JPS63290947A - 大気汚染測定装置 - Google Patents

大気汚染測定装置

Info

Publication number
JPS63290947A
JPS63290947A JP62126000A JP12600087A JPS63290947A JP S63290947 A JPS63290947 A JP S63290947A JP 62126000 A JP62126000 A JP 62126000A JP 12600087 A JP12600087 A JP 12600087A JP S63290947 A JPS63290947 A JP S63290947A
Authority
JP
Japan
Prior art keywords
laser light
semiconductor laser
liquid nitrogen
atm
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62126000A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0549177B2 (enrdf_load_stackoverflow
Inventor
Nobuyuki Oguchi
小口　信行
Satoshi Takahashi
聡 高橋
Akio Kiyozawa
清沢　昭雄
Shinya Hashimoto
伸哉 橋本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute for Materials Science
Original Assignee
National Research Institute for Metals
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Research Institute for Metals filed Critical National Research Institute for Metals
Priority to JP62126000A priority Critical patent/JPS63290947A/ja
Publication of JPS63290947A publication Critical patent/JPS63290947A/ja
Publication of JPH0549177B2 publication Critical patent/JPH0549177B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Semiconductor Lasers (AREA)
JP62126000A 1987-05-25 1987-05-25 大気汚染測定装置 Granted JPS63290947A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62126000A JPS63290947A (ja) 1987-05-25 1987-05-25 大気汚染測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62126000A JPS63290947A (ja) 1987-05-25 1987-05-25 大気汚染測定装置

Publications (2)

Publication Number Publication Date
JPS63290947A true JPS63290947A (ja) 1988-11-28
JPH0549177B2 JPH0549177B2 (enrdf_load_stackoverflow) 1993-07-23

Family

ID=14924244

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62126000A Granted JPS63290947A (ja) 1987-05-25 1987-05-25 大気汚染測定装置

Country Status (1)

Country Link
JP (1) JPS63290947A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04151546A (ja) * 1990-10-15 1992-05-25 Anritsu Corp ガス検出装置
WO2009128138A1 (ja) * 2008-04-15 2009-10-22 株式会社島津製作所 校正用ガスセルを搭載したガス分析装置
JP2016503904A (ja) * 2013-01-23 2016-02-08 カリフォルニア インスティチュート オブ テクノロジー 微量ガス検出用小型チューナブルレーザ分光計

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56147034A (en) * 1980-04-17 1981-11-14 Tokyo Electric Power Co Inc:The Gas leakage detector
JPS5812385A (ja) * 1981-06-26 1983-01-24 Fujitsu Ltd 波長可変レーザを用いたガス分析装置
JPS58143242A (ja) * 1982-02-19 1983-08-25 Fujitsu Ltd 漏洩ガス検出装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56147034A (en) * 1980-04-17 1981-11-14 Tokyo Electric Power Co Inc:The Gas leakage detector
JPS5812385A (ja) * 1981-06-26 1983-01-24 Fujitsu Ltd 波長可変レーザを用いたガス分析装置
JPS58143242A (ja) * 1982-02-19 1983-08-25 Fujitsu Ltd 漏洩ガス検出装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04151546A (ja) * 1990-10-15 1992-05-25 Anritsu Corp ガス検出装置
WO2009128138A1 (ja) * 2008-04-15 2009-10-22 株式会社島津製作所 校正用ガスセルを搭載したガス分析装置
JP5360053B2 (ja) * 2008-04-15 2013-12-04 株式会社島津製作所 校正用ガスセルを搭載したガス分析装置
JP2016503904A (ja) * 2013-01-23 2016-02-08 カリフォルニア インスティチュート オブ テクノロジー 微量ガス検出用小型チューナブルレーザ分光計

Also Published As

Publication number Publication date
JPH0549177B2 (enrdf_load_stackoverflow) 1993-07-23

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term