JPS6228859B2 - - Google Patents

Info

Publication number
JPS6228859B2
JPS6228859B2 JP53031263A JP3126378A JPS6228859B2 JP S6228859 B2 JPS6228859 B2 JP S6228859B2 JP 53031263 A JP53031263 A JP 53031263A JP 3126378 A JP3126378 A JP 3126378A JP S6228859 B2 JPS6228859 B2 JP S6228859B2
Authority
JP
Japan
Prior art keywords
correction
peak
data
energy
stored
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP53031263A
Other languages
English (en)
Japanese (ja)
Other versions
JPS54123996A (en
Inventor
Itsumi Tanaka
Keiichi Yoshida
Yoshiaki Okui
Hiroshi Yamauchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP3126378A priority Critical patent/JPS54123996A/ja
Publication of JPS54123996A publication Critical patent/JPS54123996A/ja
Publication of JPS6228859B2 publication Critical patent/JPS6228859B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/227Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP3126378A 1978-03-17 1978-03-17 Data processing method of photoelectron spectroscopic apparatus Granted JPS54123996A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3126378A JPS54123996A (en) 1978-03-17 1978-03-17 Data processing method of photoelectron spectroscopic apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3126378A JPS54123996A (en) 1978-03-17 1978-03-17 Data processing method of photoelectron spectroscopic apparatus

Publications (2)

Publication Number Publication Date
JPS54123996A JPS54123996A (en) 1979-09-26
JPS6228859B2 true JPS6228859B2 (enrdf_load_stackoverflow) 1987-06-23

Family

ID=12326448

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3126378A Granted JPS54123996A (en) 1978-03-17 1978-03-17 Data processing method of photoelectron spectroscopic apparatus

Country Status (1)

Country Link
JP (1) JPS54123996A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6428548A (en) * 1987-07-23 1989-01-31 Mazda Motor Judgement on propriety of degreasing for synthetic resin molded product

Also Published As

Publication number Publication date
JPS54123996A (en) 1979-09-26

Similar Documents

Publication Publication Date Title
Holzinger PTRwid: A new widget tool for processing PTR-TOF-MS data
US5866903A (en) Equipment and process for quantitative x-ray analysis and medium with quantitative x-ray analysis program recorded
JP3461208B2 (ja) 試料に含まれる物質の同定方法および分布測定方法
JP2841258B2 (ja) 蛍光x線定性分析方法
JPH10318946A (ja) エネルギー分散型x線分析装置
JPS6228859B2 (enrdf_load_stackoverflow)
JP4143349B2 (ja) 粒径分布測定方法、粒径分布測定装置および粒径分布測定装置の測定プログラム
JP2005504270A (ja) 環境放射能モニタ
GB1461195A (en) Method of determination of the mass and centre of gravity of an object
JP2995841B2 (ja) ガスクロマトグラフ質量分析計のデータ処理装置
Mallory et al. The Control and Processing of Data from an Automated X-ray Powder Diffractometer
JP3477499B2 (ja) 装置保守情報の記憶機能を備えたx線分析装置
JPS5942683Y2 (ja) デンシトメ−タ−
JPS6330999Y2 (enrdf_load_stackoverflow)
CN105784105A (zh) 空调中电抗器的噪音检测装置和噪音检测方法
JP2002062270A (ja) 電子線を用いた表面分析装置における面分析データ表示方法
JP3146195B2 (ja) X線マッピング装置
JPH10132799A (ja) クロマトグラフ用データ処理装置
JPH04343055A (ja) X線光電子分析方法
JPH11316199A (ja) 半導体検出器のx線スペクトルのピーク強度計算方法
SU1133699A1 (ru) Устройство дл измерени эффективной энергии рентгеновского излучени или высокого напр жени на рентгеновской трубке
US4282428A (en) Chromosome detector using a scanning microscope system
JPS5814062A (ja) 波高分析装置
JPS5940243A (ja) 走査型分析装置
JPS60129652A (ja) オ−ジエ分光スペクトルの表示方法