JPS63215019A - Voltage-dependent nonlinear resistor porcelain compound - Google Patents

Voltage-dependent nonlinear resistor porcelain compound

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Publication number
JPS63215019A
JPS63215019A JP62049255A JP4925587A JPS63215019A JP S63215019 A JPS63215019 A JP S63215019A JP 62049255 A JP62049255 A JP 62049255A JP 4925587 A JP4925587 A JP 4925587A JP S63215019 A JPS63215019 A JP S63215019A
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JP
Japan
Prior art keywords
voltage
mol
component
nonlinear resistor
dependent nonlinear
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62049255A
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Japanese (ja)
Inventor
野井 慶一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
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Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP62049255A priority Critical patent/JPS63215019A/en
Publication of JPS63215019A publication Critical patent/JPS63215019A/en
Pending legal-status Critical Current

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  • Inorganic Insulating Materials (AREA)
  • Compositions Of Oxide Ceramics (AREA)
  • Ceramic Capacitors (AREA)
  • Thermistors And Varistors (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は電気機器、電子機器で発生する異常高電圧、ノ
イズ、静電気から半導体及び回路を保護するためのコン
デンサ特性とバリスタ特性を有する電圧依存性非直線抵
抗体磁器組成物に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to a voltage-independent non-voltage device having capacitor characteristics and varistor characteristics for protecting semiconductors and circuits from abnormal high voltages, noise, and static electricity generated in electrical equipment and electronic equipment. The present invention relates to a linear resistor ceramic composition.

従来の技術 従来、各種電気機器、電子機器における異常高電圧の吸
収、ノイズの除去、火花消去、静電気対策のために電圧
依存性非直線抵抗特性を有するSiCバリスタや、Zn
O系バリスタなどが使用されていた。このようなバリス
タの電圧−電流特性は近似的に次式のように表すことが
できる。
Conventional technology Conventionally, SiC varistors and Zn varistors, which have voltage-dependent nonlinear resistance characteristics, have been used to absorb abnormally high voltages, remove noise, eliminate sparks, and counter static electricity in various electrical and electronic devices.
O-type varistors were used. The voltage-current characteristics of such a varistor can be approximately expressed as in the following equation.

I=(V/C)a ここで、■は電流、■は電圧、Cはバリスタ固有の定数
、αは電圧非直線指数である。
I=(V/C)a Here, ■ is a current, ■ is a voltage, C is a constant specific to the varistor, and α is a voltage nonlinear index.

SiCバリスタのαは2〜7程度、ZnO系バリスタで
はαが50にもおよぶものがある。このようなバリスタ
は比較的高い電圧の吸収には優れた性能を有しているが
、誘電率が低く、固有の静電容量が小さいためバリスタ
電圧以下の比較的低い電圧の吸収に対してはほとんど効
果を示さず、また誘電損失tanδが5〜10%と大き
い。
The α of SiC varistors is about 2 to 7, and the α of some ZnO-based varistors is as high as 50. Although such varistors have excellent performance in absorbing relatively high voltages, they have a low dielectric constant and small inherent capacitance, so they are difficult to absorb relatively low voltages below the varistor voltage. It shows almost no effect, and the dielectric loss tan δ is as large as 5 to 10%.

一方、これらの低電圧のノイズなどの除去には見かけの
誘電率が5×10程度で、tanδが1%前後の半導体
コンデンサが利用されている。しかし、このような半導
体コンデンサはサージなどによりある限度以上の電圧ま
たは電流が印加されると、破壊したりしてコンデンサと
しての機能を果たさなくなったりする。
On the other hand, semiconductor capacitors with an apparent dielectric constant of about 5×10 and a tan δ of about 1% are used to remove these low voltage noises. However, if a voltage or current exceeding a certain limit is applied to such a semiconductor capacitor due to a surge or the like, it may break down and no longer function as a capacitor.

そこで最近になって、5rTiOsを主成分とし、バリ
スタ特性とコンデンサ特性の両方の機能を有す−るもの
が開発され、マイクロコンピュータなどの電子機器にお
けるIC,LSIなどの半導体素子の保護に使用されて
いる。
Recently, a product containing 5rTiOs as a main component and having both varistor and capacitor properties has been developed and is used to protect semiconductor elements such as ICs and LSIs in electronic devices such as microcomputers. ing.

発明が解決しようとする問題点 上記の5rTi03を主成分とするバリスタはZnO系
バリスタに比べ誘電率が約10倍と大きいが、電圧非直
線指数(α)やサージ耐量が小さく、粒内抵抗が高いた
め、高周波のノイズなどを十分に吸収できないといった
欠点を有していた。
Problems to be Solved by the Invention Although the above-mentioned 5rTi03-based varistor has a dielectric constant about 10 times higher than that of the ZnO-based varistor, the voltage nonlinearity index (α) and surge resistance are small, and the intragranular resistance is low. Because of its high cost, it had the disadvantage of not being able to sufficiently absorb high-frequency noise.

そこで本発明では、誘電率が太き(αが大きいと共に、
サージ耐量が大きく、粒内抵抗が低い電圧依存性非直線
抵抗体磁器組成物を提供することを目的とする。
Therefore, in the present invention, the dielectric constant is large (α is large, and
It is an object of the present invention to provide a voltage-dependent nonlinear resistor ceramic composition that has a large surge resistance and a low intragranular resistance.

問題点を解決するための手段 上記の問題点を解決するために本発明では、5raTi
Os、 (2)SraTiO3、(CaxSr1−x)
bTi03(0,001≦x≦0.5)。
Means for Solving the Problems In order to solve the above problems, in the present invention, 5raTi
Os, (2) SraTiO3, (CaxSr1-x)
bTi03 (0,001≦x≦0.5).

(BaySr+−y )cTiO3(0.001≦y≦
0.5)。
(BaySr+-y)cTiO3(0.001≦y≦
0.5).

(MgzSr I−z )dTi03(0,001≦z
≦0.5)(0,950≦a、b、c、d<1.000
)(以下第一成分と呼ぶ)のうち少なくとも1種類以上
を90.000〜99.998iol*、 Nb20B
、 Ta20B、 WO3゜口y2(h、  Y2O3
,La2O3,CeO2,5s203.  Pr60目
 。
(MgzSr I-z)dTi03(0,001≦z
≦0.5) (0,950≦a, b, c, d<1.000
) (hereinafter referred to as the first component) of 90.000 to 99.998 iol*, Nb20B
, Ta20B, WO3゜口y2(h, Y2O3
, La2O3, CeO2, 5s203. Pr60th.

Nd203(以下第二成分と呼ぶ)のうち少なくとも1
種類以上を0.001−5.000mo1g、 HfN
 (以下第三成分と呼ぶ)を0.001−5.000i
o1*含有してなるか、または第一成分を80.000
−99.997solK、第二成分ヲ0.001−5.
00抛o目、第三成分を0.001−5.000iol
*、Al2O3,5b203. Bad、 Bed、 
PbO,FhOs+ CeO2゜Cr 203 、Fe
tOs + CdO、に20 * Can + CO2
O3* CuO#Cu2O,Litu、 MgO,Mn
Ox、 MOO3,Na2O,Nip。
At least 1 of Nd203 (hereinafter referred to as the second component)
More than 0.001-5.000 mo1g of HfN
(hereinafter referred to as the third component) is 0.001-5.000i
o1* or the first component is 80.000
-99.997solK, second component 0.001-5.
00th centroid, 0.001-5.000iol of the third component
*, Al2O3,5b203. Bad, Bed,
PbO, FhOs+ CeO2゜Cr203, Fe
tOs + CdO, 20 * Can + CO2
O3* CuO#Cu2O,Litu, MgO,Mn
Ox, MOO3, Na2O, Nip.

Rh20t、 5ea2. AgtO,5ift、 S
iC,SrO,Tl2O。
Rh20t, 5ea2. AgtO, 5ift, S
iC, SrO, Tl2O.

Th02. Ti12. V2O5,Bit’3. W
Os、ZnO,Zr(h、 5nO2(以下第四成分と
呼ぶ)のうち少なくとも1種類以上を0.001〜lO
,000mo1g含有してなる電圧依存性非直線抵抗体
磁器組成物を得ることにより、問題を解決しようとする
ものである。
Th02. Ti12. V2O5, Bit'3. W
At least one of Os, ZnO, Zr(h, 5nO2 (hereinafter referred to as the fourth component)) in an amount of 0.001 to 1O
,000 mo1g of the voltage dependent nonlinear resistor ceramic composition.

作用 上記発明において第一成分は主成分であり、第二成分は
主に半導体化を促進する金属酸化物である。また、第三
成分は誘電率及び粒内抵抗の改善に寄与するものであり
、第四成分は誘電率、α。
Function: In the above invention, the first component is the main component, and the second component is mainly a metal oxide that promotes semiconductor formation. Further, the third component contributes to improving the dielectric constant and intragranular resistance, and the fourth component is the dielectric constant, α.

サージ耐量の改善に寄与する。特に、第三成分は素子全
体に均一に分散し、添加時点では窒化物であるが、還元
焼成後に空気中で熱処理することにより酸化物に変わり
、電子を放出する反応がおこる。すなわち、粒界部分で
は拡散してきた多量の酸素により酸化物が形成され、放
出された電子は酸素イオンに捕獲され粒界は絶縁化され
る。一方、粒子内部は酸素の拡散が起こりにくいため大
部分のHfNが窒化物のままで存在し、仮に粒子内部ま
で酸素が拡散してきても原子価が変わることによって電
子を放出するため、酸化による高抵抗化を抑制する作用
をする。このため、粒子内部を低抵抗にすることができ
る。
Contributes to improving surge resistance. In particular, the third component is uniformly dispersed throughout the device, and is a nitride at the time of addition, but when heat treated in air after reduction firing, it changes to an oxide, and a reaction occurs that releases electrons. That is, oxides are formed at the grain boundaries due to the large amount of oxygen that has diffused, and the emitted electrons are captured by oxygen ions, making the grain boundaries insulating. On the other hand, most of the HfN exists as a nitride inside the particle because it is difficult for oxygen to diffuse inside the particle. It acts to suppress resistance. Therefore, the internal resistance of the particles can be made low.

実施例 以下に本発明の実施例を上げて具体的に説明する。Example EXAMPLES The present invention will be described in detail below using examples.

まず、SrCO3、CaCO3,BaCO3、MgCO
3、TiO2を下記の第1表の組成比になるように秤量
し、ボールミルなどで40時間混合し、乾燥した後、1
000℃で15時間仮焼する。こうして得られた仮焼物
にZrNと添加物を下記の第1表の組成比になるように
秤量し、ボールミルなどで24時間混合し、乾燥した後
、ポリビニルアルコールなどのバインダーを10wt$
添加して造粒した後、1(t/cvJ)のプレス圧力で
10φX1t(+a)の円板状に成形する。その後、空
気中で1100℃、1時間仮焼脱バインダーを行った後
、N2: H2=9 : 1の混合ガス中で1520℃
、3時間焼成する。さらに、空気中で1100℃、12
時間焼成し、このようにして得られた第1図、第2図に
示す焼結体1の両平面に外周を残すようにしてAgなど
の導電性ペーストをスクリーン印刷などにより塗布し、
600℃、5分間焼成し、電極2,3を形成する。
First, SrCO3, CaCO3, BaCO3, MgCO
3. Weigh TiO2 so that it has the composition ratio shown in Table 1 below, mix it in a ball mill etc. for 40 hours, dry it, and then
Calcinate at 000°C for 15 hours. ZrN and additives were weighed to the thus obtained calcined product so as to have the composition ratio shown in Table 1 below, mixed for 24 hours using a ball mill, dried, and then mixed with a binder such as polyvinyl alcohol for 10 wt$.
After adding and granulating, it is molded into a disk shape of 10φ×1t(+a) with a press pressure of 1(t/cvJ). Thereafter, the binder was removed by calcination at 1100°C in air for 1 hour, and then at 1520°C in a mixed gas of N2:H2=9:1.
, bake for 3 hours. Furthermore, in air at 1100℃, 12
After firing for a time, a conductive paste such as Ag is applied by screen printing or the like, leaving the outer periphery on both planes of the sintered body 1 thus obtained as shown in FIGS. 1 and 2,
The electrodes 2 and 3 are formed by firing at 600° C. for 5 minutes.

次に、半田などによりリード線(図示せず)を取付け、
エポキシなどの樹脂(図示せず)を塗装する。このよう
にして得られた素子の特性を以下の第2表に示す。なお
、誘電率はIKHzでの静電容量から計算したものであ
り、粒内抵抗(ESR)は共振周波数でのインピーダン
スにより評価し、αは a = 1 /Log (V IOImA/ V II
IIA )(ただし、VIOmA+ VlmAはそれぞ
れ10mA。
Next, attach the lead wire (not shown) with solder etc.
Apply a resin such as epoxy (not shown). The characteristics of the device thus obtained are shown in Table 2 below. Note that the dielectric constant is calculated from the capacitance at IKHz, the intragranular resistance (ESR) is evaluated by the impedance at the resonant frequency, and α is a = 1 / Log (V IOImA / V II
IIA) (However, VIOmA + VlmA are each 10 mA.

In+Aの電流を流した時に素子の両端にかかる電圧で
ある。)で評価した。また、サージ耐量はパルス性の電
流を印加した後のVlmAの変化が±10零以内である
時の最大のパルス性電流値により評価している。
This is the voltage applied to both ends of the element when a current of In+A flows through it. ) was evaluated. Further, the surge resistance is evaluated based on the maximum pulse current value when the change in VlmA after applying the pulse current is within ±10 zero.

(以  下  余  白  ) また、第一成分の5raTtOs。(Hereafter, the rest is white) In addition, the first component is 5raTtOs.

(CaxSr+−x)bTi03(0,001:ii;
x≦0.5)。
(CaxSr+-x)bTi03(0,001:ii;
x≦0.5).

(BaySr 1−y )。Tifh(0,001≦y
≦0.5)。
(BaySr 1-y ). Tifh(0,001≦y
≦0.5).

(MgzSr+−z)dTi03(0,001≦i≦0
.5)(0,950≦a、b、c、d<1.000)の
X、Y+ Zの範囲を規定したのは、0.001未満で
は効果を示さず、0.5を越えると粒成長及び半導体化
が抑制され特性が劣化するためである。また、at b
* Cp dの範囲を規定したのは、1.0では格子欠
陥が発生しに(いため半導体化が促進されず、0.95
より小さくなるとTiが過剰となりすぎてTiO2の結
晶が生成し、組織が不均一になり特性が劣化するためで
ある。また、第二成分は0.001mo1を未満では効
果を示さず、5.000mol$を越えると粒界に偏析
して粒界の高抵抗化を抑制し、粒界に第二相を形成する
ため特性が劣化するものである。さらに第三成分は0.
001mol零未満では効果を示さず、5.000mo
f零を越えると粒界に第二相を形成するため特性が劣化
するものである。そして第四成分は0.001mo1g
未満では効果を示さず、5.00On+o 1gを越え
ると粒界に第二相を形成し粒成長が抑制され、粒界の抵
抗は高くなるが粒界の幅が厚くなるため、静電容量が小
さくなり、バリスタ電圧が高くなり、サージに対して弱
くなることによる。
(MgzSr+-z)dTi03(0,001≦i≦0
.. 5) The range of X, Y + Z (0,950≦a,b,c,d<1.000) was specified because if it is less than 0.001, it will not show any effect, and if it exceeds 0.5, grain growth will occur. This is because semiconductor formation is suppressed and the characteristics deteriorate. Also, at b
*The range of Cp d was specified because 1.0 causes lattice defects (therefore, semiconductor formation is not promoted, and 0.95
This is because if it becomes smaller, Ti will be excessive and TiO2 crystals will be formed, the structure will become non-uniform and the characteristics will deteriorate. In addition, the second component has no effect if it is less than 0.001 mol, and if it exceeds 5.000 mol, it segregates at the grain boundaries, suppresses the increase in resistance of the grain boundaries, and forms a second phase at the grain boundaries. The characteristics deteriorate. Furthermore, the third component is 0.
001 mol less than zero, no effect is shown, 5.000 mol
When f exceeds zero, a second phase is formed at grain boundaries, resulting in deterioration of characteristics. And the fourth component is 0.001mol1g
If it is less than 5.00On+O, it will not be effective, and if it exceeds 1g of 5.00On+O, a second phase will be formed at the grain boundaries and grain growth will be suppressed, and the resistance of the grain boundaries will increase, but the width of the grain boundaries will become thicker, so the capacitance will decrease. This is because the varistor voltage becomes smaller and the varistor voltage becomes higher, making it less susceptible to surges.

なお、本実施例では一部の添加物の組み合わせについて
のみ示したが、その他の添加物の組み合わせについても
同様の効果があることを確認した。
In this example, only some combinations of additives were shown, but it was confirmed that other combinations of additives had similar effects.

発明の効果 以上に示したように本発明によれば誘電率、αが太き(
、粒内抵抗が小さいため、サージ電流が印加された後の
発熱が少ないため、素子の劣化が小さく、サージ耐量が
大きくなるという効果が得られる。
Effects of the Invention As shown above, according to the present invention, the dielectric constant α is large (
Since the intragranular resistance is small, there is less heat generation after a surge current is applied, so that the effect of reducing element deterioration and increasing surge resistance can be obtained.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明による素子を示す上面図、第2図は本発
明による素子の断面図である。 1・・・・・・焼結体、2,3・・・・・・電極。 代理人の氏名 弁理士 中尾敏男 ばか1名1−焼紹体 2.3−電  極 第1図 第2図
FIG. 1 is a top view showing an element according to the invention, and FIG. 2 is a sectional view of the element according to the invention. 1... Sintered body, 2, 3... Electrode. Name of agent: Patent attorney Toshio Nakao 1 idiot 1 - Charging body 2.3 - Electrode Figure 1 Figure 2

Claims (2)

【特許請求の範囲】[Claims] (1)Sr_aTiO_3、(Ca_xSr_1_−_
x)_bTiO_3(0.001≦x≦0.5)、(B
a_ySr_1_−_y)_cTiO_3(0.001
≦y≦0.5)、(Mg_zSr_1_−_z)_dT
iO_3(0.001≦z≦0.5)(0.950≦a
、b、c、d<1.000)のうち少なくとも1種類以
上を90.000〜99.998mol%、Nb_2O
_5、Ta_2O_5、WO_3、Dy_2O_3、Y
_2O_3、La_2O_3、CeO_2、Sm_2O
_3、Pr_6O_1_1、Nd_2O_3のうち少な
くとも1種類以上を0.001〜5.000mol%、
HfNを0.001〜5.000mol%含有してなる
電圧依存性非直線抵抗体磁器組成物。
(1) Sr_aTiO_3, (Ca_xSr_1_-_
x)_bTiO_3 (0.001≦x≦0.5), (B
a_ySr_1_-_y)_cTiO_3(0.001
≦y≦0.5), (Mg_zSr_1_−_z)_dT
iO_3 (0.001≦z≦0.5) (0.950≦a
, b, c, d<1.000) at 90.000 to 99.998 mol%, Nb_2O
_5, Ta_2O_5, WO_3, Dy_2O_3, Y
_2O_3, La_2O_3, CeO_2, Sm_2O
0.001 to 5.000 mol% of at least one of _3, Pr_6O_1_1, and Nd_2O_3;
A voltage-dependent nonlinear resistor ceramic composition containing 0.001 to 5.000 mol% of HfN.
(2)Sr_aTiO_3、(Ca_xSr_1_−_
x)_bTiO_3(0.001≦x≦0.5)、(B
a_ySr_1_−_y)_cTiO_3(0.001
≦y≦0.5)、(Mg_zSr_1_−_z)_dT
iO_3(0.001≦z≦0.5)(0.950≦a
、b、c、d<1.000)のうち少なくとも1種類以
上を80.000〜99.997mol%、Nb_2O
_5、Ta_2O_5、WO_3、Dy_2O_3、Y
_2O_3、La_2O_3、CeO_2、Sm_2O
_3、Pr_6O_1_1、Nd_2O_3のうち少な
くとも1種類以上を0.001〜5.000mol%、
HfNを0.001〜5.000mol%、Al_2O
_3、Sb_2O_3、BaO、BeO、PbO、B_
2O_3、CeO_2、Cr_2O_3、Fe_2O_
3、CdO、K_2O、CaO、Co_2O_3、Cu
O、Cu_2O、Li_2O、MgO、MnO_2、M
oO_3、Na_2O、NiO、Rh_2O_3、Se
O_2、Ag_2O、SiO_2、SiC、SrO、T
l_2O、ThO_2、TiO_2、V_2O_5、B
i_2O_3、WO_3、ZnO、ZrO_2、SnO
_2のうち少なくとも1種類以上を0.001〜10.
000mol%含有してなる電圧依存性非直線抵抗体磁
器組成物。
(2) Sr_aTiO_3, (Ca_xSr_1_-_
x)_bTiO_3 (0.001≦x≦0.5), (B
a_ySr_1_-_y)_cTiO_3(0.001
≦y≦0.5), (Mg_zSr_1_−_z)_dT
iO_3 (0.001≦z≦0.5) (0.950≦a
, b, c, d<1.000) at 80.000 to 99.997 mol%, Nb_2O
_5, Ta_2O_5, WO_3, Dy_2O_3, Y
_2O_3, La_2O_3, CeO_2, Sm_2O
0.001 to 5.000 mol% of at least one of _3, Pr_6O_1_1, and Nd_2O_3;
HfN 0.001-5.000 mol%, Al_2O
_3, Sb_2O_3, BaO, BeO, PbO, B_
2O_3, CeO_2, Cr_2O_3, Fe_2O_
3, CdO, K_2O, CaO, Co_2O_3, Cu
O, Cu_2O, Li_2O, MgO, MnO_2, M
oO_3, Na_2O, NiO, Rh_2O_3, Se
O_2, Ag_2O, SiO_2, SiC, SrO, T
l_2O, ThO_2, TiO_2, V_2O_5, B
i_2O_3, WO_3, ZnO, ZrO_2, SnO
At least one type of _2 from 0.001 to 10.
A voltage-dependent nonlinear resistor ceramic composition containing 000 mol%.
JP62049255A 1987-03-04 1987-03-04 Voltage-dependent nonlinear resistor porcelain compound Pending JPS63215019A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62049255A JPS63215019A (en) 1987-03-04 1987-03-04 Voltage-dependent nonlinear resistor porcelain compound

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62049255A JPS63215019A (en) 1987-03-04 1987-03-04 Voltage-dependent nonlinear resistor porcelain compound

Publications (1)

Publication Number Publication Date
JPS63215019A true JPS63215019A (en) 1988-09-07

Family

ID=12825726

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62049255A Pending JPS63215019A (en) 1987-03-04 1987-03-04 Voltage-dependent nonlinear resistor porcelain compound

Country Status (1)

Country Link
JP (1) JPS63215019A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0283257A (en) * 1988-09-19 1990-03-23 Tdk Corp Porcelain composition of high permittivity for temperature compensation and production thereof
JP2021138589A (en) * 2020-03-09 2021-09-16 Tdk株式会社 Dielectric composition, dielectric thin film, dielectric element, and electronic circuit board

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0283257A (en) * 1988-09-19 1990-03-23 Tdk Corp Porcelain composition of high permittivity for temperature compensation and production thereof
JP2021138589A (en) * 2020-03-09 2021-09-16 Tdk株式会社 Dielectric composition, dielectric thin film, dielectric element, and electronic circuit board

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