JPS6327025A - Washing method for semiconductor wafer - Google Patents
Washing method for semiconductor waferInfo
- Publication number
- JPS6327025A JPS6327025A JP17048986A JP17048986A JPS6327025A JP S6327025 A JPS6327025 A JP S6327025A JP 17048986 A JP17048986 A JP 17048986A JP 17048986 A JP17048986 A JP 17048986A JP S6327025 A JPS6327025 A JP S6327025A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- carrier
- cleaning
- wafers
- washed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims description 29
- 238000000034 method Methods 0.000 title claims description 17
- 238000005406 washing Methods 0.000 title abstract 7
- 235000012431 wafers Nutrition 0.000 claims abstract description 77
- 238000004140 cleaning Methods 0.000 claims description 41
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 6
- 238000007796 conventional method Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000003860 storage Methods 0.000 description 3
- 101500027295 Homo sapiens Sperm histone HP3 Proteins 0.000 description 2
- 102400000926 Sperm histone HP3 Human genes 0.000 description 2
- 239000000969 carrier Substances 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000007723 transport mechanism Effects 0.000 description 2
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
Landscapes
- Cleaning In General (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【発明の詳細な説明】
崖1上曵且旦分立
本発明は半導体装置の製造工程における半導体ウェーへ
の洗浄方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for cleaning semiconductor wafers in the manufacturing process of semiconductor devices.
l米坐肢止
半導体装置の製造工程において、半導体ウェーハの酸化
或いは拡散処理工程の前処理として、上記半導体ウェー
ハの表面を純水等で洗浄するのが一般的である。この半
導体ウェーハの洗浄により上記酸化或いは拡散工程で半
導体ウェーハ表面に形成される膜厚の均−化及び膜質の
向上を図うている。1. In the process of manufacturing a semiconductor device for sitting, it is common to wash the surface of the semiconductor wafer with pure water or the like as a pretreatment for the oxidation or diffusion treatment process of the semiconductor wafer. This cleaning of the semiconductor wafer is intended to equalize the thickness and improve the quality of the film formed on the surface of the semiconductor wafer in the oxidation or diffusion process.
上記半導体ウェーハ洗浄の従来方法を第2図を参照しな
がら説明する。同図において、(1)は半導体ウェーハ
〔以下単にウェーハと称す〕、(2)は複数のウェーハ
(1)(1)・・・を縦方向に定ピンチで整列保持する
、例えばテフロン〔登録商標〕製の枠状治具〔以下キャ
リアと称す〕、(3)は上記キャリア(2)を所定の個
数収納した箱状の搬送ボックスで、半導体装置の製造に
おける各工程間でのウェーハ搬送に使用される。(4)
はウェーハ洗浄処理部で、図示しないが前記ウェーハ(
1)の表面を洗浄する純水等の洗浄用薬液が収容された
洗浄槽が配設される。The conventional method for cleaning semiconductor wafers will be explained with reference to FIG. In the figure, (1) is a semiconductor wafer (hereinafter simply referred to as a wafer), (2) is a semiconductor wafer (hereinafter simply referred to as a wafer), and (2) is a semiconductor wafer (1) (1)... that is aligned and held vertically with a fixed pinch, for example, Teflon (registered trademark). [hereinafter referred to as carrier], (3) is a box-shaped transport box that stores a predetermined number of carriers (2), and is used for transporting wafers between each process in the manufacture of semiconductor devices. be done. (4)
is a wafer cleaning processing section, which is not shown in the figure, but the wafer (
1) A cleaning tank containing a cleaning chemical such as pure water for cleaning the surface is provided.
このウェーハ洗浄の従来方法では、第2図に示すように
前工程から搬送されてきた搬送ボックス(3)を搬入ポ
ジションP1にて配置し、上記搬送ボックス(3)から
ウェーハ(1)(1)・・・を整列保持したキャリア(
2)を取出して供給ポジションP2に配置する。この供
給ポジションP2に配置されたキャリア(2)を、適宜
な搬送機構〔図示せず〕によりウェーハ洗浄処理部(4
)の洗浄槽に移送する。そしてこの洗浄槽内の純水中に
上記キャリア(2)を浸漬し、キャリア(2)を純水中
で揺動させる等してウェーハ(1)(1)・・・をキャ
リア(2)ごと洗浄処理する。このウェーハ洗浄後、洗
浄済みのウェーハ(1)(1)・・・が整列保持された
キャリア(2)を、前記搬送機構により洗浄槽から取出
して排出ポジションP3に配置する、そしてこの排出ポ
ジションP3に配置されたキャリア(2)を、搬入ポジ
ションP!から搬出ポジションP4へ転送された緊送ボ
ックス(3)内に収納して乾燥工程等の次工程に移送す
る。In this conventional method of wafer cleaning, as shown in FIG. A carrier that holds ... in alignment (
2) is taken out and placed at supply position P2. The carrier (2) placed at this supply position P2 is transferred to the wafer cleaning processing section (4) by an appropriate transport mechanism (not shown).
) to the cleaning tank. Then, the carrier (2) is immersed in pure water in this cleaning tank, and the wafers (1) (1)... are removed together with the carrier (2) by shaking the carrier (2) in the pure water, etc. Clean and process. After this wafer cleaning, the carrier (2) in which the cleaned wafers (1), (1), etc. are aligned and held is taken out from the cleaning tank by the transport mechanism and placed at the discharge position P3, and this discharge position P3 The carrier (2) placed in the carry-in position P! From there, it is stored in an express delivery box (3) transferred to a carry-out position P4, and then transferred to the next process such as a drying process.
溌」し白W決↓jむトとす11わ1点
ところで、上記ウェーハ洗浄の従来方法では、複数のウ
ェーハ(1)(1)・・・をキャリア(2)に整列保持
した状態で、該キャリア(2)と共に洗浄している。従
って上記ウェーハ(1)(1)・・・とキャリア(2)
との接触部分近傍で、ウェーハ(1)(1)・・・に未
洗浄部分が残存して該ウェーハ(1)(1)・・・全体
に亘って均一に洗浄するのが困難であった。更に上記キ
ャリア(2)の汚れも無視することができず、このキャ
リア(2)の汚れでウェーハ(1)(1)・・・が汚染
される虞もあった。By the way, in the conventional method of wafer cleaning described above, with a plurality of wafers (1), (1), etc. being aligned and held on the carrier (2), It is washed together with the carrier (2). Therefore, the above wafers (1) (1)... and carrier (2)
Uncleaned areas remained on the wafer (1) (1) near the contact area with the wafer (1) (1), making it difficult to uniformly clean the entire wafer (1) (1). . Furthermore, the contamination of the carrier (2) cannot be ignored, and there is a risk that the wafers (1), (1), etc. may be contaminated by the contamination of the carrier (2).
また、搬送ボックス(3)についても、その内部を定期
的に清掃するのみであるため、前記搬入ポジションP1
から搬出ポジションP4に単に転送されただけの搬送ボ
ックス(3)内には、ゴミ等の異物が存在する確率が高
く、上記用送ボックス(3)内に収納された洗浄済みの
ウェーハ(1)(1)・・・が汚染されることもあった
。Furthermore, since the inside of the transport box (3) is only cleaned periodically,
There is a high probability that foreign objects such as dust are present in the transport box (3) that has simply been transferred from the transport box (3) to the transport position P4, and the cleaned wafer (1) stored in the transport box (3) is (1) ... was sometimes contaminated.
占 ”° るための
本発明は前記間通点に鑑みて提案されたもので、この問
題点を解決するための技術的手段は、治具内に定ピッチ
で整列保持された複数の半導体ウェーハを洗浄処理する
に際し、上記半導体ウェーハを治具内から取出して洗浄
処理すると共に、この半導体ウェーハ洗浄と並行して上
記治具を洗浄処理し、その治具内に上記半導体ウェーハ
を収納するようにした半導体ウェーへの洗浄方法である
。The present invention has been proposed in view of the above-mentioned problem, and the technical means for solving this problem is to hold a plurality of semiconductor wafers aligned at a constant pitch in a jig. When cleaning the semiconductor wafer, the semiconductor wafer is taken out from the jig and cleaned, the jig is cleaned in parallel with the semiconductor wafer cleaning, and the semiconductor wafer is stored in the jig. This is a cleaning method for semiconductor wafers.
皿
本発明方法によれば、治具内に整列保持された各ウェー
ハを該治具から分離し、その各ウェーハと治具とを夫々
単独で別々に洗浄処理することにより上記両者を隅々ま
で均一に洗浄する、そして洗浄済みのウェーハを、この
ウェーハとは別に洗浄された治具に収納することにより
上記ウェーハが汚染されることは皆無に等しくなる。According to the method of the present invention, each wafer that is aligned and held in a jig is separated from the jig, and each wafer and the jig are individually and separately cleaned, thereby thoroughly cleaning both of them. By uniformly cleaning the wafer and storing the cleaned wafer in a jig that is cleaned separately from the wafer, the wafer is almost never contaminated.
遺J1阻
本発明に係る半導体ウェーへの洗浄方法の一実施例を第
1図を参照しながら説明する。第2図と同一部分、又は
相当部分には同一参照符号を付してその説明は省略する
。尚、第1図における(5)(6)はキャリア及び搬送
ボックス洗浄処理部で、図示しないが両者はキャリア(
2)及び搬送ボックス(3)を洗浄する純水等の洗浄用
薬液が収容された洗浄槽が配設される。An embodiment of the method for cleaning a semiconductor wafer according to the present invention will be described with reference to FIG. The same or equivalent parts as in FIG. 2 are given the same reference numerals, and their explanation will be omitted. Note that (5) and (6) in FIG.
2) and the transport box (3), a cleaning tank containing a cleaning chemical solution such as pure water is provided.
本発明方法では、第1図に示すように前工程から搬送さ
れてきた搬送ボックス(3)を搬入ポジションP1にて
配置し、上記搬送ボックス(3)かろウェーハ(1)(
1)・・・を整列保持したキャリア(2)を取出して供
給ポジションP2に配置する。更にこの供給ポジション
P2に配置されたキャリア(2)をウェーハ取出しポジ
ションP2゛に移送し、このポジションP2”にてキャ
リア(2)から各ウェーハ(1)(1)・・・をウェー
ハ搬入機1】〔図示せず〕により取出してウェーハ洗浄
処理部(4)の洗浄槽内に移し替える。この洗浄槽内で
は、移し替えられたウェーハ(1)(1)・・・を純水
中で整列保持するウェーハ収納部〔図示せず〕を設ける
等して、上記ウェーハ(1)(1)・・・のみを洗浄処
理する。In the method of the present invention, as shown in FIG.
1) Take out the carrier (2) holding the... in alignment and place it at the supply position P2. Furthermore, the carrier (2) placed at this supply position P2 is transferred to the wafer unloading position P2'', and each wafer (1) (1)... is transferred from the carrier (2) to the wafer loading machine 1 at this position P2''. ] [not shown] and transferred to the cleaning tank of the wafer cleaning processing section (4).In this cleaning tank, the transferred wafers (1) (1)... are aligned in pure water. A wafer storage section (not shown) is provided to hold the wafers, and only the wafers (1), (1), etc. are cleaned.
一方、前記ウェーハ取出しポジションP2′にてウェー
ハ(1)(1)・・・が取出された空のキャリア(2°
)を、キャリア洗浄処理部(5)の洗浄槽に移送し、こ
のキャリア洗浄処理部(5)にて上述したウェーハ洗浄
と並行してキャリア(2゛)のみを洗浄する。上記キャ
リア洗浄処理部(5)にて洗浄されて取出された洗浄済
みのキャリア(2″)は移送されてウェーハ収納ポジシ
ョンP、’ に配置される。このウェーハ収納ポジショ
ンP3′では、ウェーハ洗浄処理部(4)にて洗浄され
たウェーハ(1)(1)・・・をウェーハ搬出礪構〔図
示せず〕により取出して上述した洗浄済みのキャリア(
2°)内に整列収納する。On the other hand, the empty carrier (2°
) is transferred to the cleaning tank of the carrier cleaning processing section (5), where only the carrier (2') is cleaned in parallel with the above-mentioned wafer cleaning. The cleaned carrier (2'') that has been cleaned and taken out in the carrier cleaning processing section (5) is transferred and placed in the wafer storage position P,'.In this wafer storage position P3', the wafer cleaning process is performed. The wafers (1) (1)... cleaned in section (4) are taken out by a wafer unloading mechanism (not shown) and placed in the cleaned carrier (
2°).
また、搬入ポジションP!に配置されていた搬送ボック
ス(3)を搬送ボックス洗浄処理部(6)の洗浄槽に移
送し、前述したウェーハ及びキャリア洗浄と並行して搬
送ボックス(3)を洗浄する。この搬送ボックス洗浄処
理部(6)から取出された洗浄済みの搬送ボックス(3
)は搬出ポジションP4に配置され、この搬出ポジショ
ンP4にて上述した洗浄済みのウェーハ(1)(1)・
・・が整列保持されたキ′ヤリア(2)を、上記搬送ボ
ックス(3)に格納して次工程へ搬送する。Also, loading position P! The transport box (3) placed in the transport box (3) is transferred to the cleaning tank of the transport box cleaning processing section (6), and the transport box (3) is cleaned in parallel with the wafer and carrier cleaning described above. The cleaned transport box (3) taken out from the transport box cleaning processing section (6)
) is placed at the carry-out position P4, and at this carry-out position P4, the above-mentioned cleaned wafers (1), (1), and
The carrier (2) in which the ... are aligned and held is stored in the transport box (3) and transported to the next process.
発旦q泣果
本発明方法によれば、ウェーハと治具とを単独で別々に
洗浄処理することにより上記両者を隅々まで均一に洗浄
することが実現可能となり、従来のように洗浄済みウェ
ーハが汚れたキャリアで再汚染されることは皆無となっ
て、歩留まりが大幅に向上すると共に、信頼性の高い製
品を提供できる。According to the method of the present invention, by cleaning the wafer and the jig individually and separately, it is possible to uniformly clean the wafer and the jig to every corner. There is no possibility that the carrier will be recontaminated with dirty carriers, resulting in a significant improvement in yield and the provision of highly reliable products.
第1図は本発明に係る半導体ウェーハの洗浄方法の一実
施例を説明するための概略構成図、第2図は半導体ウェ
ーハ洗浄の従来方法を説明するための概略構成図である
。
(1’) −・半導体ウェーハ〔ウェーハ」、(2)
(2”)−治具〔キャリア〕。
特 許 出 願 人 開西日本電気株式会社代
理 人 江 原 省 吾第1r
A
、f明方jムリ麿、略潴人図
第2図
に
P4FIG. 1 is a schematic diagram for explaining an embodiment of the semiconductor wafer cleaning method according to the present invention, and FIG. 2 is a schematic diagram for explaining a conventional semiconductor wafer cleaning method. (1') -・Semiconductor wafer [wafer], (2)
(2”) - Jig [carrier]. Patent applicant: Kaisai NEC Co., Ltd.
Rinto Gangwon Province Go 1st r.
A, f Meikata J Murimaro, P4 in Figure 2
Claims (1)
ウェーハを洗浄処理するに際し、 上記半導体ウェーハを治具内から取出して洗浄処理する
と共に、この半導体ウェーハ洗浄と並行して上記治具を
洗浄処理し、その治具内に上記半導体ウェーハを収納す
るようにしたことを特徴とする半導体ウェーハの洗浄方
法。(1) When cleaning a plurality of semiconductor wafers that are aligned and held at a fixed pitch in a jig, the semiconductor wafers are taken out from the jig and cleaned, and the jig is used in parallel with cleaning the semiconductor wafers. 1. A method for cleaning a semiconductor wafer, comprising: cleaning the semiconductor wafer; and storing the semiconductor wafer in the jig.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61170489A JPH0821566B2 (en) | 1986-07-18 | 1986-07-18 | Cleaning method for semiconductor wafer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61170489A JPH0821566B2 (en) | 1986-07-18 | 1986-07-18 | Cleaning method for semiconductor wafer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6327025A true JPS6327025A (en) | 1988-02-04 |
JPH0821566B2 JPH0821566B2 (en) | 1996-03-04 |
Family
ID=15905905
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61170489A Expired - Fee Related JPH0821566B2 (en) | 1986-07-18 | 1986-07-18 | Cleaning method for semiconductor wafer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0821566B2 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0276227A (en) * | 1988-09-12 | 1990-03-15 | Sugai:Kk | Method and device for cleaning and drying substrate |
JPH05217975A (en) * | 1992-01-08 | 1993-08-27 | Nec Corp | Semiconductor wet processor |
JPH06252126A (en) * | 1993-02-26 | 1994-09-09 | Sugai:Kk | Method and system cleaning substrate |
JPH0686336U (en) * | 1993-05-21 | 1994-12-13 | 住友精密工業株式会社 | Carrier cleaning equipment |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56161987A (en) * | 1980-05-09 | 1981-12-12 | Mitsubishi Heavy Ind Ltd | Bottle washer |
JPS6059747A (en) * | 1983-09-12 | 1985-04-06 | Mitsubishi Electric Corp | Treating device of semiconductor wafer |
JPS6143430A (en) * | 1984-08-07 | 1986-03-03 | Mitsubishi Electric Corp | Cassette cleaner |
-
1986
- 1986-07-18 JP JP61170489A patent/JPH0821566B2/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56161987A (en) * | 1980-05-09 | 1981-12-12 | Mitsubishi Heavy Ind Ltd | Bottle washer |
JPS6059747A (en) * | 1983-09-12 | 1985-04-06 | Mitsubishi Electric Corp | Treating device of semiconductor wafer |
JPS6143430A (en) * | 1984-08-07 | 1986-03-03 | Mitsubishi Electric Corp | Cassette cleaner |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0276227A (en) * | 1988-09-12 | 1990-03-15 | Sugai:Kk | Method and device for cleaning and drying substrate |
JPH05217975A (en) * | 1992-01-08 | 1993-08-27 | Nec Corp | Semiconductor wet processor |
JPH06252126A (en) * | 1993-02-26 | 1994-09-09 | Sugai:Kk | Method and system cleaning substrate |
JPH0686336U (en) * | 1993-05-21 | 1994-12-13 | 住友精密工業株式会社 | Carrier cleaning equipment |
Also Published As
Publication number | Publication date |
---|---|
JPH0821566B2 (en) | 1996-03-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |