JPS6330999Y2 - - Google Patents
Info
- Publication number
- JPS6330999Y2 JPS6330999Y2 JP4592780U JP4592780U JPS6330999Y2 JP S6330999 Y2 JPS6330999 Y2 JP S6330999Y2 JP 4592780 U JP4592780 U JP 4592780U JP 4592780 U JP4592780 U JP 4592780U JP S6330999 Y2 JPS6330999 Y2 JP S6330999Y2
- Authority
- JP
- Japan
- Prior art keywords
- output
- signal
- function
- quadratic
- energy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000004458 analytical method Methods 0.000 claims description 5
- 238000001228 spectrum Methods 0.000 description 13
- 238000001514 detection method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 238000003705 background correction Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000012886 linear function Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4592780U JPS6330999Y2 (enrdf_load_stackoverflow) | 1980-04-04 | 1980-04-04 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4592780U JPS6330999Y2 (enrdf_load_stackoverflow) | 1980-04-04 | 1980-04-04 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56146252U JPS56146252U (enrdf_load_stackoverflow) | 1981-11-04 |
JPS6330999Y2 true JPS6330999Y2 (enrdf_load_stackoverflow) | 1988-08-18 |
Family
ID=29640991
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4592780U Expired JPS6330999Y2 (enrdf_load_stackoverflow) | 1980-04-04 | 1980-04-04 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6330999Y2 (enrdf_load_stackoverflow) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59226854A (ja) * | 1983-06-07 | 1984-12-20 | Shimadzu Corp | X線分析装置 |
-
1980
- 1980-04-04 JP JP4592780U patent/JPS6330999Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS56146252U (enrdf_load_stackoverflow) | 1981-11-04 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP3607023B2 (ja) | X線定量分析装置および方法 | |
GB1525488A (en) | Method and apparatus for spectrometric analysis of fine grained minerals and other substances using an electron bea | |
JPS5963648A (ja) | 分析装置 | |
JP2793818B2 (ja) | 表面分析方法およびその装置 | |
CA1048163A (en) | Process and apparatus for the elementary and chemical analysis of a sample by spectrum analysis of the energy of the secondary electrons | |
JPS6330999Y2 (enrdf_load_stackoverflow) | ||
GB2197464A (en) | Signal processing method for nuclear spectrometers | |
JPH04334861A (ja) | 電子分光画像測定方式 | |
JPH08128942A (ja) | 粒度分布測定装置 | |
JP2674010B2 (ja) | 電子線照射装置 | |
US3848125A (en) | Coating thickness gauge | |
JPS6233546B2 (enrdf_load_stackoverflow) | ||
JPS63119147A (ja) | 荷電粒子線の集束状態を検出する装置 | |
JPS58105743A (ja) | X線画像処理装置 | |
JP2937598B2 (ja) | 深さ方向元素濃度分布測定装置 | |
US4587428A (en) | Method and apparatus for the diagnosis of tissue samples | |
JPS6327642B2 (enrdf_load_stackoverflow) | ||
JPH0752163B2 (ja) | 波長分散型x線分光器による簡易定量分析法 | |
US3757116A (en) | Ment in a material device for direct measurement of the curve of concentration of an ele | |
SU1004831A1 (ru) | Нейтронный влагомер | |
JPS60113137A (ja) | X線光電子分光分析方法ならびにその装置 | |
JPS5942684Y2 (ja) | デンシトメ−タ | |
JPS6398550A (ja) | 軟x線領域のエクザフス装置 | |
JPH046904B2 (enrdf_load_stackoverflow) | ||
JPS6027941B2 (ja) | X線回折装置 |