JPS63250573A - Component inspection device - Google Patents

Component inspection device

Info

Publication number
JPS63250573A
JPS63250573A JP62086041A JP8604187A JPS63250573A JP S63250573 A JPS63250573 A JP S63250573A JP 62086041 A JP62086041 A JP 62086041A JP 8604187 A JP8604187 A JP 8604187A JP S63250573 A JPS63250573 A JP S63250573A
Authority
JP
Japan
Prior art keywords
component
inspected
contact
inspection
turntable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62086041A
Other languages
Japanese (ja)
Other versions
JPH0577269B2 (en
Inventor
Koichi Yamashita
幸一 山下
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP62086041A priority Critical patent/JPS63250573A/en
Publication of JPS63250573A publication Critical patent/JPS63250573A/en
Publication of JPH0577269B2 publication Critical patent/JPH0577269B2/ja
Granted legal-status Critical Current

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  • Testing Relating To Insulation (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

PURPOSE:To easily inspect various kinds of components with high reliability by holding a component to be inspected at a constant attitude and setting a turntable so that its one surface contacts the conduction part of the component to be inspected and the other surface abuts on an inspection position. CONSTITUTION:The turntable 7 is equipped with a component normalizing part 8 which holds the attitude of the component 6 to be inspected constant and an abutting element 9 which contacts the conduction part of the component 6 to be inspected on one surface and abuts on the contact 10 on the other surface at the inspection position. Then when the component 6 to be inspected is carried to the inspection position and the contact 10 is elevated, the contact 10 does not abut directly on the conduction part of the component 6 to be inspected, but abuts on the reverse surface of the abutting element 9 to determine inspection conditions. Consequently, even when a component 6 of different size is inspected, the shape of the abutting element 9 is unchanged, so the contact 10 need not be shifted in installation position.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、小型電子部品の性能、良、不良等を検査する
部品検査装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a component inspection device for inspecting the performance, acceptability, defect, etc. of small electronic components.

従来の技術 近年、電子部品の技術進歩は著しく、部品の小型化・高
性能化の方向にあり、これらを自動にて高い信頼性を保
ち検査する部品検査装置は重要な地位を占めている。こ
の部品検査装置の中で、被検査部品をターンテーブル上
に載置し各検査位置へ運ぶ方法が、複数検査の場合の面
積有効性、搬送時間の短縮等の点で有利である。
BACKGROUND OF THE INVENTION In recent years, technological advances in electronic components have been remarkable, with the trend toward smaller size and higher performance of components, and component inspection equipment that automatically inspects these components with high reliability is playing an important role. In this component inspection apparatus, the method of placing the component to be inspected on a turntable and transporting it to each inspection position is advantageous in terms of area efficiency in the case of multiple inspections, shortening of transportation time, and the like.

以下図面を参照しながら、上述した部品検査装置の一例
について説明する。
An example of the above-mentioned component inspection apparatus will be described below with reference to the drawings.

第3図〜第5図は従来の部品検査装置を示すものである
。第3図において、1は被検査部品、2は被検査部品1
を載置して回転するターンテーブル、3はターンテーブ
ル2に間欠回転駆動を与えるインデックス装置である。
3 to 5 show a conventional component inspection device. In Fig. 3, 1 is the part to be inspected, 2 is the part to be inspected 1
3 is an indexing device that provides intermittent rotational drive to the turntable 2.

4は各検査位置にて被検査部品1に当接し検査条件を与
えるコンタクト、6はコンタンクト4を上下動させるシ
リンダである。ここでターンテーブル2には第4図に示
すように、被検査部品1の導通部分にコンタクト4が通
過するための穴があけられている。
4 is a contact that comes into contact with the inspected part 1 at each inspection position and provides inspection conditions; and 6 is a cylinder that moves the contact 4 up and down. As shown in FIG. 4, the turntable 2 is provided with a hole through which the contact 4 passes through the conductive portion of the component 1 to be inspected.

以上のように構成された部品検査装置について、その動
作について説明する。部品供給位置においてターンテー
ブル2上に載置された被検査部品1はインデックス装置
3が駆動することによシ各検査位置に運ばれる。各検査
位置にてシリンダ5によシコンタクト4が上昇して被検
査部品1の導通部分に当接し検査条件を与えられる。検
査が終了するとシリンダ6によシコンタクト4が下降し
次の@萱・位置へ運ばれる。全ての検査が終了した後、
部品取出位置にて被検査部品1はターンテーブル2上か
ら取出される。
The operation of the component inspection apparatus configured as described above will be explained. The component to be inspected 1 placed on the turntable 2 at the component supply position is transported to each inspection position by the indexing device 3 being driven. At each inspection position, the contact 4 is raised by the cylinder 5 and comes into contact with the conductive portion of the component 1 to be inspected, thereby providing inspection conditions. When the inspection is completed, the cylinder 6 lowers the contact 4 and transports it to the next position. After all inspections are completed,
The part to be inspected 1 is taken out from the turntable 2 at the part taking out position.

発明が解決しようとする問題点 しかしながら上記のような構成では、コンタクトが被検
査部品の下面から直接当接するために被検査部品の姿勢
を変える恐れがあり接触抵抗等の検査条件が一定になら
ずに信頼性が保障できないという問題点を有していた。
Problems to be Solved by the Invention However, with the above configuration, since the contacts come into direct contact with the lower surface of the part to be tested, there is a risk that the posture of the part to be tested may change, and the test conditions such as contact resistance will not be constant. The problem was that reliability could not be guaranteed.

また、第6図に示すように、第4図の被検査部品1aと
大きさの異なる被検査部品1bを検査する場合にコンタ
クト4の設置位置の変更が必要となり多品種の部品検査
の品種切換が容易でないという問題点を有していた。
In addition, as shown in FIG. 6, when inspecting a component 1b that is different in size from the component 1a shown in FIG. The problem was that it was not easy.

本発明は上記問題点に鑑み、高い信頼性を保障しかつ多
品種の部品検査を容易に行うことのできる部品検査装置
を提供するものである。
In view of the above-mentioned problems, the present invention provides a parts inspection device that guarantees high reliability and can easily inspect a wide variety of parts.

問題点を解決するための手段 上記問題点全解決するために本発明の部品検査装置は、
ターンテーブルが、被検査部品の姿勢を一足に保つ部品
規正部と、一面にて被検査部品の導通部分に接触しかつ
他面が検査位置にてコンタクトと当接する当接子とを備
えたものである。
Means for Solving the Problems In order to solve all the above problems, the parts inspection device of the present invention has the following features:
The turntable is equipped with a component regulating part that maintains the posture of the component to be inspected in one position, and a contact element that contacts the conductive part of the component to be inspected on one side and contacts the contact on the other side at the inspection position. It is.

作  用 本発明は上記した構成によって、コンタクトが厘接被検
査部品に当接しないために被検査部品の姿勢を変えてし
まう心配がなくなる。また、多品種の部品検査において
も当接子のコンタクト当接面の形状を一定にすることに
よりコンタクトの設置位置の変更が不要となり、多品種
の部品検Me容易に行えることとなる。
Function: With the above-described configuration, the present invention eliminates the risk of changing the posture of the inspected component because the contact does not come into contact with the inspected component. In addition, even when inspecting a wide variety of parts, by keeping the shape of the contact contact surface of the contact element constant, there is no need to change the installation position of the contact, and the inspection of a wide variety of parts can be easily performed.

実施例 以下本発明の一実施例の部品検査装置につして、図面を
参照しながら説明する。
Embodiment Hereinafter, a component inspection apparatus according to an embodiment of the present invention will be described with reference to the drawings.

第1図は本発明の一実施例における部品検査装置のター
ンテーブルの一部拡大図である。第1図において6は被
検査部品、7はターンテーブル本体、8はターンテーブ
ル本体71C取付けられ被検査部品6の姿勢を一定に保
つ部品規正部である。
FIG. 1 is a partially enlarged view of a turntable of a component inspection device according to an embodiment of the present invention. In FIG. 1, 6 is a part to be inspected, 7 is a turntable main body, and 8 is a component regulating part which is attached to the turntable main body 71C and keeps the posture of the part to be inspected 6 constant.

9はターンテーブル本体7に埋込まれ、上面にて被検査
部品6の導通部分に接触する良導電性材質からなる当接
子、1oは検査位置において当接子9に当接し、検査条
件を与えるコンタクトであムなお、装置全体の構成は第
3図に示す従来の部品検査装置に変わりはない。
Reference numeral 9 is a contact element made of a highly conductive material that is embedded in the turntable main body 7 and contacts the conductive part of the component to be inspected 6 on the upper surface; 1o is in contact with the contact element 9 at the inspection position, and the contact element 1o Note that the overall configuration of the device is the same as the conventional component inspection device shown in FIG.

以上のように構成された部品検査装置について、以下そ
の動作について説明する。基本的な動作内容については
、従来の部品検査装置と同様であるが、検査位置に被検
査部品6が運ばれコンタクト10が上昇すると、コンタ
クト1oは被検査部品6の導通部分に直接当接するので
はなく、当接子9の下面に当接して検査条件を与えるこ
ととなる。
The operation of the component inspection apparatus configured as described above will be described below. The basic operation is the same as that of conventional component inspection equipment, but when the component 6 to be inspected is brought to the inspection position and the contact 10 is raised, the contact 1o comes into direct contact with the conductive part of the component 6 to be inspected. Instead, the test condition is applied by contacting the lower surface of the contact element 9.

これによシ、第2図に示すように、第1図の被検査部品
6aと大きさの異なる被検査部品6bを検査する場合に
も当接子9の形状が同一であるためにコンタクト10の
設置位置の変更が不要となる。
Accordingly, as shown in FIG. 2, even when inspecting a component to be inspected 6b that is different in size from the component to be inspected 6a in FIG. There is no need to change the installation location.

発明の効果 以上のように本発明は、被検査部品を載置し検査位置ま
で間欠回転するターンテーブルと、検査位置にて被検査
部品に検査条件を実現するコンタクトとからなる部品検
査装置において、ターンテーブルが被検査部品の姿勢を
一定に保つ規正部と、一面にて被検査部品の導通部分に
接触しかつ他面が検査位置にてコンタクトと当接する当
接子とを有することによシ、被検査部品の姿勢を安定し
て一定に保つことができ信頼性の高い検査が可能となシ
、また多品種の部品検査もコンタクトの設置位置を変更
することなく容易に行うことができる。
Effects of the Invention As described above, the present invention provides a component inspection device that includes a turntable on which a component to be inspected is placed and rotates intermittently to an inspection position, and a contact that achieves inspection conditions for the component to be inspected at the inspection position. The turntable has a regulating part that keeps the posture of the part to be inspected constant, and a contact element that contacts the conductive part of the part to be inspected on one side and a contact on the other side at the inspection position. In addition, the posture of the part to be inspected can be kept stable and constant, making it possible to perform highly reliable inspections, and it is also possible to easily inspect a wide variety of parts without changing the installation position of the contacts.

および従来の部品検査装置の概略構成図、第4図及び第
6図は従来の部品検査装置の一部拡大断面図である。7
・・・・・・ターンテーブル本体、8・・・・・・部品
規正部、9・・・・・・当接子、1o・・・・・・コン
タクト。
FIG. 4 and FIG. 6 are partially enlarged sectional views of the conventional component inspection device. 7
...Turntable body, 8...Parts regulation section, 9...Abutment element, 1o...Contact.

代理人の氏名 弁理士 中 尾 敏 男 ほか1名c−
−w** 番p5a IQ・・−ゴシタクト 第3図
Name of agent: Patent attorney Toshio Nakao and one other person c-
-w** No. p5a IQ...-Goshitakt Figure 3

Claims (1)

【特許請求の範囲】[Claims] 被検査部品を載置し検査位置まで間欠回転するターンテ
ーブルと、検査位置にて被検査部品に検査条件を実現す
るコンタクトとからなる部品検査装置において、上記タ
ーンテーブルが被検査部品の姿勢を一定に保つ部品規正
部と、一面にて被検査部品の導通部分に接触しかつ他面
が検査位置にて上記コンタクトと当接する当接子とを有
することを特徴とする部品検査装置。
In a component inspection device consisting of a turntable on which a part to be inspected is placed and rotated intermittently to the inspection position, and contacts that achieve inspection conditions for the part to be inspected at the inspection position, the turntable keeps the posture of the part to be inspected constant. What is claimed is: 1. A component inspection device comprising: a component regulating portion that maintains the condition; and a contact element that contacts a conductive portion of the component to be inspected on one side and abuts the contact on the other side at an inspection position.
JP62086041A 1987-04-08 1987-04-08 Component inspection device Granted JPS63250573A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62086041A JPS63250573A (en) 1987-04-08 1987-04-08 Component inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62086041A JPS63250573A (en) 1987-04-08 1987-04-08 Component inspection device

Publications (2)

Publication Number Publication Date
JPS63250573A true JPS63250573A (en) 1988-10-18
JPH0577269B2 JPH0577269B2 (en) 1993-10-26

Family

ID=13875593

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62086041A Granted JPS63250573A (en) 1987-04-08 1987-04-08 Component inspection device

Country Status (1)

Country Link
JP (1) JPS63250573A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130092258A1 (en) * 2011-10-14 2013-04-18 Horiba Stec, Co., Ltd. Flow rate control device, and diagnostic device and recording medium recorded with diagnostic program used for flow rate control device
US20150114079A1 (en) * 2013-10-25 2015-04-30 Sercel, Inc. Method and apparatus for testing a sensor

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20130092258A1 (en) * 2011-10-14 2013-04-18 Horiba Stec, Co., Ltd. Flow rate control device, and diagnostic device and recording medium recorded with diagnostic program used for flow rate control device
US20150114079A1 (en) * 2013-10-25 2015-04-30 Sercel, Inc. Method and apparatus for testing a sensor
US9651575B2 (en) * 2013-10-25 2017-05-16 Sercel Inc. Method and apparatus for testing a sensor

Also Published As

Publication number Publication date
JPH0577269B2 (en) 1993-10-26

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