam from the ultrasonic transceiver 3 is transmitted to the material surface 5 and inside the material. defect 6 and is reflected from the back surface of the material and is received again by the array probe 2. Here, in the present invention,
Even if the ultrasonic wave has an inclination on the material surface 5, the ultrasonic wave is reflected in the incident direction due to the roughness of the material surface 5. By using this fact, the vibration for transmitting and receiving the ultrasonic wave at one end of the array probe is Reflected echoes 8(1), 8(n) from the material surface 5 by the child group 7(1) and the transmitting/receiving transducer group 7(n) at the other end (shown in FIG. 3)
The arithmetic circuit 9 calculates the time difference ΔT.
演算回路器９は送受用振動子群７（１）と７
（ｎ）の長さＬを既知の値として材料表面５とア
レイプローブ２の傾きθを次式によつて算出す
る。 The arithmetic circuit unit 9 includes transmitting and receiving transducer groups 7 (1) and 7.
The inclination θ between the material surface 5 and the array probe 2 is calculated using the following equation, with the length L of (n) being a known value.
θ＝tan-1（△Ｔ×C1／Ｌ）
ここでC1は水中の超音波伝播速度である。演
算回路器９はさらに上式で算出されたθに対し、
材料１内を伝播する超音波の伝播速度C2を用い
て、次式により画像表示を材料表面に平行となる
ように補正に必要な角度を演算する。 θ=tan −1 (ΔT×C 1 /L) where C 1 is the ultrasonic propagation speed in water. The arithmetic circuit 9 further calculates θ calculated by the above formula,
Using the propagation velocity C2 of the ultrasonic wave propagating within the material 1, the angle required for correction so that the image display becomes parallel to the material surface is calculated using the following equation.
＝tan-1（C2／C1×tanθ）
上式を用いて、画像表示に用いられるブラウン
管上の走査信号Ｘ、Ｙを一般的な角度座標変換を
次式のようにほどこして、ブラウン管表示用の画
像処理表示器１０へ伝送する。 = tan -1 (C 2 / C 1 × tan θ) Using the above formula, the scanning signals X and Y on the cathode ray tube used for image display are subjected to general angular coordinate transformation as shown in the following formula, and then the cathode ray tube display is The data is transmitted to the image processing display device 10 for use.
Ｘ＝X′cos＋Y′sin
Ｙ＝−X′sin＋Y′cos
ここでX′、Y′は従来画像表示法によるブラウ
ン管走査信号である。 X=X'cos+Y'sin Y=-X'sin+Y'cos where X' and Y' are cathode ray tube scanning signals according to the conventional image display method.
画像処理表示器１０では上記Ｘ、Ｙ信号を電子
走査信号と同期させ、反射エコー高さに応じた輝
度信号を出力させることにより、ブラウン管上に
画像表示させることを可能としている。 The image processing display device 10 synchronizes the X and Y signals with the electronic scanning signal and outputs a luminance signal corresponding to the height of the reflected echo, thereby making it possible to display an image on the cathode ray tube.
本発明の応用例として、アレイプローブと材料
表面の傾き角θを常時監視することにより、超音
波が材料内へ入射する時の超音波の縦波、横波通
過率に応じた超音波伝播速度C2を決定すること
も可能である。また、アレイプローブの傾きを制
御するモータ等をアレイプローブに付ければ、傾
き角θを常に一定に保つよう自動制御することも
できる。 As an application example of the present invention, by constantly monitoring the inclination angle θ between the array probe and the material surface, we can determine the ultrasonic propagation velocity C according to the longitudinal wave and transverse wave passage rate of the ultrasonic wave when it enters the material. It is also possible to determine 2 . Furthermore, by attaching a motor or the like to the array probe to control the inclination of the array probe, it is possible to automatically control the inclination angle θ to always keep it constant.
さらに、材料の表面エコーによる画像をブラウ
ン管上の一定位置に常時表示させるように特定な
もしくは任意の送受用振動子群による表面エコー
信号に同期させてブラウン管信号を掃引させるこ
とも可能であり、このようにすることにより、ア
レイプローブと材料表面の間隔が超音波探傷中に
変動しても適性な画像表示が得られる。 Furthermore, it is also possible to sweep the cathode ray tube signal in synchronization with the surface echo signal from a specific or arbitrary group of transmitting/receiving transducers so that the image generated by the surface echo of the material is always displayed at a fixed position on the cathode ray tube. By doing so, an appropriate image display can be obtained even if the distance between the array probe and the material surface changes during ultrasonic flaw detection.
また、本発明例では材料表面が平らな例を示し
たが、表面が曲面もしくは凹凸を持つ材料につい
ても、本発明は原理的に適用可能である。すなわ
ち、あらかじめ表面の形状が既知であり、送受用
振動子群による表面探傷位置を知ることにより、
画像表示の傾きが補正できるものである。 Moreover, although the present invention example shows an example in which the material surface is flat, the present invention is also applicable in principle to materials whose surfaces are curved or uneven. In other words, by knowing the surface shape in advance and knowing the surface flaw detection position by the transmitting and receiving transducer group,
The tilt of the image display can be corrected.
なお、本発明は画像の傾きをアレイプローブの
両端の超音波送受用振動子群７（１）と７（ｎ）
によつているが、実用上は両端に限ることはなく
使用する２つの振動子群の距離Ｌが知れておれば
よい。 In addition, in the present invention, the inclination of the image is determined by the ultrasonic transmitting/receiving transducer groups 7(1) and 7(n) at both ends of the array probe.
However, in practice, the distance L between the two vibrator groups used is not limited to both ends and need only be known.
本発明により、電子走査形超音波探傷法でブラ
ウン管上に表示される材料形状および材料内欠陥
の分布状態を、アレイプローブと材料表面の相互
の傾きの変動に関係なく、常に正規の視野感覚で
表示可能となり、さらに材料表面への超音波入射
角を常時監視することが可能となる。 According to the present invention, the material shape and the distribution state of defects within the material displayed on a cathode ray tube using electronic scanning ultrasonic flaw detection can always be viewed in a normal visual field, regardless of variations in the mutual inclination between the array probe and the material surface. In addition, it is possible to constantly monitor the angle of incidence of ultrasonic waves on the material surface.
第１図は従来探傷装置による探傷画像を説明す
るブロツク図、第２図は本発明の探傷装置の一実
施例を示すブロツク図、第３図は材料表面からの
反射エコーを示す曲線図である。
１……材料、２……アレイプローブ、３……超
音波送受器、４……画像処理器、５……材料表
面、６……材料欠陥、７……超音波送受用振動子
群、８……反射エコー、９……演算回路器、１０
……画像処理表示器。
Fig. 1 is a block diagram explaining a flaw detection image by a conventional flaw detection device, Fig. 2 is a block diagram showing an embodiment of the flaw detection device of the present invention, and Fig. 3 is a curve diagram showing reflected echoes from the material surface. . DESCRIPTION OF SYMBOLS 1... Material, 2... Array probe, 3... Ultrasonic transceiver, 4... Image processor, 5... Material surface, 6... Material defect, 7... Ultrasonic transducer group, 8 ...Reflected echo, 9...Arithmetic circuit, 10
...Image processing display.
Claims (1)
され探傷すべき材料表面に対し傾斜可能なアレイ
プローブと、このアレイプローブに超音波を送受
信する超音波送受器と、前記材料表面と前記超音
波振動子の配列方向とで形成される前記アレイプ
ローブの傾斜角を材料表面からの反射エコーの時
間差により算出する演算回路器と、材料の探傷画
像を前記傾斜角で補正する画像処理表示器とより
なり、アレイプローブと材料表面の傾斜角に関係
なく常に正規な探傷画像表示をすることを特徴と
する超音波探傷装置。1. An array probe configured by linearly arranging a plurality of ultrasonic transducers and capable of tilting with respect to the surface of a material to be detected; an ultrasonic transceiver that transmits and receives ultrasonic waves to and from the array probe; an arithmetic circuit that calculates the inclination angle of the array probe formed by the array direction of the ultrasonic transducers based on the time difference of reflected echoes from the material surface; and an image processing display that corrects a flaw detection image of the material using the inclination angle. Accordingly, an ultrasonic flaw detection device is characterized in that it always displays a normal flaw detection image regardless of the inclination angle between the array probe and the material surface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55146878A JPS5770453A (en) | 1980-10-22 | 1980-10-22 | Ultrasonic flaw detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55146878A JPS5770453A (en) | 1980-10-22 | 1980-10-22 | Ultrasonic flaw detector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5770453A JPS5770453A (en) | 1982-04-30 |
| JPS6341422B2 true JPS6341422B2 (en) | 1988-08-17 |
Family
ID=15417605
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55146878A Granted JPS5770453A (en) | 1980-10-22 | 1980-10-22 | Ultrasonic flaw detector |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5770453A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010190905A (en) * | 2007-06-20 | 2010-09-02 | Ge Sensing & Inspection Technologies Gmbh | Method and device for nondestructive recording of specimen, as well as test unit |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101001340B1 (en) | 2008-07-23 | 2010-12-14 | (주)선양기계금속 | The centrifugal casting method for a rotor construction |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5292778A (en) * | 1976-01-30 | 1977-08-04 | Hitachi Ltd | Section indicating apparatus in use of ultrasonic wave |
| JPS5482884A (en) * | 1977-12-14 | 1979-07-02 | Ito Kenichi | Twoodimensional scan ultrasonic wave probe |
-
1980
- 1980-10-22 JP JP55146878A patent/JPS5770453A/en active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5292778A (en) * | 1976-01-30 | 1977-08-04 | Hitachi Ltd | Section indicating apparatus in use of ultrasonic wave |
| JPS5482884A (en) * | 1977-12-14 | 1979-07-02 | Ito Kenichi | Twoodimensional scan ultrasonic wave probe |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010190905A (en) * | 2007-06-20 | 2010-09-02 | Ge Sensing & Inspection Technologies Gmbh | Method and device for nondestructive recording of specimen, as well as test unit |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5770453A (en) | 1982-04-30 |
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