JPS63201574A - Inspection jig for ultra-high frequency band circuit element - Google Patents
Inspection jig for ultra-high frequency band circuit elementInfo
- Publication number
- JPS63201574A JPS63201574A JP62034783A JP3478387A JPS63201574A JP S63201574 A JPS63201574 A JP S63201574A JP 62034783 A JP62034783 A JP 62034783A JP 3478387 A JP3478387 A JP 3478387A JP S63201574 A JPS63201574 A JP S63201574A
- Authority
- JP
- Japan
- Prior art keywords
- lead terminal
- strip line
- ultra
- coaxial connector
- inspected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 title claims description 12
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims abstract description 12
- 239000000758 substrate Substances 0.000 claims abstract description 12
- 238000002788 crimping Methods 0.000 claims description 5
- 238000005259 measurement Methods 0.000 description 5
- 229910000679 solder Inorganic materials 0.000 description 4
- 238000005476 soldering Methods 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 230000002542 deteriorative effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は超高周波帯回路素子用検査治具に関し、特に超
高周波帯におけるフィルタ、アイソレータ等の受動回路
素子、あるいは集積回路、トランジスタ増幅器等の能動
回路素子等を検査、測定するための超高周波帯回路素子
用検査治具に関する。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to an inspection jig for ultra-high frequency band circuit elements, and particularly for inspection of passive circuit elements such as filters and isolators in ultra-high frequency bands, integrated circuits, transistor amplifiers, etc. The present invention relates to an ultra-high frequency band circuit element inspection jig for inspecting and measuring active circuit elements and the like.
従来、この種の超高周波帯回路素子用検査治具は、第３
図及び第４図に示すように、被検査物１０を搭載するた
めの取付部２を設けた台座１と、この台座１上に設けら
れた誘電体基板３と、台座１に設けられた入出力信号等
の外部接続用の同軸コネクタ５と、誘電体基板３上に設
けられこの同軸コネクタ５と被検査物１０のリード端子
Ｌｏｔとを接続し同軸コネクタ５と等しい所定の特性イ
ンピーダンスをもつストリップライン４とを備え、被検
査物１０のリード端子１０Ｌとストリップライン４との
接続は、はんだ８付けするか絶縁体のおさえ棒９により
圧着する構成となっていた。Conventionally, this type of inspection jig for ultra-high frequency band circuit elements has been
As shown in the figure and FIG. A coaxial connector 5 for external connection of output signals, etc., and a strip provided on the dielectric substrate 3 to connect the coaxial connector 5 and the lead terminal Lot of the object to be inspected 10 and having a predetermined characteristic impedance equal to that of the coaxial connector 5. The strip line 4 is connected to the lead terminal 10L of the object to be inspected 10 by soldering 8 or by crimping with an insulating holding rod 9.
上述した従来の超高周波帯回路素子用検査治具は、リー
ド端子１０Ｌとストリップライン４との接続をはんだ付
けするが絶縁体のおさえ棒９で圧着する構成となってい
るので、はんだ付けする場合は、リード端子１０Ｌには
んだが乗ることにより製品の外観がそこなわれる、はん
だゴテのリーク電流によって回路素子が破壊されること
がある、はんだをするのに人手と時間ががかりコスト高
になる等の欠点がある。In the above-mentioned conventional inspection jig for ultra-high frequency band circuit elements, the connection between the lead terminal 10L and the strip line 4 is soldered, but the connection is crimped with an insulating holding rod 9. The appearance of the product may be damaged due to solder getting on the lead terminal 10L, the circuit elements may be destroyed due to leakage current from the soldering iron, and the cost increases as it takes time and labor to solder. There are drawbacks.
また、絶縁体のおさえ棒９による場合は、上記のはんだ
付けによる欠点は除かれるものの、おさえ棒９は誘電体
であるのでストリップライン４の上を誘電体が覆った状
態と等価となり、ストリップライン４の特性インピーダ
ンスが変化してしまう、すなわち、所定の特性インピー
ダンスを有する測定系において、その特性インピーダン
スが乱れた部分が存在することになり、測定の精度が低
下する、上からおさえる力によってはリード端子１０Ｌ
に張力がかかり被検査物１ｏがリード端子１０ｔ、の接
続部で破壊することがある等の欠点がある。In addition, in the case of using an insulating holding rod 9, the drawbacks due to soldering mentioned above are eliminated, but since the holding rod 9 is a dielectric, it is equivalent to a dielectric covering the strip line 4, and the strip line 4. The characteristic impedance changes. In other words, in a measurement system with a predetermined characteristic impedance, there will be a part where the characteristic impedance is disturbed, reducing measurement accuracy. Terminal 10L
There are drawbacks such as tension being applied to the test object 1o and the test object 1o being broken at the connection portion of the lead terminal 10t.
本発明の目的は、リード端子部分の破損や外観がそこな
われることなく容易にリード端子とストリップラインと
を接続することができ、測定精度を上げることができる
超高周波帯回路素子用検査治具を提供することにある。An object of the present invention is to provide an inspection jig for ultra-high frequency band circuit elements that can easily connect a lead terminal and a strip line without damaging the lead terminal part or deteriorating its appearance, and that can improve measurement accuracy. Our goal is to provide the following.
本発明の超高周波帯回路素子用検査治具は、被検査物を
搭載する取付部を設けた台座と、この台座上に設けられ
た誘電体基板と、前記台座に設けられた外部接続用の同
軸コネクタと、前記誘電体基板上に設けられ一端が前記
同軸コネクタと接続し所定の特性インピーダンスをもつ
ストリップラインと、前記取付部に搭載された被検査物
のリード端子を気体圧力により前記ストリップラインの
他端に圧着接続する手段とを有している。The inspection jig for ultra-high frequency band circuit elements of the present invention includes a pedestal provided with a mounting portion for mounting an object to be inspected, a dielectric substrate provided on the pedestal, and a dielectric substrate provided on the pedestal for external connection. A coaxial connector, a strip line provided on the dielectric substrate and having one end connected to the coaxial connector and having a predetermined characteristic impedance, and a lead terminal of the object to be inspected mounted on the mounting section by gas pressure to connect the strip line to the strip line. and means for crimp connection to the other end.
次に、本発明の実施例について図面を参照して説明する
。Next, embodiments of the present invention will be described with reference to the drawings.
第１図（ａ）、（ｂ）はそれぞれ本発明の第１の実施例
を示す一部断面平面図及び一部断面側面図である。FIGS. 1(a) and 1(b) are a partially sectional plan view and a partially sectional side view, respectively, showing a first embodiment of the present invention.
この実施例は、被検査物１ｏを搭載する取付部２を設け
た台座１と、この台座１上に設けられた誘電体基板３と
、台座１に設けられた入出力信号等の外部接続用の同軸
コネクタ５と、誘電体基板３上に設けられ、一端が同軸
コネクタ５と接続し、この同軸コネクタ５と等しい所定
の特性インピーダンスをもつストリップライン４と、噴
出する気体の圧力によって、取付部２に搭載された被検
査物１０のリード端子１０ｔとストリップライン４の他
端とを圧着接続するノズル６とを有する構成となってい
る。This embodiment includes a pedestal 1 provided with a mounting part 2 for mounting an object to be inspected 1o, a dielectric substrate 3 provided on this pedestal 1, and an external connection for input/output signals etc. provided on the pedestal 1. A coaxial connector 5 is provided on the dielectric substrate 3, one end is connected to the coaxial connector 5, and the strip line 4 has a predetermined characteristic impedance equal to that of the coaxial connector 5. The nozzle 6 connects the lead terminal 10t of the test object 10 mounted on the strip line 2 and the other end of the strip line 4 by crimping.
なお、ストリップライン４の特性インピーダンスは、そ
の幅、誘電体基板３の厚さ及び誘電率等により調整され
る。Note that the characteristic impedance of the strip line 4 is adjusted by its width, the thickness of the dielectric substrate 3, the dielectric constant, etc.
第２図は本発明の第２の実施例を示す一部断面側面図で
ある。FIG. 2 is a partially sectional side view showing a second embodiment of the invention.
この実施例が第１の実施例と相違する点は、リード端子
１０Ｌをストリップライン４の他端に圧着接続する手段
として、ストリップライン４のリード端子１０Ｌが配置
される部分から台座１底面に抜ける排気孔７と、この排
気孔７につながる排気管７．とを設けて排気し、リード
端子１０Ｌを吸着してストリップライン４に圧着接続し
た点にある。The difference between this embodiment and the first embodiment is that as a means for crimping and connecting the lead terminal 10L to the other end of the stripline 4, the lead terminal 10L of the stripline 4 is inserted into the bottom surface of the pedestal 1 from the part where the lead terminal 10L is arranged. An exhaust hole 7 and an exhaust pipe 7 connected to the exhaust hole 7. The lead terminal 10L is attracted and connected to the strip line 4 by crimping.
従って、これら実施例は、リード端子１０ｔ、をはんだ
付けする必要がないので外観をそこなわずに容易に取付
は接続することができ、余分な力が加わらないのでリー
ド端子Ｌｏｔ部分の破損もなく、ストリップライン４を
誘電体で覆うこともないので特性インピーダンスが変化
することがなく測定精度を上げることができる。Therefore, in these embodiments, there is no need to solder the lead terminal 10t, so it can be easily installed and connected without damaging the appearance, and since no extra force is applied, there is no damage to the lead terminal Lot part. Since the strip line 4 is not covered with a dielectric material, the characteristic impedance does not change and measurement accuracy can be improved.
以上説明したように本発明は、ストリップラインと被検
査物のリード端子との接続を気体圧力により行う構成と
することにより、リード端子部分の破損や外観がそこな
われることなく容易に接続することができ、ストリップ
ラインの特性インピーダンスが乱れないので測定精度を
上げることができる効果がある。As explained above, the present invention has a configuration in which the connection between the strip line and the lead terminal of the object to be inspected is performed using gas pressure, thereby making it possible to easily connect the strip line and the lead terminal without damaging the lead terminal portion or deteriorating its appearance. This has the effect of increasing measurement accuracy since the characteristic impedance of the strip line is not disturbed.
第１図（ａ）、（ｂ）はそれぞれ本発明の第１の実施例
を示す一部断面平面図及び一部所面側面図、第２図は本
発明の第２の実施例を示す一部断面側面図、第３図は従
来の超高周波帯回路素子用検査治具の第１の例を示す平
面図、第４図（ａ）、（ｂ）はそれぞれ従来の超高周波
帯回路素子用検査治具の第２の例を示す一部断面平面図
及び側面図である。
１．１．・・・台座、２・・・取付部、３・・・誘電体
基板、４・・・ストリップライン、５・・・同軸コネク
タ、６・・・ノズル、７・・・排気孔、７．・・・排気
管、８・・・はんだ、９・・・おさえ棒、１０・・・被
検査物、１０ｔ、・・・リード端子。1(a) and (b) are a partially sectional plan view and a partially side view showing a first embodiment of the present invention, respectively, and FIG. 2 is a partially sectional side view showing a second embodiment of the present invention. FIG. 3 is a plan view showing a first example of a conventional inspection jig for ultra-high frequency band circuit elements, and FIGS. 4 (a) and (b) are respectively cross-sectional side views of conventional inspection tools for ultra-high frequency band circuit elements. FIG. 7 is a partially sectional plan view and a side view showing a second example of the inspection jig. 1.1. . . . Pedestal, 2. Mounting portion, 3. Dielectric substrate, 4. Strip line, 5. Coaxial connector, 6. Nozzle, 7. Exhaust hole, 7. ...Exhaust pipe, 8...Solder, 9...Press rod, 10...Object to be inspected, 10t,...Lead terminal.
Claims (1)
上に設けられた誘電体基板と、前記台座に設けられた外
部接続用の同軸コネクタと、前記誘電体基板上に設けら
れ一端が前記同軸コネクタと接続し所定の特性インピー
ダンスをもつストリップラインと、前記取付部に搭載さ
れた被検査物のリード端子を気体圧力により前記ストリ
ップラインの他端に圧着接続する手段とを有することを
特徴とする超高周波帯回路素子用検査治具。A pedestal provided with a mounting portion for mounting an object to be inspected, a dielectric substrate provided on the pedestal, a coaxial connector for external connection provided on the pedestal, and a coaxial connector provided on the dielectric substrate with one end A strip line connected to the coaxial connector and having a predetermined characteristic impedance, and means for crimping and connecting a lead terminal of the object to be inspected mounted on the mounting portion to the other end of the strip line using gas pressure. Inspection jig for ultra-high frequency band circuit elements.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62034783A JPH0746118B2 (en) | 1987-02-17 | 1987-02-17 | Inspection jig for ultra high frequency band circuit element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62034783A JPH0746118B2 (en) | 1987-02-17 | 1987-02-17 | Inspection jig for ultra high frequency band circuit element |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63201574A true JPS63201574A (en) | 1988-08-19 |
| JPH0746118B2 JPH0746118B2 (en) | 1995-05-17 |
Family
ID=12423877
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62034783A Expired - Lifetime JPH0746118B2 (en) | 1987-02-17 | 1987-02-17 | Inspection jig for ultra high frequency band circuit element |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0746118B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05109844A (en) * | 1991-10-15 | 1993-04-30 | Nec Yamagata Ltd | Measuring jig for semiconductor device |
| JPH05196686A (en) * | 1992-01-20 | 1993-08-06 | Nec Yamagata Ltd | Semiconductor measuring jig |
| JP2009168471A (en) * | 2008-01-10 | 2009-07-30 | Tamagawa Electronics Co Ltd | Semiconductor device test apparatus |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5373869U (en) * | 1976-11-22 | 1978-06-20 | ||
| JPS61223668A (en) * | 1985-03-29 | 1986-10-04 | Nec Corp | Output measuring method |
-
1987
- 1987-02-17 JP JP62034783A patent/JPH0746118B2/en not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5373869U (en) * | 1976-11-22 | 1978-06-20 | ||
| JPS61223668A (en) * | 1985-03-29 | 1986-10-04 | Nec Corp | Output measuring method |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05109844A (en) * | 1991-10-15 | 1993-04-30 | Nec Yamagata Ltd | Measuring jig for semiconductor device |
| JPH05196686A (en) * | 1992-01-20 | 1993-08-06 | Nec Yamagata Ltd | Semiconductor measuring jig |
| JP2009168471A (en) * | 2008-01-10 | 2009-07-30 | Tamagawa Electronics Co Ltd | Semiconductor device test apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0746118B2 (en) | 1995-05-17 |
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