JPS6318933Y2 - - Google Patents

Info

Publication number
JPS6318933Y2
JPS6318933Y2 JP13675582U JP13675582U JPS6318933Y2 JP S6318933 Y2 JPS6318933 Y2 JP S6318933Y2 JP 13675582 U JP13675582 U JP 13675582U JP 13675582 U JP13675582 U JP 13675582U JP S6318933 Y2 JPS6318933 Y2 JP S6318933Y2
Authority
JP
Japan
Prior art keywords
connection
input
output
impedance
elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP13675582U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5941766U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13675582U priority Critical patent/JPS5941766U/ja
Publication of JPS5941766U publication Critical patent/JPS5941766U/ja
Application granted granted Critical
Publication of JPS6318933Y2 publication Critical patent/JPS6318933Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP13675582U 1982-09-08 1982-09-08 Ｉｃテスタ Granted JPS5941766U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13675582U JPS5941766U (ja) 1982-09-08 1982-09-08 Ｉｃテスタ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13675582U JPS5941766U (ja) 1982-09-08 1982-09-08 Ｉｃテスタ

Publications (2)

Publication Number Publication Date
JPS5941766U JPS5941766U (ja) 1984-03-17
JPS6318933Y2 true JPS6318933Y2 (show.php) 1988-05-27

Family

ID=30307386

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13675582U Granted JPS5941766U (ja) 1982-09-08 1982-09-08 Ｉｃテスタ

Country Status (1)

Country Link
JP (1) JPS5941766U (show.php)

Also Published As

Publication number Publication date
JPS5941766U (ja) 1984-03-17

Similar Documents

Publication Publication Date Title
US7098670B2 (en) Method and system of characterizing a device under test
US6924651B2 (en) Printed board inspecting apparatus
KR20040053749A (ko) 반도체 시험장치와 피시험 반도체장치를 결합하는인터페이스 회로
CN108572310B (zh) 电路测试方法
US4743842A (en) Tri-state circuit tester
CN101278204B (zh) 管脚电路驱动器
US7372288B2 (en) Test apparatus for testing multiple electronic devices
US20090146759A1 (en) Circuit topology for multiple loads
JPS6318933Y2 (show.php)
US5760596A (en) Testing series passive components without contacting the driven node
JP2008525803A (ja) 高電圧機能を備えたピンエレクトロニクス
US6442718B1 (en) Memory module test system with reduced driver output impedance
TWI729631B (zh) 阻抗量測方法
JP2002005999A (ja) 半導体試験装置
US20030016031A1 (en) Test equipment
JPH0568103B2 (show.php)
US11243232B2 (en) Test apparatuses including probe card for testing semiconductor devices and operation methods thereof
JPH10185988A (ja) Ｉｃ試験装置のテストヘッド
JP4173229B2 (ja) Ｉｃ試験装置
JP2000346910A (ja) Ｉｃの多数並列同時テスト用測定装置
TWI617811B (zh) 探針卡
JPS5886467A (ja) 論理回路試験装置
TWI396854B (zh) 測試裝置以及配接板
CN116953463A (zh) 一种基于2x-thru直通结构的二极管在片去嵌方法
KR19990025832A (ko) 특정 주파수대의 잡음 측정을 위한 공진회로를 갖는 검사용기판