JPS63265890A - Production of thin diamond film or thin diamond-like film - Google Patents
Production of thin diamond film or thin diamond-like filmInfo
- Publication number
- JPS63265890A JPS63265890A JP9783487A JP9783487A JPS63265890A JP S63265890 A JPS63265890 A JP S63265890A JP 9783487 A JP9783487 A JP 9783487A JP 9783487 A JP9783487 A JP 9783487A JP S63265890 A JPS63265890 A JP S63265890A
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- diamond
- base body
- film
- producing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 229910003460 diamond Inorganic materials 0.000 title claims abstract description 30
- 239000010432 diamond Substances 0.000 title claims abstract description 30
- 238000004519 manufacturing process Methods 0.000 title claims description 12
- 239000010409 thin film Substances 0.000 claims abstract description 44
- 239000002994 raw material Substances 0.000 claims abstract description 19
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 15
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 15
- 239000000758 substrate Substances 0.000 claims description 26
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 16
- 239000007789 gas Substances 0.000 claims description 15
- 239000012495 reaction gas Substances 0.000 claims description 9
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 8
- 229930195733 hydrocarbon Natural products 0.000 claims description 8
- 229910052757 nitrogen Inorganic materials 0.000 claims description 8
- 239000001301 oxygen Substances 0.000 claims description 8
- 229910052760 oxygen Inorganic materials 0.000 claims description 8
- 239000001257 hydrogen Substances 0.000 claims description 7
- 229910052739 hydrogen Inorganic materials 0.000 claims description 7
- 150000002430 hydrocarbons Chemical class 0.000 claims description 5
- 239000011261 inert gas Substances 0.000 claims description 5
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 claims description 4
- -1 alicyclic hydrocarbons Chemical class 0.000 claims description 4
- 150000001299 aldehydes Chemical class 0.000 claims description 3
- 150000004982 aromatic amines Chemical class 0.000 claims description 3
- 150000004945 aromatic hydrocarbons Chemical class 0.000 claims description 3
- 150000002576 ketones Chemical class 0.000 claims description 3
- 229920006395 saturated elastomer Polymers 0.000 claims description 3
- 229930195734 saturated hydrocarbon Natural products 0.000 claims description 3
- 229930195735 unsaturated hydrocarbon Natural products 0.000 claims description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 2
- ZBCBWPMODOFKDW-UHFFFAOYSA-N diethanolamine Chemical compound OCCNCCO ZBCBWPMODOFKDW-UHFFFAOYSA-N 0.000 claims description 2
- 150000001732 carboxylic acid derivatives Chemical class 0.000 claims 1
- 238000000151 deposition Methods 0.000 claims 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 claims 1
- 239000010408 film Substances 0.000 abstract description 14
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 abstract description 8
- 230000015572 biosynthetic process Effects 0.000 abstract description 5
- 150000002500 ions Chemical class 0.000 abstract description 3
- 150000001768 cations Chemical class 0.000 abstract description 2
- 238000001816 cooling Methods 0.000 abstract description 2
- 230000005284 excitation Effects 0.000 abstract description 2
- 238000010438 heat treatment Methods 0.000 abstract description 2
- 238000006243 chemical reaction Methods 0.000 abstract 1
- 238000000354 decomposition reaction Methods 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 5
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 241000209094 Oryza Species 0.000 description 3
- 235000007164 Oryza sativa Nutrition 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 239000000376 reactant Substances 0.000 description 3
- 235000009566 rice Nutrition 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000004913 activation Effects 0.000 description 2
- 150000001735 carboxylic acids Chemical class 0.000 description 2
- 150000002431 hydrogen Chemical class 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- 238000002441 X-ray diffraction Methods 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- 239000007795 chemical reaction product Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 239000012776 electronic material Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- 238000002065 inelastic X-ray scattering Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 239000003921 oil Substances 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000001878 scanning electron micrograph Methods 0.000 description 1
- 238000005979 thermal decomposition reaction Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明はマイクロ波プラズマの利用によるダイヤモンド
薄膜又はダイヤモンド状薄膜の製造方法に関するもので
ある。DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a method for producing diamond thin films or diamond-like thin films using microwave plasma.
従来の技術
ダイヤモンドは、電気絶縁性、熱伝導性、並びに硬度及
び耐摩耗性に優れた物質であることから、切削部材や耐
摩耗部材といった従来の用途に加え、近年では、その特
性を活かし、半導体の高集積化等に伴い熱伝導性の良い
絶縁膜1表面保護膜、またバンドギャップの大きい半導
体といった電子材料としても注目され、ダイヤモンドの
薄膜化とダイヤモンド状薄膜の形成を特に効率的に大量
に合成する試みが成されている。Conventional technology Diamond is a material with excellent electrical insulation, thermal conductivity, hardness, and wear resistance.In addition to its traditional uses as cutting parts and wear-resistant parts, in recent years diamond has been used to take advantage of its properties. With the increasing integration of semiconductors, it is attracting attention as an electronic material such as an insulating film with good thermal conductivity, a surface protective film, and a semiconductor with a large band gap. Attempts have been made to synthesize
ダイヤモンド状薄膜とは、ダイヤモンド結晶構造と同定
は出来ないが、アモルファス的構造をとり、ダイヤモン
ド類似の性質例えばビッカース硬度が、3oOoKg/
++l112以上、赤外光透過度カ高い等の性質を有す
るものを指す。Although a diamond-like thin film cannot be identified as a diamond crystal structure, it has an amorphous structure and has properties similar to diamond, such as a Vickers hardness of 3oOoKg/
++112 or more, refers to those having properties such as high infrared light transmittance.
従来ダイヤモンド薄膜の製造方法としては、多数の方法
が提案されている。第2図a、bに従来の装置の代表例
を示した。第2図aは熱電子数対材を用いる場合、第2
図すはマイクロ波プラズマ放電を用いる場合の装置図で
ある。ともに1は真空槽、2は導波管、3はガス導入部
、6は基体、6は基体ホルダー、8は熱電子放射材であ
る。真空槽1内にガス導入部3から炭化水素と水素の混
合ガスを導入し、排気を行うことで真空槽1内を所要の
圧力(1〜数百Torτ)に維持する。導入した混合ガ
スを、aの場合は熱電子放射材48による熱分解、bの
場合は導波管42から導入したマイクロ波を用いたプラ
ズマ放電により活性化させて、イオン、ラジカル等の励
起炭素をつくり、基体46上にダイヤモンド薄膜又はダ
イヤモンド状薄膜を形成する。この際、加熱又は冷却を
出来るようにした基体ホルダー〇を用いて基体温度を調
節すると、低温ではダイヤモンド状薄膜、高温ではダイ
ヤモンド薄膜が得られる。(特公昭eo−54995等
)
しかし何れの方法においても実用化に適した良質の薄膜
は得られていない。Conventionally, many methods have been proposed for producing diamond thin films. Representative examples of conventional devices are shown in FIGS. 2a and 2b. Figure 2a shows that when using thermionic number pair, the second
The figure is a diagram of an apparatus in which microwave plasma discharge is used. 1 is a vacuum chamber, 2 is a waveguide, 3 is a gas introduction section, 6 is a substrate, 6 is a substrate holder, and 8 is a thermionic emitting material. A mixed gas of hydrocarbon and hydrogen is introduced into the vacuum chamber 1 from the gas introduction part 3, and the interior of the vacuum chamber 1 is maintained at a required pressure (1 to several hundred Torrτ) by performing exhaust. The introduced mixed gas is activated by thermal decomposition by the thermionic radiation material 48 in case a, or by plasma discharge using microwaves introduced from the waveguide 42 in case b, to generate excited carbon such as ions and radicals. A diamond thin film or a diamond-like thin film is formed on the substrate 46. At this time, if the temperature of the substrate is adjusted using a substrate holder 〇 that can be heated or cooled, a diamond-like thin film can be obtained at low temperatures, and a diamond-like thin film can be obtained at high temperatures. (Japanese Patent Publication No. Sho EO-54995, etc.) However, a thin film of good quality suitable for practical use has not been obtained by any of these methods.
発明が解決しようとする問題点
このような従来の技術では、非常に膜形成速度が遅いと
いう欠点を有していた。この問題点を解決するため本発
明は、膜形成速度が速いダイヤモンド薄膜およびその製
造方法を提供するものである。Problems to be Solved by the Invention These conventional techniques have the disadvantage that the film formation rate is extremely slow. In order to solve this problem, the present invention provides a diamond thin film that can be formed at a high rate and a method for manufacturing the same.
問題点を解決するための手段
本発明は上記問題点を解決するために、真空槽内に少な
くとも一種類の炭素を含まない反応ガスと少なくとも炭
素を含む原料を導入し、高周波放電によりプラズマを発
生させ、正の電圧を印加した基体表面上にダイヤモンド
薄膜又はダイヤモンド状薄膜を析出させるものである。Means for Solving the Problems In order to solve the above problems, the present invention introduces at least one type of carbon-free reaction gas and at least a carbon-containing raw material into a vacuum chamber, and generates plasma by high-frequency discharge. A diamond thin film or a diamond-like thin film is deposited on the substrate surface to which a positive voltage is applied.
作 用
本発明は上記した構成によシ、基体に正の電圧を印加す
ることで、膜形成速度が非常に高くなることを見い出し
た。反応ガスとして不活性ガスを用いることにより、プ
ラズマを容易に作成し、活性化を促すことが出来る。ま
た反応ガスとして水素、酸素、窒素のうち少なくとも1
つを用いると、ダイヤモンド構造とは異なる部分を高速
で除去することがわかった。また炭素を含む原料の活性
化にも寄与し、より高速化がはかられる。また、炭素を
含む原料として、飽和系または不飽和系炭化水素、芳香
族炭化水素、脂環式炭化水素、多核炭化水素の少なくと
も1つを含むものを用いると、より不純物濃度の小さい
薄膜を得る。Effects The present invention has found that with the above-described configuration, by applying a positive voltage to the substrate, the film formation rate can be greatly increased. By using an inert gas as a reactive gas, plasma can be easily created and activation can be promoted. In addition, at least one of hydrogen, oxygen, and nitrogen is used as a reaction gas.
It was found that parts different from the diamond structure can be removed at high speed by using one. It also contributes to the activation of carbon-containing raw materials, making it possible to achieve higher speeds. Furthermore, if a material containing at least one of saturated or unsaturated hydrocarbons, aromatic hydrocarbons, alicyclic hydrocarbons, and polynuclear hydrocarbons is used as the carbon-containing raw material, a thin film with a lower impurity concentration can be obtained. .
また、炭素を含む原料として、アルコール、エーテル、
アルデヒド、ケトン、カルボン酸等の少なくとも酸素を
含むものあるいは芳香族アミン。In addition, alcohol, ether,
Those containing at least oxygen, such as aldehydes, ketones, and carboxylic acids, or aromatic amines.
脂肪族アミン等の少なくとも窒素を含むものを用いると
、より高速化がはかられる。また磁界を印加し、磁界の
強度を電子サイクロトン共鳴条件以上で作成すると、反
応ガスの高励起が可能となり、ダイヤモンドと異なる部
分を反応し除去する作用が大きくなる。If an aliphatic amine containing at least nitrogen is used, the speed can be further increased. Furthermore, when a magnetic field is applied and the intensity of the magnetic field is created above the electron cycloton resonance condition, it becomes possible to highly excite the reactive gas, and the effect of reacting and removing parts different from diamond becomes greater.
実施例
第1図は本発明のダイヤモンド薄膜又はダイヤモンド状
薄膜を形成するためのプラズマ装置の一実施例である。Embodiment FIG. 1 shows an embodiment of a plasma apparatus for forming a diamond thin film or a diamond-like thin film according to the present invention.
11は真空槽、12は導波管、13は反応ガス導入部、
14は原料導入部、15は基体、16は基体ホルダー、
17は電磁石である。11 is a vacuum chamber, 12 is a waveguide, 13 is a reaction gas introduction part,
14 is a raw material introduction part, 15 is a substrate, 16 is a substrate holder,
17 is an electromagnet.
真空槽11内に磁場をかけて876ガウスとし導波管1
2からマイクロ波(2,45GHz ) を導入する
と、真空槽11内に電子サイクロトン共鳴が生じる。こ
れに反応ガスq。と炭素を含む原料q1とを導入しプラ
ズマ放電を発生させる。この際、例えば、反応ガスq。A magnetic field is applied inside the vacuum chamber 11 to make it 876 Gauss, and the waveguide 1
When microwaves (2.45 GHz) are introduced from 2, electron cycloton resonance occurs within the vacuum chamber 11. This is followed by a reaction gas q. and raw material q1 containing carbon are introduced to generate plasma discharge. At this time, for example, the reaction gas q.
とじて水素、炭素を含む原料q1 としてメタンを導入
すると、図に示すように反応生成ガスとして、高エネル
ギーのラジカル。When methane is introduced as a raw material q1 containing hydrogen and carbon, high-energy radicals are produced as a reaction product gas, as shown in the figure.
例えばCH3、CH2米、CH米、C来、H2米、H*
等と米
電子およびC”、CH3”、H2+などのイオンを生じ
、これらが基体16上に到達して薄膜を形成する。For example, CH3, CH2 rice, CH rice, C coming, H2 rice, H*
etc., generate electrons and ions such as C", CH3", H2+, etc., which reach the substrate 16 and form a thin film.
この時、加熱又は冷却を出来るようにした基体ホルダー
16を用いて、基体温度を調節すると、低温ではダイヤ
モンド状薄膜、高温ではダイヤモンド薄膜が成長する。At this time, when the temperature of the substrate is adjusted using a substrate holder 16 capable of heating or cooling, a diamond-like thin film grows at low temperatures and a diamond-like thin film grows at high temperatures.
ここで基体に正の電圧を印加すると、基体表面ば電子が
到達する。この電子が基体表面上での炭素を含む原料と
反応ガスの分解。When a positive voltage is applied to the substrate, electrons reach the surface of the substrate. These electrons decompose carbon-containing raw materials and reactant gases on the substrate surface.
励起に寄与する。壕だ、基体をエツチングして、基体が
シリコンの場合には、SiCを形成する陽イオンの基体
表面への到達を防ぐことが出来る。Contributes to excitation. By etching the substrate, if the substrate is silicon, it is possible to prevent the cations that form SiC from reaching the surface of the substrate.
このため、高速で膜形成を行うことが可能となる。Therefore, it becomes possible to perform film formation at high speed.
実際には、マイクロ波出力を300〜50oW、真空槽
11内の圧力を10−5〜数Torr程度に維持し、シ
リコン基板を300〜1000℃に設定して、ダイヤモ
ンド薄膜を得た。反応ガスq。と原料q1 との体積
比は(1:1oo〜1:1)の割合で導入した。基体ホ
ルダーを通じて、基体には正の電圧(〜1Kv)を印加
した。Actually, the diamond thin film was obtained by maintaining the microwave output at 300 to 50 oW, the pressure in the vacuum chamber 11 at about 10 -5 to several Torr, and setting the temperature of the silicon substrate at 300 to 1000°C. Reactant gas q. and raw material q1 were introduced at a volume ratio of (1:1oo to 1:1). A positive voltage (~1 Kv) was applied to the substrate through the substrate holder.
このようにして得られたダイヤモンド薄膜はX線回折お
よびラマン分光により、ダイヤモンドと同定されるピー
クが確認された。またビッカース硬度及び電気特性を測
定したところ
1 ooooicg/lram2及び抵抗109Qcn
以上と、従来の薄膜に比べより天然ダイヤモンドに近い
膜質のものが得られた。成長速度は571m/hr以上
であった。また、基体温度が室温2はX線等においてダ
イヤモンド構造のピークは見られなかったが、ビッカー
ス硬度4000Kf/B2 を確認し、抵抗も108
0m以上の良質な膜が形成された。また、SEM像の観
察においても、表面形成のなめらがな膜となっていた。The thus obtained diamond thin film was subjected to X-ray diffraction and Raman spectroscopy, and a peak identified as diamond was confirmed. In addition, Vickers hardness and electrical properties were measured: 1 ooooicg/lram2 and resistance 109Qcn
In summary, a film quality closer to that of natural diamond was obtained compared to conventional thin films. The growth rate was 571 m/hr or more. In addition, when the substrate temperature was room temperature 2, no diamond structure peak was observed in X-rays, etc., but a Vickers hardness of 4000 Kf/B2 was confirmed, and a resistance of 108
A high-quality film with a thickness of 0 m or more was formed. Furthermore, in observation of the SEM image, a smooth film was formed on the surface.
なお、反応ガス9oとしては水素、炭素を含む原料q1
としてはメタンを用いたが、これらに限らず、反応
ガスとしては、水素のかわりに不活性ガスでも酸素、窒
素でもよい。また反応ガスは単独で用いてもよく、Ar
とH2といったように2種類以上混合してもよい。また
炭素を含む原料と化学的反応を行わない不活性ガス等で
もよい。不活性ガスを混合すると高速化が図られ、また
水素等はよりダイヤモンド構造に近い膜作成に大きな効
果がある。Note that the reaction gas 9o is a raw material q1 containing hydrogen and carbon.
Although methane was used as the reaction gas, the reaction gas is not limited to these, and instead of hydrogen, an inert gas, oxygen, or nitrogen may be used. Further, the reactive gas may be used alone, and Ar
Two or more types, such as and H2, may be mixed. Alternatively, an inert gas or the like that does not chemically react with the carbon-containing raw material may be used. Mixing an inert gas increases the speed, and hydrogen and the like have a great effect on creating a film closer to a diamond structure.
また、炭素を含む原料としては飽和または不飽和炭化水
素、芳香族炭化水素、脂環式炭化水素。In addition, raw materials containing carbon include saturated or unsaturated hydrocarbons, aromatic hydrocarbons, and alicyclic hydrocarbons.
多核炭化水素、あるいは少なくとも酸素または窒素を含
むものが良く、炭化水素を用いると不純物の少ない膜、
または少なくとも酸素または窒素を含む原料、例えばア
ルコール、エーテル、アルデヒド、ケトン、カルボン酸
、脂肪族アミン、芳香族アミンなどを用いた場合には、
酸素、窒素が触媒的役割を果たすと考えられ、高速化さ
れ石油。Polynuclear hydrocarbons, or those containing at least oxygen or nitrogen, are preferred; using hydrocarbons will result in films with fewer impurities,
Or when using raw materials containing at least oxygen or nitrogen, such as alcohols, ethers, aldehydes, ketones, carboxylic acids, aliphatic amines, aromatic amines, etc.
Oxygen and nitrogen are thought to play a catalytic role, speeding up oil production.
都市ガス等の利用も行え低コスト化が計られるものと考
える。また磁界の強度は電子サイクロトン共鳴条件以下
でもエネルギーは与えられるが、共鳴条件以上にすると
、反応ガス、原料共に高励起され、高速化と膜質の向上
が可能である。It is believed that it will be possible to use city gas, etc., resulting in lower costs. Energy can be given even if the intensity of the magnetic field is below the electron cycloton resonance condition, but when it is above the resonance condition, both the reactant gas and the raw material are highly excited, making it possible to increase the speed and improve the film quality.
発明の効果
本発盟は、基体に正の電圧を印加するととで、ダイヤモ
ンド薄膜またはダイヤモンド状薄膜を高速で形成するこ
とが出来、これら産業上の利用分野に与える効果は大き
い。Effects of the Invention The present invention can form a diamond thin film or a diamond-like thin film at high speed by applying a positive voltage to a substrate, and has a great effect on these industrial fields of application.
第1図は本発明に用いたプラズマ装置の概略図、第2図
は従来よく用いられているプラズマ装置図でaは熱電子
放射材を用いた場合、bはマイクロ波プラズマを用いた
場合の概略図である。
11・・・・・・真空槽、12・・・・・導波管、13
・旧・ガス導入部、14・・・・・・原料導入部、15
・・団・基体、16・・・・・・基体ホルダー、17・
・・・・電磁石。
1f−奏空糟
IC−−−グ ノにルダー
(−一一臭安1
.5−44不Fig. 1 is a schematic diagram of the plasma device used in the present invention, and Fig. 2 is a diagram of a plasma device commonly used in the past. It is a schematic diagram. 11... Vacuum chamber, 12... Waveguide, 13
・Old gas introduction section, 14... Raw material introduction section, 15
・・Group・Substrate, 16・・・・Substrate holder, 17・
····electromagnet. 1f-Soukou IC--Guno Ni Ruder (-11 Broan 1.5-44 Non
Claims (8)
応ガスと少なくとも炭素を含む原料を導入し高周波放電
によりプラズマを発生させ、正の電圧を印加した基体表
面上にダイヤモンド薄膜又はダイヤモンド状薄膜を析出
させることを特徴とするダイヤモンド薄膜又はダイヤモ
ンド状薄膜の製造方法。(1) Introducing at least one type of carbon-free reactive gas and a raw material containing at least carbon into a vacuum chamber, generating plasma by high-frequency discharge, and applying a positive voltage to a diamond thin film or diamond-like thin film on the substrate surface. A method for producing a diamond thin film or a diamond-like thin film, which comprises depositing.
特許請求の範囲第1項記載のダイヤモンド薄膜又はダイ
ヤモンド状薄膜の製造方法。(2) The method for producing a diamond thin film or a diamond-like thin film according to claim 1, wherein the reaction gas contains an inert gas.
とする特許請求の範囲第1項記載のダイヤモンド薄膜又
はダイヤモンド状薄膜の製造方法。(3) The method for producing a diamond thin film or a diamond-like thin film according to claim 1, wherein the reactive gas is hydrogen, oxygen, or nitrogen.
芳香族炭化水素、脂環式炭化水素、多核炭化水素の少な
くとも1つを含むものであることを特徴とする特許請求
の範囲第1項記載のダイヤモンド薄膜又はダイヤモンド
状薄膜の製造方法。(4) Claim 1, characterized in that the raw material containing carbon contains at least one of saturated or unsaturated hydrocarbons, aromatic hydrocarbons, alicyclic hydrocarbons, and polynuclear hydrocarbons. A method for producing the diamond thin film or diamond-like thin film described above.
デヒド、ケトン、カルボン酸等の少なくとも酸素を含む
ことを特徴とする特許請求の範囲第1項記載のダイヤモ
ンド薄膜又はダイヤモンド状薄膜の製造方法。(5) The method for producing a diamond thin film or a diamond-like thin film according to claim 1, wherein the carbon-containing raw material contains at least oxygen such as alcohol, ether, aldehyde, ketone, carboxylic acid, etc.
等の窒素を含むものであることを特徴とする特許請求の
範囲第1項記載のダイヤモンド薄膜又はダイヤモンド状
薄膜の製造方法。(6) The method for producing a diamond thin film or a diamond-like thin film according to claim 1, wherein the raw material containing carbon contains nitrogen such as an aromatic amine or an aliphatic amine.
請求の範囲第1項記載のダイヤモンド薄膜又はダイヤモ
ンド状薄膜の製造方法。(7) A method for producing a diamond thin film or a diamond-like thin film according to claim 1, characterized in that a magnetic field is applied within a vacuum chamber.
件以上であることを特徴とする特許請求の範囲第7項記
載のダイヤモンド薄膜又はダイヤモンド状薄膜の製造方
法。(8) The method for producing a diamond thin film or a diamond-like thin film according to claim 7, wherein the strength of the magnetic field is at least equal to or higher than an electron cycloton resonance condition.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9783487A JPS63265890A (en) | 1987-04-21 | 1987-04-21 | Production of thin diamond film or thin diamond-like film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9783487A JPS63265890A (en) | 1987-04-21 | 1987-04-21 | Production of thin diamond film or thin diamond-like film |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63265890A true JPS63265890A (en) | 1988-11-02 |
Family
ID=14202744
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9783487A Pending JPS63265890A (en) | 1987-04-21 | 1987-04-21 | Production of thin diamond film or thin diamond-like film |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63265890A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH029787A (en) * | 1988-06-28 | 1990-01-12 | Shimadzu Corp | Plasma processing device |
JPH03115194A (en) * | 1989-09-29 | 1991-05-16 | Shimadzu Corp | Production of thin film of polycrystalline diamond |
US5254171A (en) * | 1991-04-16 | 1993-10-19 | Sony Corporation | Bias ECR plasma CVD apparatus comprising susceptor, clamp, and chamber wall heating and cooling means |
JP2000045071A (en) * | 1998-06-24 | 2000-02-15 | Commiss Energ Atom | Vapor deposition method of electron emitting carbon film by electron cyclotron resonance plasma |
-
1987
- 1987-04-21 JP JP9783487A patent/JPS63265890A/en active Pending
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH029787A (en) * | 1988-06-28 | 1990-01-12 | Shimadzu Corp | Plasma processing device |
JPH03115194A (en) * | 1989-09-29 | 1991-05-16 | Shimadzu Corp | Production of thin film of polycrystalline diamond |
US5254171A (en) * | 1991-04-16 | 1993-10-19 | Sony Corporation | Bias ECR plasma CVD apparatus comprising susceptor, clamp, and chamber wall heating and cooling means |
JP2000045071A (en) * | 1998-06-24 | 2000-02-15 | Commiss Energ Atom | Vapor deposition method of electron emitting carbon film by electron cyclotron resonance plasma |
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