JPS63200011A - 光電式位置検出装置 - Google Patents
光電式位置検出装置Info
- Publication number
- JPS63200011A JPS63200011A JP3266987A JP3266987A JPS63200011A JP S63200011 A JPS63200011 A JP S63200011A JP 3266987 A JP3266987 A JP 3266987A JP 3266987 A JP3266987 A JP 3266987A JP S63200011 A JPS63200011 A JP S63200011A
- Authority
- JP
- Japan
- Prior art keywords
- signal
- center
- gravity
- measured
- light beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000006073 displacement reaction Methods 0.000 claims abstract description 20
- 238000012545 processing Methods 0.000 claims abstract description 12
- 230000007935 neutral effect Effects 0.000 claims abstract description 9
- 230000005484 gravity Effects 0.000 claims description 36
- 238000001514 detection method Methods 0.000 claims description 26
- 238000005286 illumination Methods 0.000 claims description 26
- 238000005259 measurement Methods 0.000 claims description 26
- 230000000694 effects Effects 0.000 abstract description 5
- 230000005284 excitation Effects 0.000 description 8
- 230000003746 surface roughness Effects 0.000 description 6
- 238000000034 method Methods 0.000 description 5
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 4
- 230000010354 integration Effects 0.000 description 3
- 229910052742 iron Inorganic materials 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 230000001788 irregular Effects 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3266987A JPS63200011A (ja) | 1987-02-16 | 1987-02-16 | 光電式位置検出装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3266987A JPS63200011A (ja) | 1987-02-16 | 1987-02-16 | 光電式位置検出装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63200011A true JPS63200011A (ja) | 1988-08-18 |
| JPH0449048B2 JPH0449048B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1992-08-10 |
Family
ID=12365278
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3266987A Granted JPS63200011A (ja) | 1987-02-16 | 1987-02-16 | 光電式位置検出装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63200011A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63238508A (ja) * | 1987-03-27 | 1988-10-04 | Toshiba Corp | 位置測定装置 |
| JPH02276907A (ja) * | 1989-04-19 | 1990-11-13 | Fanuc Ltd | Ｃｃｄ固体撮像素子を用いたアークセンサ |
| JPH0447210A (ja) * | 1990-06-13 | 1992-02-17 | Matsushita Electric Ind Co Ltd | レーザスポット光による高さ計測装置 |
| JPH0593625A (ja) * | 1991-10-02 | 1993-04-16 | Mitsutoyo Corp | 光学式変位計 |
| US5631738A (en) * | 1995-08-30 | 1997-05-20 | Hewlett-Packard Co. | Laser ranging system having reduced sensitivity to surface defects |
| JP2018109544A (ja) * | 2016-12-28 | 2018-07-12 | 株式会社キーエンス | 光走査高さ測定装置 |
-
1987
- 1987-02-16 JP JP3266987A patent/JPS63200011A/ja active Granted
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63238508A (ja) * | 1987-03-27 | 1988-10-04 | Toshiba Corp | 位置測定装置 |
| JPH02276907A (ja) * | 1989-04-19 | 1990-11-13 | Fanuc Ltd | Ｃｃｄ固体撮像素子を用いたアークセンサ |
| JPH0447210A (ja) * | 1990-06-13 | 1992-02-17 | Matsushita Electric Ind Co Ltd | レーザスポット光による高さ計測装置 |
| JPH0593625A (ja) * | 1991-10-02 | 1993-04-16 | Mitsutoyo Corp | 光学式変位計 |
| US5631738A (en) * | 1995-08-30 | 1997-05-20 | Hewlett-Packard Co. | Laser ranging system having reduced sensitivity to surface defects |
| JP2018109544A (ja) * | 2016-12-28 | 2018-07-12 | 株式会社キーエンス | 光走査高さ測定装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0449048B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1992-08-10 |