JPS63285185A - Apparatus for pulling up silicon single crystal - Google Patents
Apparatus for pulling up silicon single crystalInfo
- Publication number
- JPS63285185A JPS63285185A JP11848987A JP11848987A JPS63285185A JP S63285185 A JPS63285185 A JP S63285185A JP 11848987 A JP11848987 A JP 11848987A JP 11848987 A JP11848987 A JP 11848987A JP S63285185 A JPS63285185 A JP S63285185A
- Authority
- JP
- Japan
- Prior art keywords
- pulling
- crucible
- single crystal
- carbon
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013078 crystal Substances 0.000 title claims abstract description 47
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims description 35
- 229910052710 silicon Inorganic materials 0.000 title claims description 35
- 239000010703 silicon Substances 0.000 title claims description 35
- 238000010438 heat treatment Methods 0.000 claims abstract description 31
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 27
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 27
- 239000007789 gas Substances 0.000 abstract description 25
- 239000000463 material Substances 0.000 abstract description 8
- 239000010453 quartz Substances 0.000 abstract description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 7
- 230000000694 effects Effects 0.000 abstract description 3
- 239000011261 inert gas Substances 0.000 abstract description 2
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 20
- 239000002210 silicon-based material Substances 0.000 description 20
- 239000001569 carbon dioxide Substances 0.000 description 9
- 229910002092 carbon dioxide Inorganic materials 0.000 description 9
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 description 8
- 229910002091 carbon monoxide Inorganic materials 0.000 description 8
- 230000007547 defect Effects 0.000 description 6
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 238000009413 insulation Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 229910002090 carbon oxide Inorganic materials 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 229920005591 polysilicon Polymers 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- 239000003575 carbonaceous material Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000005204 segregation Methods 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
【発明の詳細な説明】
(1)発明の目的
[産業上の利用分野]
本発明は、シリコン単結晶中し装置に関し、特に加熱用
ヒーターとルツボ装置との間に炭素遮蔽部材を配置する
ことにより加熱用ヒーターから発生されたー・酸化炭素
ガスおよび二酸化炭素ガスがルツボ装置内の溶融シリコ
ン材料に対して混入されることを抑制し、ひいてはシリ
コン単結晶中の炭素の濃度を引り方向すなわち成長方向
の全長にわたり抑制し後続の熱処理工程において微小な
結晶欠陥に成長される潜在状の存在率を引上方向すなわ
ちJ&長方向の全長にわたり抑制してなるシリコン単結
晶引上装置に関するものである。Detailed Description of the Invention (1) Purpose of the Invention [Field of Industrial Application] The present invention relates to a silicon single crystal melting device, and in particular to disposing a carbon shielding member between a heating heater and a crucible device. This suppresses the carbon oxide gas and carbon dioxide gas generated from the heating heater from being mixed into the molten silicon material in the crucible device, and ultimately reduces the concentration of carbon in the silicon single crystal. This invention relates to a silicon single crystal pulling device that suppresses the existence rate of latent crystal defects that grow into minute crystal defects in the subsequent heat treatment process over the entire length in the pulling direction, that is, the J & length direction. .
[従来の技術]
従来この種の微小欠陥の核となる#素あるいは炭ぶ濃度
を均一化するシリコン中結晶引−L装置としては、引り
炉中の温度勾配の調節あるいはルツボ装置の回転の少な
くとも一方により、シリコン単結晶中の酸素の濃度を引
り方向すなわちr&長方向の全長にわたり均一となるよ
う調節し、ひいては後続の熱処理を程において微小な結
晶欠陥に成長する潜在状の存在率を引り方向すなわち成
長方向の全長にわたり均一となるよう調節するものが提
案されていた。[Prior art] Conventionally, a crystal pulling device in silicon for uniformizing the # element or carbon concentration that forms the nucleus of this type of microdefects has been developed by adjusting the temperature gradient in the drawing furnace or rotating the crucible device. By using at least one of the methods, the concentration of oxygen in the silicon single crystal is adjusted to be uniform over the entire length in the pulling direction, that is, the r & length directions, and the potential abundance rate of crystal defects that grow into minute crystal defects during the subsequent heat treatment can be reduced. It has been proposed to adjust the temperature uniformly over the entire length in the pulling direction, that is, the growth direction.
[解決すべき問題点]
しかしながら従来のシリコン単結晶引上装置ては、酸素
についてはある程度均一化できるが、炭素については炭
素の偏析係数が1未満であったので、ルツボ装置内の溶
融シリコン材料中に混入された一酸化炭素およびJ−酸
化炭素の全体としての濃度か時間の経過に伴って増加し
、ひいてはシリコン単結晶かその成長に伴って徐々に炭
素の濃度を増加する欠点かあり、特に終端部分て炭素の
濃度か増大し実用に供せない欠点があった。[Problems to be solved] However, although oxygen can be made uniform to some extent in conventional silicon single crystal pulling equipment, the segregation coefficient of carbon is less than 1, so the molten silicon material in the crucible equipment There is a drawback that the overall concentration of carbon monoxide and J-carbon oxide mixed in the silicon increases over time, and as a result, the concentration of carbon gradually increases as the silicon single crystal grows. In particular, the carbon concentration at the terminal portion increased, making it unsuitable for practical use.
そこで本発明は、これらの欠点を除去するために、ルツ
ボ装置と一酸化炭素ガスないし二酸化炭素ガスの発生量
が構成部材中で最も多い加熱用ヒーターとの間に炭素遮
蔽部材を配置することにより、ルツボ装置内の溶融シリ
コン材料に対して加熱用ヒーターから一酸化炭素ガスお
よび二酸化炭素ガスか直接に飛来することを抑制し、ひ
いてはルツボ装置内の溶融シリコン材料中の一酸化炭素
および二酸化炭素の混入濃度を抑制し、結果的にシリコ
ン単結晶中の炭素の濃度を引上方向すなわち成長方向の
全長にわたり抑制し後続の熱処理■二程て微小な結晶欠
陥に成長する潜在核の存在41を引1一方向すなわち成
長方向の全長にわたり抑制してなるシリコン単結晶引上
装置を提供せんとするものである。Therefore, in order to eliminate these drawbacks, the present invention disposes a carbon shielding member between the crucible device and the heating heater that generates the largest amount of carbon monoxide gas or carbon dioxide gas among the constituent members. , suppresses carbon monoxide gas and carbon dioxide gas from directly flying into the molten silicon material in the crucible device from the heating heater, and further reduces the amount of carbon monoxide and carbon dioxide in the molten silicon material in the crucible device. The contamination concentration is suppressed, and as a result, the concentration of carbon in the silicon single crystal is suppressed over the entire length in the pulling direction, that is, the growth direction. It is an object of the present invention to provide a silicon single crystal pulling device that suppresses the growth of silicon single crystals in one direction, that is, over the entire length in the growth direction.
(2)発明の構成 [問題点の解決手段] 本発明により提供される問題点の解決手段は。(2) Structure of the invention [Means for solving problems] The solution to the problem provided by the present invention is as follows.
「引」二炉中のルツボ装置の周囲に加熱用ヒーターを配
設してなるシリコン単結晶引上装置において、前記加熱
用ヒーターとルツボ装置との間に炭素遮蔽部材を配置し
てなることを特徴とするシリコン弔結晶引]二装置」
である。In a silicon single crystal pulling device in which a heating heater is arranged around a crucible device in a two-furnace, a carbon shielding member is arranged between the heating heater and the crucible device. 2 devices featuring silicon crystals.
[作用]
本発明にかかるシリコン単結晶引L!装置は、加熱用ヒ
ーターとルツボ装置との間に炭素遮蔽部材を配置してお
り、換言すれば加熱用ヒーターから発生される一酸化炭
素ガスおよび二酸化炭素ガスかルツボ装置内の溶融シリ
コン材料に対して混入することを抑制する作用をなし、
ひいてはシリコン単結晶中の炭素の濃度を引上方向すな
わち成長方向の全長にわたり抑制し後続の熱処理工程で
微小な結晶欠陥に成長する潜在核の存在率を引上方向す
なわち成長方向の全長にわたり抑制する作用をなす。[Function] Silicon single crystal drawn L according to the present invention! The device has a carbon shielding member placed between the heating heater and the crucible device, in other words, carbon monoxide gas and carbon dioxide gas generated from the heating heater are protected against the molten silicon material in the crucible device. It has the effect of suppressing contamination by
Furthermore, the concentration of carbon in the silicon single crystal is suppressed over the entire length in the pulling direction, that is, the growth direction, and the abundance rate of latent nuclei that grow into minute crystal defects in the subsequent heat treatment process is suppressed over the entire length in the pulling direction, that is, the growth direction. act.
[実施例]
次に本発明について故付図面を参照しつつ具体的に説I
JIする。[Example] Next, the present invention will be explained in detail with reference to the accompanying drawings.
JI.
第1図は1本発明のシリコン単結晶引上装置の一実施例
を示す断面図である。FIG. 1 is a sectional view showing an embodiment of a silicon single crystal pulling apparatus according to the present invention.
第2図は、同動作説明図であって、横軸にシリコン単結
晶の引り方向すなわち成長方向の長さが先端部分を原点
として目盛られかつ縦軸にシリコン単結晶中の炭素の濃
度が目盛られている。FIG. 2 is an explanatory diagram of the same operation, in which the length of the silicon single crystal in the pulling direction, that is, the growth direction, is scaled with the tip as the origin on the horizontal axis, and the carbon concentration in the silicon single crystal is plotted on the vertical axis. It is scaled.
まず本発明のシリコン単結晶中[二装置の一実施例につ
いて、その構成を詳細に説明する。First, the structure of an embodiment of the silicon single crystal device of the present invention will be described in detail.
すは未発IJ1のシリコン単結晶中に装置で、由J―炉
翻の内部に加熱用ヒーター耳が配設されている。引り1
伊には、L底部に引Lチャンバ(図示せず)に連通され
た引ト孔21か形成されており、ドll′(部に排気手
段としての真空ポンプ(図示せず)に連通された排気孔
22か形成されている。加熱用ヒーター四と引上1廷と
の間には、保温部材凹が配設されている。保温部材並は
、加熱用ヒーターηの外周に位置する保温筒体旧と、加
熱用ヒーター並のL方に位置する保温環体42とを包有
している。加熱用ヒーター耳は、円筒状であって適宜の
電源(図示せず)に対して接続されており、その内部に
は引り1廷のf方外部へ延長され回転昇降装22(1:
l示せず)に対して連結されてなる回転シャフト51の
一端部に固定されたルツボ装置利か配置されている。ル
ツボ装置利は、回転シャフト51に固定された炭素ルツ
ボ(SiCコーティングルツボてあってもよい)52と
、炭素ルッボラ2内に配置されかつシリコン材料53を
収容する石英ルツボ54とを包有している。石英ルツボ
54に収容され溶融されたポリシリコーンなどのシリコ
ン材料53に対しては、先端部に種結晶(図示せず)か
取り付けられた引」mm線部材55か引上チャンバから
引上1並の引し孔21を介して垂下されている。This is a device in the silicon single crystal of unexploited IJ1, and a heater ear for heating is arranged inside the YuJ-furnace. pull 1
A drawing hole 21 is formed at the bottom of L and is connected to a vacuum pump (not shown) as an evacuation means. An exhaust hole 22 is formed.A heat insulating member concavity is provided between the heating heater 4 and the pull-up 1.The heat insulating member is a heat insulating cylinder located on the outer periphery of the heating heater η. The heat retaining ring 42 is located on the L side and is similar to a heating heater.The heater ear is cylindrical and is connected to an appropriate power source (not shown). Inside it, there is a rotating lift 22 (1:
A crucible device is fixed to one end of a rotating shaft 51 (not shown). The crucible device includes a carbon crucible (which may be a SiC coated crucible) 52 fixed to a rotating shaft 51 and a quartz crucible 54 disposed within the carbon rubra 2 and containing a silicon material 53. There is. A silicon material 53 such as polysilicon, which is melted and housed in a quartz crucible 54, is pulled up from a pull-up chamber using a pull-out wire member 55 with a seed crystal (not shown) attached to the tip. It hangs down through the draw hole 21 of.
加熱用ヒーター基とルツボ装2250との間には。between the heater base for heating and the crucible assembly 2250.
絶縁性か高く熱伝導性の良い材料(たとえば炭化珪素質
材料)でてきた炭素遮蔽部材料か配設されており、その
E端部か保温環体42に対して当接されている。したか
って炭素材料で形成された加熱用ヒーター基かルツボ装
fi50のシリコン材料53を加熱中に一酸化炭素ガス
および二酸化炭素ガスを発生しても、それらの−酸化炭
素ガスおよび二酸化炭素ガスかルツボ装と廷内の溶融シ
リコン材料53に対して直接に飛来することを阻止でき
、ひいてはそれらか溶融シリコン材料53に対して混入
することを抑制できる。A carbon shield material made of a highly insulating and thermally conductive material (for example, a silicon carbide material) is provided, and its E end is brought into contact with the heat retaining ring 42 . Therefore, even if carbon monoxide gas and carbon dioxide gas are generated while heating the silicon material 53 of the crucible assembly fi50 from the heating heater base made of carbon material, the carbon oxide gas and carbon dioxide gas will be removed from the crucible. It is possible to prevent the particles from flying directly to the molten silicon material 53 in the container and the chamber, and furthermore, it is possible to prevent them from being mixed into the molten silicon material 53.
更に未発IJ1のシリコン単結晶用に装置の一実施例の
作用について詳細に説明する。Furthermore, the operation of one embodiment of the apparatus for undeveloped IJ1 silicon single crystal will be explained in detail.
引■二炉翻の外部でルツボ装置共の石英ルツボ54中に
シリコン材料53を収容したのち、ルツボ装置煕を回転
昇降装置(図示せず)によって引り炉跋内に配置する。After storing the silicon material 53 in the quartz crucible 54 of the crucible device outside the two drawing furnaces, the crucible device 2 is placed inside the drawing furnace by a rotating lifting device (not shown).
そののち排気r段(図示せず)によって排気孔22から
矢印A方向に向けて10〜2゜トールとなるまで排気し
かつ引上チャンバおよび引1一孔2Iを介して不活性ガ
ス源から不活性ガスたとえばアルゴンガスな矢印B方向
に供給しつつ。Thereafter, the exhaust is evacuated from the exhaust hole 22 in the direction of arrow A by an exhaust stage R (not shown) until the pressure reaches 10 to 2 Torr, and the inert gas source is removed through the pulling chamber and the pulling hole 2I. While supplying an active gas such as argon gas in the direction of arrow B.
回転シャフト51によってルツボ装置陳を回転しながら
、加熱用ヒーター基に対して適宜の電源(図示せず)よ
り適宜の電圧を印加する。これに伴って加熱用ヒーター
基は、ルツボ装置共の石英ルツボ54に収容されたシリ
コン材料53を加熱溶融する。このとき加熱用ヒーター
基の周囲に対して保温部材並が配置されているので、シ
リコン材料53の加熱溶融が効率よく進行せしめられる
。While the crucible device is rotated by the rotating shaft 51, an appropriate voltage is applied to the heating heater base from an appropriate power source (not shown). Along with this, the heating heater base heats and melts the silicon material 53 housed in the quartz crucible 54 of the crucible device. At this time, since the heat insulating members are arranged around the heater base, heating and melting of the silicon material 53 can proceed efficiently.
シリコン材料53が十分に溶融されると、引上1翻の引
−(孔21を介して引上チャンバから引上用線部材55
を!下し、その先端部に取り付けられた種結晶なルツボ
装Hso内の溶融シリコン材料53に対して浸漬したの
ち、引上チャンバに向けて緩除に引りげる。これに伴っ
てシリコン単結晶56が成長形成される。When the silicon material 53 is sufficiently melted, the pulling wire member 55 is removed from the pulling chamber through the hole 21.
of! It is lowered and immersed in the molten silicon material 53 in the crucible Hso, which is a seed crystal attached to the tip thereof, and then slowly pulled toward the pulling chamber. Along with this, a silicon single crystal 56 is grown and formed.
このとき本発明では、加熱用ヒーター基とルツボ装置共
との間に対して炭素遮蔽部材観が配設されているので、
加熱用ヒーター基から一酸化炭素ガスおよび二酸化炭素
ガスが発生されてもルツボ装を廷内の溶融シリコン材料
53に対して直接飛来して混入することを抑制でき、結
果的にシリコン単結晶56中の炭素の濃度を引上方向す
なわち成長方向の全長にわたり抑制でき、後続の熱処理
工程て微小な結晶欠陥にJ&長する潜在核の存在率を引
上方向すなわち成長方向の全長にわたり抑制できる。At this time, in the present invention, since the carbon shielding member is disposed between the heating heater base and the crucible device,
Even if carbon monoxide gas and carbon dioxide gas are generated from the heating heater base, it is possible to prevent the crucible from directly flying into and mixing with the molten silicon material 53 in the chamber. The concentration of carbon can be suppressed over the entire length in the pulling direction, that is, the growth direction, and the existence rate of latent nuclei that J & lengthen to minute crystal defects in the subsequent heat treatment process can be suppressed over the entire length in the pulling direction, that is, the growth direction.
上述した本発明のシリコン弔結晶引上装置厘の作用を一
層理解するために、具体的な数値を挙げて説明する。In order to better understand the operation of the silicon crystal pulling apparatus of the present invention described above, specific numerical values will be given and explained.
第1図に示した本発明のシリコン単結晶引上装置i!1
1Gにおいて、石英ルツボ54中にシリコン材料53と
してのポリシリコーンな:15kgだけ収容した状態て
、引IJji20内を15)−−ルに保ち、アルゴンガ
スを供給しつつ、加熱用ヒーター基に対して48ボルト
の電圧を印加し1800ベアの電流を流した。Silicon single crystal pulling apparatus i! of the present invention shown in FIG. 1
At 1G, with only 15 kg of polysilicon as the silicon material 53 housed in the quartz crucible 54, the inside of the IJji 20 was kept at 15)--, and while supplying argon gas, it was heated to the heater base for heating. A voltage of 48 volts was applied and a current of 1800 bears was applied.
このとき回転シャフト51の回転速度を適宜に選択し直
径が125■■でかつ方位(1,0,0)のシリコン単
結晶56を成長せしめたところ、そのシリコン単結晶5
6中に含まれる炭素の濃度は第2図に実線で示すような
結果となった。At this time, the rotational speed of the rotating shaft 51 was appropriately selected to grow a silicon single crystal 56 with a diameter of 125mm and an orientation of (1,0,0).
The concentration of carbon contained in 6 was as shown by the solid line in FIG.
比較例として、炭素遮蔽部材すの配置されていない従来
のシリコン単結晶引上装置を用いて成長せしめたシリコ
ン単結晶中に含まれる)RAの濃度が破線で示されてい
るが、本発明によれば、この比較例に対し特にシリコン
単結晶の終端部分で炭素の濃度を抑制てき、ひいてはシ
リコン単結晶の先端部分から終端部分までその炭素の濃
度をほぼ一定とてきる。As a comparative example, the concentration of RA (contained in a silicon single crystal grown using a conventional silicon single crystal pulling apparatus without a carbon shielding member) is shown by a broken line. According to this comparative example, the carbon concentration is suppressed particularly at the terminal end of the silicon single crystal, and the carbon concentration is kept almost constant from the tip to the terminal end of the silicon single crystal.
なおヒ述においては保温部材、i!!か使用されている
か1本発明はこれに限定されるものではなく、所tiノ
によってはこれを除去してもよい。In addition, in the above, the heat insulation member, i! ! The present invention is not limited to this, and it may be removed depending on the location.
またルツボ装置社か回転シャフト51によって回転され
ているか、未発IJ1はこれに限定されるものではなく
、所望によっては回転シャフト51を除去する構成とし
てもよい。Furthermore, the unreleased IJ1 is not limited to being rotated by the rotating shaft 51 or may be configured to remove the rotating shaft 51 if desired.
(3)発明の効果
り述より明らかなように本発明は、引り炉中のルツボ装
置の周囲に加熱用ヒーターを配設してなるシリコン単結
晶用l二装置であって、加熱用ヒーターとルツボ装置と
の間に炭素遮蔽部材を配置し
てなるので。(3) Effects of the Invention As is clear from the description, the present invention provides a silicon single crystal device comprising a heating heater arranged around a crucible device in a drawing furnace. A carbon shielding member is placed between the crucible and the crucible device.
(i)加熱用ヒーターから発生される一酸化炭素ガスお
よび二酸化炭素ガスがルツボ装置内の溶融シリコン材料
に対して直接に飛来することを抑制てき、ひいては溶融
シリコン材料に対してそれらが混入することを抑制でき
る効果
を右し、結果的に
(ii)シリコン巾結晶中の炭素の濃度を、成長の終端
部分でも十分に抑制でき、ひいてはその濃度を先端部分
から終端部分までほぼ一定に維持できる効果
を有する。(i) Carbon monoxide gas and carbon dioxide gas generated from the heating heater are suppressed from flying directly to the molten silicon material in the crucible device, and as a result, they are prevented from contaminating the molten silicon material. As a result, (ii) the carbon concentration in the silicon width crystal can be sufficiently suppressed even at the end of growth, and the concentration can be maintained almost constant from the tip to the end. has.
第1図は本発明の一実施例を示す断面図、第2図は同動
作説明図である。
10・・・・・・・・・・・・・・・・シリコン弔結晶
引に装置翻・・・・・・・・・・・・・・・・引」二炉
2■・・・・・・・・・・・・・・引り孔22・・・・
・・・・・・・・・・排気孔耳・・・・・・・・・・・
・・・・・加熱用ヒータ赳・・・・・・・・・・・・・
・・・保温部材41・・・・・・・・・・・・・・保温
筒体42・・、・・・・・・・・・・・・保温環体50
・・・・・・・・・・・・・・・・ルツボ装置5I・・
・・・・・・・・・・・・回転シャフト52・・・・・
・・・・・・・・・炭素ルツボ53・・・・・・・・・
・・・・・シリコン材料54・・・・・・・・・・・・
・・石英ルツボ55・・・・・・・・・・・・・・引り
用m部材60・・・・・・・・・・・・・・・・炭素遮
蔽部材特許出願人 東芝セラミックス株式会社代理人
弁理ト 工 藤 隆 夫第1図FIG. 1 is a sectional view showing an embodiment of the present invention, and FIG. 2 is an explanatory diagram of the same operation. 10・・・・・・・・・・・・・・・Transfer the device to the silicon crystal crystal・・・・・・・・・・・・・・・Two furnaces 2 ■・・・・・・・・・・・・・・・Draw hole 22・・・・
・・・・・・・・・Exhaust hole ear・・・・・・・・・・・・
・・・・・・Heating heater 赳・・・・・・・・・・・・
...Thermal insulation member 41...Thermal insulation cylinder body 42...Thermal insulation ring body 50
・・・・・・・・・・・・・・・ Crucible device 5I...
......Rotating shaft 52...
・・・・・・・・・Carbon crucible 53・・・・・・・・・
・・・・・・Silicon material 54・・・・・・・・・・・・
・・Quartz crucible 55・・・・・・・・・・・・・M member for pulling 60・・・・・・・・・・・・・Carbon shielding member Patent applicant Toshiba Ceramics Co., Ltd. Company Representative Patent Attorney Takao Kudo Figure 1
Claims (1)
てなるシリコン単結晶引上装置において、前記加熱用ヒ
ーターとルツボ装置との間に炭素遮蔽部材を配置してな
ることを特徴とするシリコン単結晶引上装置。A silicon single crystal pulling device comprising a heating heater arranged around a crucible device in a pulling furnace, characterized in that a carbon shielding member is arranged between the heating heater and the crucible device. Silicon single crystal pulling equipment.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11848987A JPS63285185A (en) | 1987-05-15 | 1987-05-15 | Apparatus for pulling up silicon single crystal |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11848987A JPS63285185A (en) | 1987-05-15 | 1987-05-15 | Apparatus for pulling up silicon single crystal |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63285185A true JPS63285185A (en) | 1988-11-22 |
Family
ID=14737941
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11848987A Pending JPS63285185A (en) | 1987-05-15 | 1987-05-15 | Apparatus for pulling up silicon single crystal |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63285185A (en) |
-
1987
- 1987-05-15 JP JP11848987A patent/JPS63285185A/en active Pending
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