JPS6314382B2 - - Google Patents

Info

Publication number
JPS6314382B2
JPS6314382B2 JP55502449A JP50244980A JPS6314382B2 JP S6314382 B2 JPS6314382 B2 JP S6314382B2 JP 55502449 A JP55502449 A JP 55502449A JP 50244980 A JP50244980 A JP 50244980A JP S6314382 B2 JPS6314382 B2 JP S6314382B2
Authority
JP
Japan
Prior art keywords
circuit
circuits
parity
bit
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55502449A
Other languages
English (en)
Japanese (ja)
Other versions
JPS56501389A (en, 2012
Inventor
Robaato Hooru Deiuitsudoson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
AT&T Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AT&T Technologies Inc filed Critical AT&T Technologies Inc
Publication of JPS56501389A publication Critical patent/JPS56501389A/ja
Publication of JPS6314382B2 publication Critical patent/JPS6314382B2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP55502449A 1979-10-19 1980-09-26 Expired JPS6314382B2 (en, 2012)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/086,299 US4320509A (en) 1979-10-19 1979-10-19 LSI Circuit logic structure including data compression circuitry

Publications (2)

Publication Number Publication Date
JPS56501389A JPS56501389A (en, 2012) 1981-09-24
JPS6314382B2 true JPS6314382B2 (en, 2012) 1988-03-30

Family

ID=22197644

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55502449A Expired JPS6314382B2 (en, 2012) 1979-10-19 1980-09-26

Country Status (4)

Country Link
US (1) US4320509A (en, 2012)
EP (1) EP0039689A4 (en, 2012)
JP (1) JPS6314382B2 (en, 2012)
WO (1) WO1981001210A1 (en, 2012)

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4433413A (en) * 1981-10-22 1984-02-21 Siemens Corporation Built-in apparatus and method for testing a microprocessor system
JPS59185097A (ja) * 1983-04-04 1984-10-20 Oki Electric Ind Co Ltd 自己診断機能付メモリ装置
US4551838A (en) * 1983-06-20 1985-11-05 At&T Bell Laboratories Self-testing digital circuits
US4594711A (en) * 1983-11-10 1986-06-10 Texas Instruments Incorporated Universal testing circuit and method
US4597080A (en) * 1983-11-14 1986-06-24 Texas Instruments Incorporated Architecture and method for testing VLSI processors
US4608691A (en) * 1984-03-19 1986-08-26 The Singer Company Signature analyzer card
DE3580909D1 (de) * 1985-01-04 1991-01-24 Ibm Deutschland Pruef- und diagnoseeinrichtung fuer digitalrechner.
GB8501143D0 (en) * 1985-01-17 1985-02-20 Plessey Co Plc Integrated circuits
US4771429A (en) * 1986-09-18 1988-09-13 Abbott Laboratories Circuit combining functions of cyclic redundancy check code and pseudo-random number generators
DE3639577A1 (de) * 1986-11-20 1988-05-26 Siemens Ag Logikbaustein zur erzeugung von ungleich verteilten zufallsmustern fuer integrierte schaltungen
US5012180A (en) * 1988-05-17 1991-04-30 Zilog, Inc. System for testing internal nodes
DD275546A1 (de) * 1988-09-16 1990-01-24 Adw Ddr Kybernetik Inf Verfahren und anordnung zum testen von mikrorechnergesteuerten baugruppen und geraeten
US5081626A (en) * 1989-12-08 1992-01-14 Hughes Aircraft Company System for detection and location of events
JPH03214809A (ja) * 1990-01-19 1991-09-20 Nec Corp リニアフィードバック・シフトレジスタ
GB2252690A (en) * 1991-02-08 1992-08-12 Orbitel Mobile Communications Signal fault monitoring by comparison of successive signatures
US5486774A (en) * 1991-11-26 1996-01-23 Nippon Telegraph And Telephone Corporation CMOS logic circuits having low and high-threshold voltage transistors
DE69224727T2 (de) * 1991-12-16 1998-11-12 Nippon Telegraph & Telephone Schaltung mit eingebautem Selbsttest
KR100261019B1 (ko) * 1997-09-08 2000-07-01 윤종용 시그너츄어 압축 방법 및 회로
US6105154A (en) * 1998-05-29 2000-08-15 Lucent Technologies, Inc. Multi-bus multi-data transfer protocols controlled by a bus arbiter coupled to a CRC signature compactor
FR2786580B1 (fr) * 1998-11-30 2001-08-03 St Microelectronics Sa Circuit generateur de signature
US9134370B2 (en) 1999-11-23 2015-09-15 Mentor Graphics Corporation Continuous application and decompression of test patterns and selective compaction of test responses
US7493540B1 (en) 1999-11-23 2009-02-17 Jansuz Rajski Continuous application and decompression of test patterns to a circuit-under-test
EP1242885B1 (en) * 1999-11-23 2009-10-07 Mentor Graphics Corporation Continuous application and decompression of test patterns to a circuit-under-test
US8533547B2 (en) * 1999-11-23 2013-09-10 Mentor Graphics Corporation Continuous application and decompression of test patterns and selective compaction of test responses
US6327687B1 (en) 1999-11-23 2001-12-04 Janusz Rajski Test pattern compression for an integrated circuit test environment
US9664739B2 (en) 1999-11-23 2017-05-30 Mentor Graphics Corporation Continuous application and decompression of test patterns and selective compaction of test responses
US6684358B1 (en) * 1999-11-23 2004-01-27 Janusz Rajski Decompressor/PRPG for applying pseudo-random and deterministic test patterns
US6874109B1 (en) 1999-11-23 2005-03-29 Janusz Rajski Phase shifter with reduced linear dependency
US6557129B1 (en) 1999-11-23 2003-04-29 Janusz Rajski Method and apparatus for selectively compacting test responses
US6353842B1 (en) * 1999-11-23 2002-03-05 Janusz Rajski Method for synthesizing linear finite state machines
US7437640B2 (en) 2003-02-13 2008-10-14 Janusz Rajski Fault diagnosis of compressed test responses having one or more unknown states
EP1595211B1 (en) 2003-02-13 2008-07-09 Mentor Graphics Corporation Compressing test responses using a compactor
US7302624B2 (en) * 2003-02-13 2007-11-27 Janusz Rajski Adaptive fault diagnosis of compressed test responses
US7509550B2 (en) * 2003-02-13 2009-03-24 Janusz Rajski Fault diagnosis of compressed test responses
US7970594B2 (en) * 2005-06-30 2011-06-28 The Mathworks, Inc. System and method for using model analysis to generate directed test vectors
EP2677328B1 (en) 2006-02-17 2015-07-29 Mentor Graphics Corporation Multi-stage test response compactors
US7685491B2 (en) * 2006-04-05 2010-03-23 Xijiang Lin Test generation methods for reducing power dissipation and supply currents
US7904286B2 (en) * 2007-09-14 2011-03-08 International Business Machines Corporation Method and apparatus for scheduling test vectors in a multiple core integrated circuit
KR102471416B1 (ko) * 2018-05-23 2022-11-29 에스케이하이닉스 주식회사 반도체 장치 및 이를 포함하는 메모리 모듈

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3582633A (en) * 1968-02-20 1971-06-01 Lockheed Aircraft Corp Method and apparatus for fault detection in a logic circuit
US3976864A (en) * 1974-09-03 1976-08-24 Hewlett-Packard Company Apparatus and method for testing digital circuits
US3958110A (en) * 1974-12-18 1976-05-18 Ibm Corporation Logic array with testing circuitry
US4074851A (en) * 1976-06-30 1978-02-21 International Business Machines Corporation Method of level sensitive testing a functional logic system with embedded array
JPS5352029A (en) * 1976-10-22 1978-05-12 Fujitsu Ltd Arithmetic circuit unit
US4176258A (en) * 1978-05-01 1979-11-27 Intel Corporation Method and circuit for checking integrated circuit chips

Also Published As

Publication number Publication date
EP0039689A4 (en) 1982-12-20
JPS56501389A (en, 2012) 1981-09-24
EP0039689A1 (en) 1981-11-18
US4320509A (en) 1982-03-16
WO1981001210A1 (en) 1981-04-30

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