JPS6321846A - Fremoving method for semiconductor element - Google Patents

Fremoving method for semiconductor element

Info

Publication number
JPS6321846A
JPS6321846A JP61165547A JP16554786A JPS6321846A JP S6321846 A JPS6321846 A JP S6321846A JP 61165547 A JP61165547 A JP 61165547A JP 16554786 A JP16554786 A JP 16554786A JP S6321846 A JPS6321846 A JP S6321846A
Authority
JP
Japan
Prior art keywords
tape
adhesive
adhesive tape
semiconductor element
extending
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61165547A
Other languages
Japanese (ja)
Inventor
Yoshihiko Sano
芳彦 佐野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP61165547A priority Critical patent/JPS6321846A/en
Publication of JPS6321846A publication Critical patent/JPS6321846A/en
Pending legal-status Critical Current

Links

Landscapes

  • Dicing (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE:To reduce an adhesive area of a semiconductor element with an adhesive tape thereby to easily remove a semiconductor element on an adhesive tape without irregularity by executing a secondary tape extending step for thermally extending the tape next to a primary tape extending step. CONSTITUTION:A heating stand 11 is fixedly mounted in a certain height on a base 12 in a heater unit 11a. An elevational slider 13 is pushed down, for example, by a presser 15 moved down (up) against a lifting force of a spring 14a by means of screw couples to move down to extend an adhesive tape 102 while pressing it to the upper surface of the stand 11. A tape ring 101 formed by extending the tape extended by 170% of an example having equal ductility to a conventional one by a primary tape extension is mounted, and the tape is extended by 200% at 50-60 deg.C as an example. Thus, the adhesive area of the tape of semiconductor elements 104, 104 adhered onto the tape can be reduced to uniformly and easily remove the element in a next step.

Description

【発明の詳細な説明】 〔発明の目的〕 (産業上の利用分野) この発明は半導体素子の取出方法に関し、特に半導体素
子のマウントにあたり粘着シート上の半導体素子を取出
す方法に適用される。
DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Application Field) The present invention relates to a method for taking out a semiconductor element, and is particularly applicable to a method for taking out a semiconductor element on an adhesive sheet when mounting a semiconductor element.

(従来の技術) 従来、半導体素子をリードフレームのチップベッドにマ
ウントするにあたり、粘着テープ上に相互に離隔して貼
着された複数個の半導体素子を順次減圧ノズルで吸引し
て粘着テープから剥して支持し、チップベッド上に搬送
してマウントを施していた。なお、上記半導体素子は粘
着テープに粘着された半導体ウェーハをスクライブ線に
依って割断し、予め加熱展延させた粘着テープの展張に
よって半導体素子間に間隙を生ずるとともに、半導体素
子の粘着面(主面)の周辺を剥離させる。
(Prior Art) Conventionally, when mounting semiconductor devices on a chip bed of a lead frame, a plurality of semiconductor devices attached to an adhesive tape at a distance from each other are sequentially suctioned with a vacuum nozzle and peeled off from the adhesive tape. The chips were then supported, transported onto a chip bed, and mounted. Note that the above-mentioned semiconductor element is produced by cutting a semiconductor wafer adhered to an adhesive tape along a scribe line, creating gaps between the semiconductor elements by expanding the adhesive tape that has been heated and expanded in advance, and cutting the adhesive surface (mainly the adhesive surface) of the semiconductor element. peel off the periphery of the surface).

−例として粘着テープにTR7−5(商品名、株式会社
ツカサ商会発売)を用い、半導体素子1個当りの接着力
がIgr未満であることが上記減圧ノズル(図示省略)
で半導体素子を粘着テープからネ1]離させるのに必要
である。
- As an example, using TR7-5 (product name, published by Tsukasa Shokai Co., Ltd.) as an adhesive tape, it is necessary to use the vacuum nozzle (not shown) to ensure that the adhesive strength per semiconductor element is less than Igr.
This is necessary to separate the semiconductor element from the adhesive tape.

(発明が解決しようとする問題点) 上記従来の方法には半導体素子と粘着テープとの粘着カ
ミむらがあり、減圧ノズルで剥離し支持することができ
ないものがあった場合、装置の稼動率が低下し、故障の
原因となる。そこで、第2図に示すように、テープリン
グ101にテープ102を展張しテープバンドl○3で
固縛したこの粘着テープ上に粘着している半導体素子1
04.104・・・に対し。
(Problems to be Solved by the Invention) In the above conventional method, there is uneven adhesion between the semiconductor element and the adhesive tape, and if some of the adhesive tape is peeled off with a vacuum nozzle and cannot be supported, the operating rate of the device will be reduced. This may cause a breakdown. Therefore, as shown in FIG. 2, a tape 102 is spread around a tape ring 101 and secured with a tape band l○3.
For 04.104...

粘着テープを介して爪105でテープの下面から操るこ
とにより、粘着面積を低減させ剥離しやすくしていた。
By manipulating the adhesive tape from the underside with a nail 105, the adhesive area is reduced and peeling becomes easier.

この爪による操作は作業者の勘によっていたので、1回
の処理分(ロット内)についても、また何回かの処理毎
(ロット間)にもむらが多く1次の工程での半導体素子
の取出しの歩留を低下させていた。
Since the operation with these claws was based on the intuition of the operator, there was a lot of unevenness both in one process (within a lot) and in each process (between lots). This lowered the yield of extraction.

この発明は上記従来の問題点を解消する半導体素子の取
出し方法を堤供するものである。
The present invention provides a method for extracting semiconductor elements that solves the above-mentioned conventional problems.

〔発明の構成〕[Structure of the invention]

(問題点を解決するための手段) この発明にかかる半導体素子の取出方法は、粘着テープ
上に粘着支持された複数個の半導体素子に対し粘着テー
プを加熱展延させて半導体素子を相互に離隔させる第一
次テープ展延工程と、さらに粘着テープを加熱展延させ
半導体素子の粘着テープへの粘着面積を低減させる第二
次テープ展延工程と、粘着テープ上の半導体素子を減圧
ノズルで吸引し取出す半6体素子の取出工程を含むこと
を特徴とする。
(Means for Solving the Problems) A method for taking out semiconductor elements according to the present invention heats and spreads an adhesive tape on a plurality of semiconductor elements adhesively supported on an adhesive tape to separate the semiconductor elements from each other. A second tape spreading step further heats and spreads the adhesive tape to reduce the adhesion area of the semiconductor element to the adhesive tape, and a vacuum nozzle sucks the semiconductor element on the adhesive tape. The method is characterized in that it includes a step of taking out a half-six-body element.

(作 用) この発明は取上の従来の第一次テープ展延工程の次に粘
着テープをさらに加熱展延させる第二次テープ展延工程
を施して半導体素子と粘着テープとの粘着面積を低減さ
せることを特徴とするもので、次工程の単導体素子取出
しを容易にする。
(Function) The present invention performs a second tape spreading process in which the adhesive tape is further heated and spread after the conventional first tape spreading process to increase the adhesive area between the semiconductor element and the adhesive tape. It is characterized by a reduction in the amount of metal, making it easier to take out the single conductor element in the next process.

(実施例) 以下、この発明の一実施例につき第1図を参照して説明
する。第1図は第二次テープ展延工程に用いられるテー
プ展延装置を断面で示すもので、図中、11は加熱台部
で基台12上にある高さに固定して取着されており、 
ヒータユニットllaを内装し、このヒータユニットの
温度調節をするヒータコントローラllbが付設されて
いる。 この加熱台部11は上下スライド部13に包囲
され、かつ、この上下スライド部は内周端にテープリン
グ101 を載置するとともにテープリングに展張され
た粘着テープが加熱台部と平行で若干離れて支持される
ように、 ガイド14のスプリング14aによって弾力
的に押上げられている。また、この上下スライド部13
はこれの上方にあって例えばねじ対偶(図示省略)によ
ってスプリング14aの押上げ力に抗して下降(上昇)
する押え板15によって押し下げられ下降し、粘着テー
プ102を加熱台部11の上面に抑圧させつつ展張させ
る。なお、加熱台部11の上面周縁には展張されるテー
プの滑りを援けるテープスライドリング16が配置され
ている。
(Example) An example of the present invention will be described below with reference to FIG. Fig. 1 shows a cross section of the tape spreading device used in the secondary tape spreading process. Ori,
A heater unit lla is installed inside, and a heater controller llb is attached to adjust the temperature of this heater unit. This heating table part 11 is surrounded by a vertical slide part 13, and a tape ring 101 is placed on the inner peripheral end of the vertical slide part, and an adhesive tape stretched on the tape ring is parallel to the heating table part and slightly spaced apart. It is elastically pushed up by the spring 14a of the guide 14 so that it is supported by the guide 14. In addition, this vertical slide portion 13
is located above this and is lowered (raised) against the upward force of the spring 14a by means of a pair of screws (not shown), for example.
The adhesive tape 102 is pushed down and lowered by the presser plate 15 , and the adhesive tape 102 is spread while being pressed against the upper surface of the heating stage section 11 . In addition, a tape slide ring 16 is disposed on the periphery of the upper surface of the heating stage portion 11 to assist in the sliding of the stretched tape.

取上のテープ展延装置により、第一次テープ展延によっ
て従来の展延に等しい一例の170%展延が施された粘
着テープを展張したテープリング101を装着し、 粘
着テープに一例として50〜60℃において200%の
展延が施される。そして、粘着テープ上に粘着された半
導体素子104.104・・・の粘着テープとの粘着面
積が低減でき、次の工程における半導体素子の取出しが
均一、かつ容易になる。
A tape ring 101 made of adhesive tape that has been expanded by the first tape expansion to 170%, which is equivalent to conventional expansion, is attached using the tape spreading device taken up, and the adhesive tape is expanded to 170%, which is an example of 50% of the adhesive tape. A 200% spread is applied at ~60°C. Then, the adhesion area of the semiconductor elements 104, 104, .

なお、この発明の上記加熱温度、展延率等は粘着テープ
の粘着性能、半導体素子の大きさ等によって適宜設定し
てよい。
The heating temperature, spreading rate, etc. of the present invention may be appropriately set depending on the adhesive performance of the adhesive tape, the size of the semiconductor element, etc.

〔発明の効果〕〔Effect of the invention〕

この発明によれば、粘着テープ上の半導体素子の取出し
工程についてその取出しが容易かつむらなく施せるので
、材料歩留、工程の稼動率が一例として従来の90〜9
5%から96〜98%と顕著に向上する。
According to this invention, in the process of taking out semiconductor elements on an adhesive tape, the taking out process can be carried out easily and evenly, so that the material yield and process operation rate are, for example, 90 to 90% compared to the conventional one.
This is a remarkable improvement from 5% to 96-98%.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の一実施例に用いられるテープ展延装
置の正面断面図、第2図は従来方法に用いられる装置の
正面断面図である。 104・・・・・・・・・半導体素子 102・・・・・・・・・粘着テープ 代理人 弁理士  井 上 −男 101   :  テープリンフ1         
イ1  コ  1′J鳴石暑pt4:   ガ′イビ 14α  スジ1ルγ 1、!5二   T’lヒJ lb:   スライドリレ2′ !2;   ヌ艮 ち 第   1  図 (01:  テープ1ルフ1 102  :   メへ羞テーフ゛ rD3 :  テープバンド゛ lOΦ: 4香体・素子 IQ!i:  ガ〈 第2図
FIG. 1 is a front sectional view of a tape spreading device used in an embodiment of the present invention, and FIG. 2 is a front sectional view of the device used in a conventional method. 104・・・・・・・・・Semiconductor device 102・・・・・・Adhesive tape agent Patent attorney Inoue - Male 101: Tape rinse 1
I1 Ko 1'J Naruishi Hot pt4: Ga'Ibi14α Suji1ruγ1,! 52 T'lhi J lb: Slide relay 2'! 2; nu 1st figure (01: tape 1 102: mehe tape rD3: tape band 1OΦ: 4 scented body/element IQ!i: ga〈 Fig. 2

Claims (1)

【特許請求の範囲】[Claims] 粘着テープ上に粘着支持された複数個の半導体素子に対
し粘着テープを加熱展延させて半導体素子を相互に離隔
させる第一次テープ展延工程と、さらに粘着テープを加
熱展延させ半導体素子の粘着テープへの粘着面積を低減
させる第二次テープ展延工程と、粘着テープ上の半導体
素子を減圧ノズルで吸引し取出す半導体素子の取出工程
を含む半導体素子の取出方法。
A first tape spreading step in which a plurality of semiconductor devices adhesively supported on the adhesive tape is heated and spread to separate the semiconductor devices from each other; A method for taking out a semiconductor device, including a second tape spreading step for reducing the adhesive area of the adhesive tape, and a semiconductor device taking out step for sucking and taking out the semiconductor device on the adhesive tape with a vacuum nozzle.
JP61165547A 1986-07-16 1986-07-16 Fremoving method for semiconductor element Pending JPS6321846A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61165547A JPS6321846A (en) 1986-07-16 1986-07-16 Fremoving method for semiconductor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61165547A JPS6321846A (en) 1986-07-16 1986-07-16 Fremoving method for semiconductor element

Publications (1)

Publication Number Publication Date
JPS6321846A true JPS6321846A (en) 1988-01-29

Family

ID=15814450

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61165547A Pending JPS6321846A (en) 1986-07-16 1986-07-16 Fremoving method for semiconductor element

Country Status (1)

Country Link
JP (1) JPS6321846A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1061559A2 (en) * 1999-06-17 2000-12-20 Lintec Corporation Method of detaching article and detachment apparatus
EP1081745A2 (en) * 1999-09-06 2001-03-07 LINTEC Corporation Method of detaching article and apparatus

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1061559A2 (en) * 1999-06-17 2000-12-20 Lintec Corporation Method of detaching article and detachment apparatus
EP1061559A3 (en) * 1999-06-17 2003-01-22 Lintec Corporation Method of detaching article and detachment apparatus
US6627037B1 (en) 1999-06-17 2003-09-30 Lintec Corporation Method of detaching article fixed through pressure sensitive adhesive double coated sheet
EP1081745A2 (en) * 1999-09-06 2001-03-07 LINTEC Corporation Method of detaching article and apparatus
EP1081745A3 (en) * 1999-09-06 2003-01-22 LINTEC Corporation Method of detaching article and apparatus
US6649017B1 (en) 1999-09-06 2003-11-18 Lintec Corporation Method of detaching article fixed through pressure sensitive adhesive double coated sheet

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