JPS63290947A - Instrument for measuring air pollution - Google Patents

Instrument for measuring air pollution

Info

Publication number
JPS63290947A
JPS63290947A JP62126000A JP12600087A JPS63290947A JP S63290947 A JPS63290947 A JP S63290947A JP 62126000 A JP62126000 A JP 62126000A JP 12600087 A JP12600087 A JP 12600087A JP S63290947 A JPS63290947 A JP S63290947A
Authority
JP
Japan
Prior art keywords
laser light
semiconductor laser
liquid nitrogen
atm
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62126000A
Other languages
Japanese (ja)
Other versions
JPH0549177B2 (en
Inventor
Nobuyuki Oguchi
小口 信行
Satoshi Takahashi
聡 高橋
Akio Kiyozawa
清沢 昭雄
Shinya Hashimoto
伸哉 橋本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Research Institute for Metals
Original Assignee
National Research Institute for Metals
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Research Institute for Metals filed Critical National Research Institute for Metals
Priority to JP62126000A priority Critical patent/JPS63290947A/en
Publication of JPS63290947A publication Critical patent/JPS63290947A/en
Publication of JPH0549177B2 publication Critical patent/JPH0549177B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To measure the concns. of the hydrocarbons in the atm. by an IR absorption measurement by using a semiconductor laser element which oscillates laser light at the temp. of liquid nitrogen as a light source and forming a multireflection length optical path cell to be introduced with this laser light into a type open to the atm. CONSTITUTION:Pb1-xCdxS1-ySey is disposed in a liquid nitrogen vessel 1 in which the semiconductor laser element is disposed, then the laser light is oscillated. Methane, ethane, and butane are diluted with gaseous nitrogen and are sealed respectively at 100ppm into a gas cell 2 for calibration. The laser light is multiple-reflected by concave mirrors 3'-3'''. Between the concave mirrors 3 and 3'' are opened to the atm. An InSb IR detectors 4, 4' cooled by liquid nitrogen are mounded on the rear side of the respective cell in order to measure the absorption intensity of the laser light. X is determined from Ig/Ic=X/100 where the intensity obtd. from the gas cell 2 for calibration is designated as Ic and the intensity obtd. from the multireflection length optical path cell 3 as Ig. The concnsn. of the respective hydrocarbons in the atm. are thus measured.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は大気汚染測定装置に関する。更に詳しくは光化
学スモッグの原因となる大気中の各種炭化水素汚染気体
の濃度を、野外現場で高精度迅速に計測し、光化学スモ
ッグを感知する小型軽量の大気汚染測定装置に関する。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to an air pollution measuring device. More specifically, the present invention relates to a small and lightweight air pollution measurement device that detects photochemical smog by rapidly and accurately measuring the concentration of various hydrocarbon pollution gases in the atmosphere that cause photochemical smog in the field.

従来技術 従来、大気中の光化学スモッグの原因となる先決により
測定されていた。
PRIOR ART Conventionally, photochemical smog in the atmosphere was measured by prior determination.

しかし、これらの方法はいずれも大型の装置を必要とす
るため高価であり、tfjK、上記気体の#産金測定す
るためには、採取し7た大気試料を研究室等に持ちRF
)測定することが必要であるばかりでなく、測定に時間
がかかる欠点があった。
However, all of these methods are expensive because they require large equipment, and in order to measure the #gold production of the above gases, it is necessary to take the collected air samples to a laboratory or the like and use RF
) Not only is it necessary to measure the method, but it also has the drawback that it takes time.

また、半導体レーザ素子を光源とした赤外吸収分光法に
よる測定装置も知られている。
Furthermore, a measuring device using infrared absorption spectroscopy using a semiconductor laser element as a light source is also known.

即ち、この装置は、炭化水素汚染気体の計測に適した波
長2〜4μmの赤外領域で光る半導体レーザが極低温で
しか動作しなかったため、大型の冷凍機で極低温にする
ことにより作動状態にし、真空排気した密閉型の多重反
射長光路セルに、大気の気体を導入して赤外吸収分光を
計測していた。
In other words, since the semiconductor laser that emits in the infrared region with a wavelength of 2 to 4 μm, which is suitable for measuring hydrocarbon contamination gases, could only operate at extremely low temperatures, this device was able to maintain its operating state by lowering the temperature to extremely low temperatures using a large refrigerator. Infrared absorption spectroscopy was measured by introducing atmospheric gas into a vacuum-evacuated, sealed, multiple-reflection, long-path cell.

従って、この装置では、冷凍機及び真空装置を必要とす
るため大型となり、その上長光路セルを真空排気してか
ら大気を導入する必要があるため、操作も面倒となり、
野外現場において移動しながら大気汚染気体の濃度を短
時間に計測することは困難であった。
Therefore, this device requires a refrigerator and a vacuum device, making it large in size, and it is also cumbersome to operate, as it is necessary to evacuate the long optical path cell before introducing atmospheric air.
It has been difficult to measure the concentration of air pollutants in a short time while moving in the field.

また、波長7〜8μmにおける波長可変半導体レーザを
光源とした短光路吸収分光測定法あるいは遠方に固定し
た鏡による反射を利用した赤外吸収分光法により、大気
中のメタン濃度を計測する装置も知られている。
Additionally, devices are known that measure methane concentration in the atmosphere using short-path absorption spectroscopy using a wavelength tunable semiconductor laser as a light source at a wavelength of 7 to 8 μm, or infrared absorption spectroscopy using reflection from a mirror fixed at a distance. It is being

しかし、この装置による炭化水素の計測は。However, the measurement of hydrocarbons with this device.

この波長領域には、炭化水素気体の内の一部であるメタ
ンのみしか共鳴吸収線が存在しないため、光化学スモッ
グを対象とした大気汚染測定装置としては適さない欠点
があった。
In this wavelength region, resonance absorption lines exist only for methane, which is a part of hydrocarbon gases, and this has the disadvantage that it is not suitable as an air pollution measuring device for photochemical smog.

発明の目的 本発明は従来の大気汚染測定装置の欠点をなくすべくな
されたもので、波長2〜4μmの波長領域に可変し得ら
れ、冷凍機、真空装置を必要とせず、小型で、野外現場
で高精度迅速に計測し得られる大気汚染測定装置を提供
するにあ本発明者はさきに、波長2〜4μmの間→j。
Purpose of the Invention The present invention has been made to eliminate the drawbacks of conventional air pollution measuring devices, and is capable of changing the wavelength range from 2 to 4 μm, does not require a refrigerator or vacuum device, is compact, and can be used outdoors. In order to provide an air pollution measuring device that can quickly and accurately measure air pollution at wavelengths of 2 to 4 μm →j.

長可変でき、液体窒素温度でレーザ光を発振し得られる
半導体レーザ、即ち、一般式pb1゜cdxS□−yS
eyl及びPb!yMnzs、 ySey(ただし、X
%  )’ijo、hx>1、o=y≦1を表わす)で
示される半導体を開発した。(特開昭61−17479
2号、特開昭61−174793号)これを大気汚染測
定装置の光源として利用すると、液体窒素温度でレーザ
光を発振し得られるので、液体窒素容器中に配置するこ
とによりメタン、エタン、ブタン等の濃度も容易に一側
是−し得られる。また、多重反射長光路セルを大気開放
型にすると、従来のように、密封容器に大気を入れ研究
室に持ち帰シ測定することを必要とせず、野外現場で迅
速に測定し得らすることを知見し得た。この知見に基づ
いて本発明を完成した。
A semiconductor laser whose length is variable and which can be obtained by oscillating laser light at liquid nitrogen temperature, that is, the general formula pb1゜cdxS□-yS
eyl and Pb! yMnzs, ySey (however, X
%)'ijo, hx>1, o=y≦1) has been developed. (Unexamined Japanese Patent Publication No. 61-17479
(No. 2, JP-A No. 61-174793) When this is used as a light source for an air pollution measuring device, it can oscillate laser light at the temperature of liquid nitrogen. Concentrations such as these can also be easily obtained on one side. In addition, by making the multiple reflection long-path cell open to the atmosphere, it is no longer necessary to put the atmosphere in a sealed container and take it back to the laboratory for measurements, making it possible to perform measurements quickly in the field. I was able to find out. The present invention was completed based on this knowledge.

本発明の要旨は、半導体レーザ素子を光源とし、レーザ
光の吸収を利用して赤外吸収測定を行い大気中の炭化水
素濃度を測定する装置において、波長2〜4μmの間で
波長可変であり、液体窒素温度でレーザ光を発振する半
導体レーザ素子を光源とし、このレーザ光を導入する多
重反射長光路セルを大気開放型にしたこと全特徴とする
大気汚染測定装置にある。
The gist of the present invention is to provide an apparatus that uses a semiconductor laser element as a light source and measures hydrocarbon concentration in the atmosphere by performing infrared absorption measurements using absorption of laser light, which is wavelength tunable between 2 and 4 μm. , an air pollution measuring device characterized in that the light source is a semiconductor laser element that oscillates laser light at liquid nitrogen temperature, and the multiple reflection long optical path cell into which the laser light is introduced is open to the atmosphere.

本発明の大気汚染気体装#を図面に基づいて説明すると
、図面は本発明装置の概要図を示し、第1図はその平面
図、第2図はその側面図である。
The air pollution gas system # of the present invention will be explained based on the drawings. The drawings show a schematic view of the device of the present invention, and FIG. 1 is a plan view thereof, and FIG. 2 is a side view thereof.

図中、1は半導体レーザ素子を配置した液体窒素容器、
2は較正用気体セル、3は大気開放型多重反射長光路セ
ル、3′、3“、3′′は凹面鏡、4.4′は赤外線検
出器、5は集光光学系を示す。
In the figure, 1 is a liquid nitrogen container in which a semiconductor laser element is placed;
2 is a gas cell for calibration, 3 is a multiple reflection long optical path cell open to the atmosphere, 3', 3'', and 3'' are concave mirrors, 4 and 4' are infrared detectors, and 5 is a condensing optical system.

液体窒素容器中K Pb1 zCdz 5l−ySey
 1またはPb□)(Mnz s、 y Sey (X
 s ’!は前記と同じ)を配置してレーザ光を発振さ
せる。測定気体の濃度を較正するため、較正用気体セル
にメタン、エタン、ブタンを窒素ガスで稀釈して各々1
100ppとして封入する。3/、P、3″の凹面鏡で
多重反射させ 3/、3/f凹面鏡との間は大気開放す
る。凹面鏡の傾斜角度により多重反射の数を規整し得ら
れる。レーザ光の吸収強度を測定するために、各セルの
後方に液体窒素で装設を使用して測定した値は、大気サ
ンブトを′密封して研究室に持ち帰り測定した値と同じ
であった。
K Pb1 zCdz 5l-ySey in liquid nitrogen container
1 or Pb□) (Mnz s, y Sey (X
s'! is the same as above) and oscillates a laser beam. To calibrate the concentration of the measurement gas, dilute methane, ethane, and butane with nitrogen gas and add them to the calibration gas cell.
Enclose as 100pp. Multiple reflections are performed with 3/, P, and 3" concave mirrors, and the space between the 3/ and 3/f concave mirrors is open to the atmosphere. The number of multiple reflections can be regulated by the inclination angle of the concave mirror. Measure the absorption intensity of the laser beam. The values measured using liquid nitrogen equipment at the back of each cell were the same as those measured after the atmospheric chamber was sealed and taken back to the laboratory.

発明の効果 本発明の装置によると、光化学スモッグの原因となる各
種炭化水素の濃度を、野外現場で迅速適格に、しかも大
型の冷凍機を必要とせず、脣た多重反射長光路セルを大
気開放型にしたため真空排気系を必要としない。従って
、軽量小型となり野外現場を持ち運びながら、容易に測
定し得られる。
Effects of the Invention According to the device of the present invention, the concentration of various hydrocarbons that cause photochemical smog can be quickly determined in the field, without the need for a large refrigerator, and by opening the extended multi-reflection long optical path cell to the atmosphere. Because it is a mold, there is no need for a vacuum exhaust system. Therefore, it is lightweight and compact and can be easily carried around in the field while making measurements.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明装置の概要図で、第1図はその平面図、第
2図はその側面図である。 1 : 半導体レーザ素子を配置した液体窒素容器 2 : 較正用気体セル 3 : 大気開放型多重反射長光路セル3′、3′、3
M:  凹面鏡 4.4’  :  赤外線検出器 5 : 集光光学系 特許出願人 科学技術庁金属材料技術研究所長中  川
  龍  −
The drawings are schematic diagrams of the apparatus of the present invention, with FIG. 1 being a plan view thereof and FIG. 2 being a side view thereof. 1: Liquid nitrogen container in which a semiconductor laser element is placed 2: Calibration gas cell 3: Open to atmosphere multiple reflection long optical path cell 3', 3', 3
M: Concave mirror 4.4': Infrared detector 5: Condensing optical system Patent applicant Ryu Kawa, Director, Institute of Materials Technology, Science and Technology Agency -

Claims (1)

【特許請求の範囲】 1)半導体レーザ素子を光源とし、レーザ光の吸収を利
用して赤外吸収測定を行い大気中の炭化水素濃度を測定
する装置において、波長2〜4μmの間で波長可変であ
り、液体窒素温度でレーザ光を発振する半導体レーザ素
子を光源とし、このレーザ光を導入する多重反射長光路
セルを大気開放型にしたことを特徴とする大気汚染測定
装置。 2)半導体レーザ素子が一般式Pb_1_−_xCd_
xS_1_−_ySe_yまたはPb_1_−_xMn
_xS_1_−_ySe_y(ただし、x,yは0≦x
≦1、0≦y≦1を表する)で示される半導体レーザ素
子である特許請求の範囲第1項記載の測定装置。
[Scope of Claims] 1) In an apparatus that uses a semiconductor laser element as a light source and measures hydrocarbon concentration in the atmosphere by performing infrared absorption measurement using absorption of laser light, the wavelength can be varied between 2 and 4 μm. An air pollution measuring device characterized in that the light source is a semiconductor laser element that oscillates laser light at liquid nitrogen temperature, and the multiple reflection long optical path cell into which the laser light is introduced is open to the atmosphere. 2) The semiconductor laser element has the general formula Pb_1_−_xCd_
xS_1_-_ySe_y or Pb_1_-_xMn
_xS_1_−_ySe_y (however, x, y are 0≦x
1. The measuring device according to claim 1, which is a semiconductor laser element represented by ≦1, 0≦y≦1.
JP62126000A 1987-05-25 1987-05-25 Instrument for measuring air pollution Granted JPS63290947A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62126000A JPS63290947A (en) 1987-05-25 1987-05-25 Instrument for measuring air pollution

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62126000A JPS63290947A (en) 1987-05-25 1987-05-25 Instrument for measuring air pollution

Publications (2)

Publication Number Publication Date
JPS63290947A true JPS63290947A (en) 1988-11-28
JPH0549177B2 JPH0549177B2 (en) 1993-07-23

Family

ID=14924244

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62126000A Granted JPS63290947A (en) 1987-05-25 1987-05-25 Instrument for measuring air pollution

Country Status (1)

Country Link
JP (1) JPS63290947A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04151546A (en) * 1990-10-15 1992-05-25 Anritsu Corp Gas detecting apparatus
WO2009128138A1 (en) * 2008-04-15 2009-10-22 株式会社島津製作所 Gas analyzing apparatus with built-in calibration gas cell
JP2016503904A (en) * 2013-01-23 2016-02-08 カリフォルニア インスティチュート オブ テクノロジー Small tunable laser spectrometer for trace gas detection

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56147034A (en) * 1980-04-17 1981-11-14 Tokyo Electric Power Co Inc:The Gas leakage detector
JPS5812385A (en) * 1981-06-26 1983-01-24 Fujitsu Ltd Emitting light wave length sweep system of wave length variable laser
JPS58143242A (en) * 1982-02-19 1983-08-25 Fujitsu Ltd Detector for leaking gas

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56147034A (en) * 1980-04-17 1981-11-14 Tokyo Electric Power Co Inc:The Gas leakage detector
JPS5812385A (en) * 1981-06-26 1983-01-24 Fujitsu Ltd Emitting light wave length sweep system of wave length variable laser
JPS58143242A (en) * 1982-02-19 1983-08-25 Fujitsu Ltd Detector for leaking gas

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04151546A (en) * 1990-10-15 1992-05-25 Anritsu Corp Gas detecting apparatus
WO2009128138A1 (en) * 2008-04-15 2009-10-22 株式会社島津製作所 Gas analyzing apparatus with built-in calibration gas cell
JP5360053B2 (en) * 2008-04-15 2013-12-04 株式会社島津製作所 Gas analyzer with calibration gas cell
JP2016503904A (en) * 2013-01-23 2016-02-08 カリフォルニア インスティチュート オブ テクノロジー Small tunable laser spectrometer for trace gas detection

Also Published As

Publication number Publication date
JPH0549177B2 (en) 1993-07-23

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