JPS63168577A - 電気回路網の接続関係調査方法 - Google Patents
電気回路網の接続関係調査方法Info
- Publication number
- JPS63168577A JPS63168577A JP62000016A JP1687A JPS63168577A JP S63168577 A JPS63168577 A JP S63168577A JP 62000016 A JP62000016 A JP 62000016A JP 1687 A JP1687 A JP 1687A JP S63168577 A JPS63168577 A JP S63168577A
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- points
- terminal point
- point
- terminal points
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 title description 3
- 238000000034 method Methods 0.000 claims abstract description 30
- 238000005259 measurement Methods 0.000 abstract description 26
- 239000004020 conductor Substances 0.000 abstract description 10
- 239000003990 capacitor Substances 0.000 abstract 1
- 239000000523 sample Substances 0.000 description 11
- 238000011835 investigation Methods 0.000 description 9
- 238000012545 processing Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 210000004899 c-terminal region Anatomy 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62000016A JPS63168577A (ja) | 1987-01-05 | 1987-01-05 | 電気回路網の接続関係調査方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62000016A JPS63168577A (ja) | 1987-01-05 | 1987-01-05 | 電気回路網の接続関係調査方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63168577A true JPS63168577A (ja) | 1988-07-12 |
| JPH0573181B2 JPH0573181B2 (enExample) | 1993-10-13 |
Family
ID=11462628
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62000016A Granted JPS63168577A (ja) | 1987-01-05 | 1987-01-05 | 電気回路網の接続関係調査方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63168577A (enExample) |
-
1987
- 1987-01-05 JP JP62000016A patent/JPS63168577A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0573181B2 (enExample) | 1993-10-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7486095B2 (en) | System for measuring signal path resistance for an integrated circuit tester interconnect structure | |
| DE60200992T2 (de) | "Timing"-Kalibrierung und -Verifikation von Testern für elektronische Schaltungen | |
| EP0573159A2 (en) | Identification of pin-open faults by capacitive coupling through the integrated circuit package | |
| US5402072A (en) | System and method for testing and fault isolation of high density passive boards and substrates | |
| JPS59168375A (ja) | 電気接続回路網のテスト方法及び装置 | |
| JPH09152457A (ja) | 電気的配線検査方法及び装置 | |
| US6924651B2 (en) | Printed board inspecting apparatus | |
| CN112230128A (zh) | 一种激光器芯片高频性能测试装置、方法及存储介质 | |
| EP1039389B1 (en) | Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-time | |
| US5432460A (en) | Apparatus and method for opens and shorts testing of a circuit board | |
| US6300757B1 (en) | Procedure for the calibration of a measuring device | |
| US20150309100A1 (en) | Determining the current return path integrity in an electric device connected or connectable to a further device | |
| CN112731241A (zh) | 晶圆测试机台的校准工具和校准方法 | |
| JPH04503105A (ja) | 電気回路の試験 | |
| JPS63168577A (ja) | 電気回路網の接続関係調査方法 | |
| US3471778A (en) | Method of testing an ordered,multi-element electrical circuit array including connecting certain elements in common | |
| JPH11101841A (ja) | 導電性ペーストスルーホール型両面プリント配線基板及びその電気特性試験装置 | |
| CN220650802U (zh) | 一种用于检测被测装置中的电气缺陷的传感器装置 | |
| JP2005140784A (ja) | Sパラメータ測定システム | |
| EP1655612A1 (en) | Universal test fixture | |
| CN117368820A (zh) | 一种校准装置、差分夹具以及相关装置和系统 | |
| CN113075458A (zh) | 一种电气系统电缆网阻值全自动化测试系统 | |
| JPS62250375A (ja) | 電気回路網の接続関係調査方法 | |
| JP2014020815A (ja) | 基板検査装置および基板検査方法 | |
| JP4597236B2 (ja) | 回路基板検査方法および回路基板検査装置 |