JPS63307733A - Developing device - Google Patents
Developing deviceInfo
- Publication number
- JPS63307733A JPS63307733A JP14371287A JP14371287A JPS63307733A JP S63307733 A JPS63307733 A JP S63307733A JP 14371287 A JP14371287 A JP 14371287A JP 14371287 A JP14371287 A JP 14371287A JP S63307733 A JPS63307733 A JP S63307733A
- Authority
- JP
- Japan
- Prior art keywords
- developing
- chamber
- nozzle
- wafer
- pretreatment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 claims abstract description 20
- 239000000126 substance Substances 0.000 claims abstract description 8
- 229920002120 photoresistant polymer Polymers 0.000 claims abstract description 5
- 239000003595 mist Substances 0.000 claims description 2
- 239000007788 liquid Substances 0.000 abstract description 11
- 230000002950 deficient Effects 0.000 abstract description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 7
- 238000002203 pretreatment Methods 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- 238000005507 spraying Methods 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000005871 repellent Substances 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- 241000257465 Echinoidea Species 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 238000007781 pre-processing Methods 0.000 description 1
- 230000002940 repellent Effects 0.000 description 1
Landscapes
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
Abstract
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、フォトレジスジの現像装置の機構に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a mechanism of a photoresist developing device.
(従来の技術〕
従来の現像装置は第2図に示すような構造である。現像
工程は、通常以下に述べる順番で進行する。(Prior Art) A conventional developing device has a structure as shown in Fig. 2.The developing process usually proceeds in the order described below.
l) 前処理:純水又は現像液布FJ溶液をウェハ1上
にノズル10より吐出しウェハ1全面に行き渡らせる。l) Pretreatment: Pure water or developer cloth FJ solution is discharged onto the wafer 1 from the nozzle 10 and spread over the entire surface of the wafer 1.
2) 現像処理ニ一定時間の前処理の後、ノズル7より
現像液を吐出し、一定時間現像処理を行う。2) Development Process After preprocessing for a certain period of time, a developer is discharged from the nozzle 7, and development processing is performed for a certain period of time.
3) 停止・洗浄処理ニ一定時間の現像処理の後、ノズ
ル8より純水を吐出し、現像の停止及びウェハ1の洗浄
を行い、一定時間の後、吐出を停止させターンテーブル
2を高速で回転させウェハ1の乾燥を行う。3) Stop/cleaning process: After the development process for a certain period of time, pure water is discharged from the nozzle 8 to stop the development and wash the wafer 1. After a certain period of time, the discharge is stopped and the turntable 2 is moved at high speed. The wafer 1 is dried by rotating it.
しかし、前述の従来技術では以下に述べる問題点が生じ
ていた。即ち、フォトレジストが塗布されたウニ凸表面
は非常に撥水性が高いために、前述の前処理及び現像処
理時に部分的に処理に時間差が生じ、処理が不均一とな
り、正常にIA像されない箇所が生じていた。前処理液
として現像液希薄溶液を用いる場合は、純水を用いる場
合に比べて、いくらか現象不良発生率は減少するが、い
ずれにしでも現象不良が生じ、 歩留が低下していた。However, the above-mentioned conventional technology has the following problems. In other words, since the convex surface of the sea urchin coated with photoresist is extremely water-repellent, there is a time lag in some parts during the pre-treatment and development treatment described above, resulting in uneven processing and areas that are not properly IA-imaged. was occurring. When a dilute developer solution is used as the pretreatment liquid, the incidence of defective products is somewhat reduced compared to when pure water is used, but in any case, defective products occur and the yield is reduced.
そこで本発明はこのような問題点を解決するもので、そ
の目的とするところは、現像工程における歩留を向上す
るところにある。The present invention is intended to solve these problems, and its purpose is to improve the yield in the developing process.
本発明の現像装置は、現像処理が行われるチャンバを有
し、該チャンバ中にTi吠の薬液を供給するノズルを有
してなることを特徴とする。The developing device of the present invention is characterized in that it has a chamber in which a developing process is performed, and a nozzle for supplying a chemical solution into the chamber.
第1図は本発明の実施例における現像装置の断面図であ
る。ノズル4は前処理用薬液を噴霧するためのノズルで
あり、又、現像液はノズル7、現像停止用純水はノズル
8より吐出される。ノズル4には、薬液を供給するため
のチューブ5と噴霧用のN、ガスを供給するためのチュ
ーブ6が接続されている。ノズル4はウェハ1上方のチ
ャンバ−3に固定されているが噴霧させる角度が充分法
いため、ウェハ1の全面に対し均一に前処理が行われる
。本実施例における現像工程のプロセスは以下のとおり
である。FIG. 1 is a sectional view of a developing device in an embodiment of the present invention. The nozzle 4 is a nozzle for spraying a pretreatment chemical solution, the developer is discharged from a nozzle 7, and the pure water for stopping development is discharged from a nozzle 8. A tube 5 for supplying a chemical solution and a tube 6 for supplying N and gas for spraying are connected to the nozzle 4. Although the nozzle 4 is fixed in the chamber 3 above the wafer 1, the spray angle is sufficiently small, so that the entire surface of the wafer 1 can be uniformly pretreated. The development process in this example is as follows.
1) 前処理:ターンテーブル2上にウェハ1を載置ル
低速で回転させる。ノズル4より前処理液を噴霧させる
。霧状となった前処理液はチャンバ3中に充満し、ウェ
ハ1上に均一に付着する。1iif処理時には排気用バ
ルブ9は閉じである。1) Pretreatment: Place the wafer 1 on the turntable 2 and rotate it at low speed. The pretreatment liquid is sprayed from the nozzle 4. The atomized pretreatment liquid fills the chamber 3 and is uniformly deposited on the wafer 1. During the 1iif process, the exhaust valve 9 is closed.
2) 現像処理:現像液は従来と同様、ウェハ1のすぐ
上の位置で吐出される。現像処理が始まると同時に排気
用バルブ9を開き、チャンバ3中の霧状の前処理液を強
制的に排除する。2) Development processing: The developer is discharged at a position immediately above the wafer 1, as in the conventional case. At the same time as the development process begins, the exhaust valve 9 is opened to forcibly remove the atomized pretreatment liquid from the chamber 3.
3) 停止・洗浄処理:従来と同様、一定時間の現像処
理の後、純水が吐出され、現像停止及び洗浄を行う。一
定時間の後、吐出を停止し、ター/テーブル2を高速で
回転させウェハ1を乾燥させる。 ・
前処理液としては現像液希薄溶液を用いる方が現像不良
発生率が低く、望ましい、以上述べた現像工程によりウ
ェハの現像を行う場合、前処理液は、微細な霧となって
ウェハ上に付着するためたとえウェハが撥水性をaして
いても、前処理がウェハ全面に渡って均一になされるた
め、現像不良はほとんど生じな(、同工程の歩留が向上
する。3) Stopping/cleaning process: As in the conventional case, after a certain period of developing process, pure water is discharged to stop development and wash. After a certain period of time, the discharge is stopped and the tar/table 2 is rotated at high speed to dry the wafer 1. - It is preferable to use a diluted developer solution as the pre-treatment liquid because it has a lower incidence of development defects. When developing a wafer using the development process described above, the pre-treatment liquid becomes a fine mist and is deposited on the wafer. Even if the wafer is water repellent, the pretreatment is performed uniformly over the entire surface of the wafer, so there are almost no development defects (and the yield of the same process is improved).
以上述べたように本発明によれば、フォトレジストの現
像において、現像処理が行われるチャンバを有し、該チ
ャンバ中に′gi杖の薬液を供給するノズルを存する現
a装置を使用することで、現象工程における不良の発生
がほとんどなくなり歩留が向上するという効果ををする
。As described above, according to the present invention, in developing a photoresist, a developing apparatus having a chamber in which the developing process is performed and a nozzle for supplying a chemical solution of ``gi'' in the chamber is used. This has the effect that the occurrence of defects in the process is almost eliminated and the yield is improved.
第1図は本発明における現像装置の断面図、第2図は従
来の現像装置の断面図
1・・・ウェハ
2・・・ターンテーブル
3・・・チャンバ
4・・・噴霧用ノズル
5・・・前処理用薬液供給チューブ
6・・・噴霧用N、ガス供給チューブ
7・・・現像液用ノズル
8・・・現像停止用純水ノズル
9・・・チャンバ内排気用バルブ
10・・・前処理用ノズル
以 上FIG. 1 is a cross-sectional view of a developing device according to the present invention, and FIG. 2 is a cross-sectional view of a conventional developing device. Wafer 2 Turntable 3 Chamber 4 Spray nozzle 5.・Pre-treatment chemical supply tube 6... N for spraying, gas supply tube 7... Developer nozzle 8... Pure water nozzle 9 for stopping development... Valve 10 for exhausting the chamber... Front Processing nozzle or more
Claims (1)
行われるチャンバを有し、該チャンバ中に霧状の薬液を
供給するノズルを有してなることを特徴とする現像装置
。A developing device for developing photoresist, comprising a chamber in which a developing process is performed, and a nozzle for supplying a mist of a chemical into the chamber.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14371287A JPS63307733A (en) | 1987-06-09 | 1987-06-09 | Developing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14371287A JPS63307733A (en) | 1987-06-09 | 1987-06-09 | Developing device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63307733A true JPS63307733A (en) | 1988-12-15 |
Family
ID=15345223
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14371287A Pending JPS63307733A (en) | 1987-06-09 | 1987-06-09 | Developing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63307733A (en) |
-
1987
- 1987-06-09 JP JP14371287A patent/JPS63307733A/en active Pending
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