JPS63187363U - - Google Patents
Info
- Publication number
- JPS63187363U JPS63187363U JP7968187U JP7968187U JPS63187363U JP S63187363 U JPS63187363 U JP S63187363U JP 7968187 U JP7968187 U JP 7968187U JP 7968187 U JP7968187 U JP 7968187U JP S63187363 U JPS63187363 U JP S63187363U
- Authority
- JP
- Japan
- Prior art keywords
- pair
- contacts
- measuring jig
- pushed
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000008188 pellet Substances 0.000 claims description 2
- 239000004065 semiconductor Substances 0.000 claims 1
Description
第１図は本考案による測定治具の第１の実施例
を示す断面図、第２図は第２の実施例を示す断面
図、第３図は従来の測定治具の断面図である。
１……裏面電極接触子、２……ＬＤペレツト、
３……表面電極接触子、４……絶縁板、５……押
えネジ、６……押上げ部、７……開度調整ネジ、
８……荷重調整ネジ。
FIG. 1 is a sectional view showing a first embodiment of a measuring jig according to the present invention, FIG. 2 is a sectional view showing a second embodiment, and FIG. 3 is a sectional view of a conventional measuring jig. 1... Back electrode contactor, 2... LD pellet,
3... Surface electrode contactor, 4... Insulating plate, 5... Holding screw, 6... Push-up portion, 7... Opening adjustment screw,
8...Load adjustment screw.
Claims (1)
を固定し、同時に電気的に接続する上下に配置さ
れた一対の接触子と、上方の接触子を下側から押
し上げて前記一対の接触子間を開放する機構とを
有することを特徴とする半導体素子の測定治具。 A laser diode pellet is fixed using spring properties, and a pair of contacts placed above and below are electrically connected at the same time, and the upper contact is pushed up from below to open the space between the pair of contacts. A measuring jig for a semiconductor device, characterized in that it has a mechanism.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7968187U JPH0621266Y2 (en) | 1987-05-26 | 1987-05-26 | Semiconductor device measuring jig |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7968187U JPH0621266Y2 (en) | 1987-05-26 | 1987-05-26 | Semiconductor device measuring jig |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63187363U true JPS63187363U (en) | 1988-11-30 |
| JPH0621266Y2 JPH0621266Y2 (en) | 1994-06-01 |
Family
ID=30929775
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7968187U Expired - Lifetime JPH0621266Y2 (en) | 1987-05-26 | 1987-05-26 | Semiconductor device measuring jig |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0621266Y2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPWO2014041905A1 (en) * | 2012-09-11 | 2016-08-18 | シャープ株式会社 | Test jig, inspection device, mounting device, and test device |
-
1987
- 1987-05-26 JP JP7968187U patent/JPH0621266Y2/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPWO2014041905A1 (en) * | 2012-09-11 | 2016-08-18 | シャープ株式会社 | Test jig, inspection device, mounting device, and test device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0621266Y2 (en) | 1994-06-01 |
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