JPS6317191B2 - - Google Patents

Info

Publication number
JPS6317191B2
JPS6317191B2 JP55023142A JP2314280A JPS6317191B2 JP S6317191 B2 JPS6317191 B2 JP S6317191B2 JP 55023142 A JP55023142 A JP 55023142A JP 2314280 A JP2314280 A JP 2314280A JP S6317191 B2 JPS6317191 B2 JP S6317191B2
Authority
JP
Japan
Prior art keywords
test
board unit
printed board
random number
printed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55023142A
Other languages
English (en)
Japanese (ja)
Other versions
JPS56119863A (en
Inventor
Kikuo Nakatani
Yoichi Iijima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP2314280A priority Critical patent/JPS56119863A/ja
Publication of JPS56119863A publication Critical patent/JPS56119863A/ja
Publication of JPS6317191B2 publication Critical patent/JPS6317191B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2818—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] using test structures on, or modifications of, the card under test, made for the purpose of testing, e.g. additional components or connectors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
JP2314280A 1980-02-26 1980-02-26 Testing method for printed board unit Granted JPS56119863A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2314280A JPS56119863A (en) 1980-02-26 1980-02-26 Testing method for printed board unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2314280A JPS56119863A (en) 1980-02-26 1980-02-26 Testing method for printed board unit

Publications (2)

Publication Number Publication Date
JPS56119863A JPS56119863A (en) 1981-09-19
JPS6317191B2 true JPS6317191B2 (enrdf_load_html_response) 1988-04-12

Family

ID=12102304

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2314280A Granted JPS56119863A (en) 1980-02-26 1980-02-26 Testing method for printed board unit

Country Status (1)

Country Link
JP (1) JPS56119863A (enrdf_load_html_response)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5348678A (en) * 1976-10-15 1978-05-02 Toshiba Corp Integrated circuit package

Also Published As

Publication number Publication date
JPS56119863A (en) 1981-09-19

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