JPS6321063Y2 - - Google Patents

Info

Publication number
JPS6321063Y2
JPS6321063Y2 JP421779U JP421779U JPS6321063Y2 JP S6321063 Y2 JPS6321063 Y2 JP S6321063Y2 JP 421779 U JP421779 U JP 421779U JP 421779 U JP421779 U JP 421779U JP S6321063 Y2 JPS6321063 Y2 JP S6321063Y2
Authority
JP
Japan
Prior art keywords
diode
fuse
power supply
redundant
fuses
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP421779U
Other languages
Japanese (ja)
Other versions
JPS55104339U (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP421779U priority Critical patent/JPS6321063Y2/ja
Publication of JPS55104339U publication Critical patent/JPS55104339U/ja
Application granted granted Critical
Publication of JPS6321063Y2 publication Critical patent/JPS6321063Y2/ja
Expired legal-status Critical Current

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  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Hardware Redundancy (AREA)
  • Keying Circuit Devices (AREA)

Description

【考案の詳細な説明】 この考案は例えば人工衛星等に係り、特に複数
個冗長して設けられた装置の異常を検出する冗長
系の異常検出装置に関する。
[Detailed Description of the Invention] This invention relates to, for example, an artificial satellite, and particularly relates to a redundant abnormality detection device for detecting an abnormality in a plurality of redundant devices.

周知のように人工衛星はその性格上極めて高い
信頼度が要求される。そのため、重要な装置は同
一のものが複数個例えば2個冗長して設けられ、
少なくとも一方の装置のみでも衛星の機能が保持
可能となつている。
As is well known, artificial satellites require extremely high reliability due to their nature. Therefore, important devices are provided with multiple identical devices, for example two redundant ones.
Satellite functions can be maintained with at least one device alone.

第1図は従来の過電流遮断素子例えばヒユーズ
11,12を並列して電源部13と負荷部14と
の間に挿入する場合を示すもので、ヒユーズ1
1,12は同一の電流値において溶断するもので
ある。
FIG. 1 shows a case where a conventional overcurrent interrupting element, for example fuses 11 and 12, is inserted in parallel between a power supply section 13 and a load section 14.
Nos. 1 and 12 melt at the same current value.

ところで、このように冗長して設けられたヒユ
ーズ11,12等を打ち上げ前に確実に検査する
ことは難かしい。即ち、ヒユーズ11,12等は
衛星本体内部に設けられるものであるため、複雑
な回路相互間より目視することは不可能である。
そこで、電気的に検査することが考えられるが、
並列して設けられたヒユーズ11,12のうち、
何れかが断れている場合は判断することが極めて
困難である。
By the way, it is difficult to reliably inspect the fuses 11, 12, etc., which are provided redundantly in this way, before launch. That is, since the fuses 11, 12, etc. are provided inside the satellite main body, it is impossible to visually see them between the complicated circuits.
Therefore, it may be possible to conduct an electrical test, but
Among the fuses 11 and 12 provided in parallel,
It is extremely difficult to judge if either of them is refused.

この考案は上記事情に基づいてなされたもので
その目的とするところは、簡単な構成で冗長して
設けられた装置の異常状態を検出することが可能
な冗長系の異常検出装置を提供しようとするもの
である。
This invention was made based on the above circumstances, and its purpose is to provide a redundant abnormality detection device that has a simple configuration and is capable of detecting abnormal conditions in redundant devices. It is something to do.

以下、この考案の一実施例について図面を参参
して説明する。
An embodiment of this invention will be described below with reference to the drawings.

第2図において、21,22は電源部23と負
荷部24との間に並列して挿入された過電流遮断
素子例えばヒユーズである。このうち、ヒユーズ
22と負荷部24との間にはダイオード25が図
示極性で直列に接続されている。このダイオード
25のカソードおよびヒユーズ22の両端部には
それぞれ検査用の端子26,27,28が設けら
れている。
In FIG. 2, reference numerals 21 and 22 are overcurrent interrupting elements, such as fuses, inserted in parallel between the power supply section 23 and the load section 24. Of these, a diode 25 is connected in series between the fuse 22 and the load section 24 with the polarity shown. Test terminals 26, 27, and 28 are provided at the cathode of the diode 25 and at both ends of the fuse 22, respectively.

上記構成において、ヒユーズ21を検査する場
合は、第3図aに示す検査回路を用いて行なわれ
る。即ち、端子30,31間には電流制限用抵抗
32、電流計33、直流電源34が図示極性で直
列接続されており、端子30,31が前記端子2
6,28に接続される。しかして、ダイオード2
5は逆方向バイアスとなつているため直流電源3
4より供給される直流はヒユーズ22には流れ
ず、ヒユーズ21のみに流れてヒユーズ21の検
査を行なうことが可能である。尚、この場合、直
流電源34の電圧はダイオード25の順方向電圧
VF以下(略0.5〔V〕以下)とすることが望まし
い。
In the above configuration, when the fuse 21 is inspected, the inspection circuit shown in FIG. 3a is used. That is, a current limiting resistor 32, an ammeter 33, and a DC power source 34 are connected in series between the terminals 30 and 31 with the polarities shown, and the terminals 30 and 31 are connected to the terminal 2.
6 and 28. However, diode 2
5 is reverse biased, so DC power supply 3
The direct current supplied from 4 does not flow to the fuse 22, but only to the fuse 21, so that the fuse 21 can be inspected. In this case, the voltage of the DC power supply 34 is equal to the forward voltage of the diode 25.
It is desirable to set it to V F or less (approximately 0.5 [V] or less).

また、ヒユーズ22の検査を行なう場合は、第
3図bに示す如く同図aの直流電源34を逆極性
とし、端子30,31を前記端子27,28に接
続して行なわれる。この場合、ダイオード25は
逆方向にバイアスされているため、直流電源34
より供給された電流はヒユーズ21には流れず、
ヒユーズ22のみに流れヒユーズ22の検査を行
なうことが可能である。
Further, when inspecting the fuse 22, as shown in FIG. 3B, the polarity of the DC power supply 34 in FIG. 3A is reversed and the terminals 30 and 31 are connected to the terminals 27 and 28. In this case, since the diode 25 is biased in the reverse direction, the DC power supply 34
The current supplied from the fuse 21 does not flow to the fuse 21,
It is possible to test the fuse 22 by flowing only through the fuse 22.

上記した実施例によれば並列して設けられたヒ
ユーズ21,22の一方のヒユーズ22に直列し
てダイオード25を設け、このダイオード25が
常に逆方向バイアスとなるように直流電源34を
接続して、ヒユーズ21,22を個々に検査可能
としている。したがつて、実質的にはダイオード
25を設けるのみでよく極めて構成が簡単である
ため、人工衛星のように重量が非常に問題とされ
る場合も、殆んど影響を与えないものである。
According to the embodiment described above, a diode 25 is provided in series with one of the fuses 21 and 22 provided in parallel, and the DC power supply 34 is connected so that this diode 25 is always reverse biased. , fuses 21 and 22 can be individually inspected. Therefore, since the configuration is extremely simple and only requires the diode 25, it has almost no effect even in cases where weight is a serious issue, such as in artificial satellites.

以上、詳述したようにこの考案によれば簡単な
構成で冗長して設けられた装置の異常状態を容易
に検出することが可能な冗長系の異常検出装置を
提供できる。
As described in detail above, according to this invention, it is possible to provide a redundant abnormality detection device that can easily detect an abnormal state of redundant devices with a simple configuration.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の冗長系の一例を示す構成図、第
2図はこの考案に係る冗長系の異常検出装置の一
実施例を示す構成図、第3図a,bはそれぞれ第
2図の検査回路を示す構成図である。 21,22……ヒユーズ、25……ダイオー
ド。
Fig. 1 is a block diagram showing an example of a conventional redundant system, Fig. 2 is a block diagram showing an embodiment of an abnormality detection device for a redundant system according to the present invention, and Figs. 3a and 3b are block diagrams showing the inspection circuit of Fig. 2. 21, 22 ... fuses, 25 ... diode.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 回路内に挿入され並列接続された2個の過電流
遮断素子と、この過電流遮断素子の一方に直列接
続されたダイオードとを具備し、前記並列接続さ
れた過電流遮断素子のそれぞれ両端部に前記ダイ
オードの逆方向に直流電源を供給し、過電流遮断
素子の導通状態を検出することを特徴とする冗長
系の異常検出装置。
It comprises two overcurrent cutoff elements inserted in a circuit and connected in parallel, and a diode connected in series to one of the overcurrent cutoff elements, and a diode is provided at both ends of each of the overcurrent cutoff elements connected in parallel. A redundant abnormality detection device, characterized in that a DC power supply is supplied in a direction opposite to the diode, and a conduction state of an overcurrent cutoff element is detected.
JP421779U 1979-01-18 1979-01-18 Expired JPS6321063Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP421779U JPS6321063Y2 (en) 1979-01-18 1979-01-18

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP421779U JPS6321063Y2 (en) 1979-01-18 1979-01-18

Publications (2)

Publication Number Publication Date
JPS55104339U JPS55104339U (en) 1980-07-21
JPS6321063Y2 true JPS6321063Y2 (en) 1988-06-10

Family

ID=28808946

Family Applications (1)

Application Number Title Priority Date Filing Date
JP421779U Expired JPS6321063Y2 (en) 1979-01-18 1979-01-18

Country Status (1)

Country Link
JP (1) JPS6321063Y2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5116656B2 (en) * 2008-12-25 2013-01-09 株式会社日立製作所 Switch element failure detection circuit

Also Published As

Publication number Publication date
JPS55104339U (en) 1980-07-21

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